Proceedings 37th Design Automation Conference最新文献

筛选
英文 中文
Run-time voltage hopping for low-power real-time systems 低功耗实时系统的运行时电压跳变
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337785
Seongsoo Lee, T. Sakurai
{"title":"Run-time voltage hopping for low-power real-time systems","authors":"Seongsoo Lee, T. Sakurai","doi":"10.1145/337292.337785","DOIUrl":"https://doi.org/10.1145/337292.337785","url":null,"abstract":"This paper presents a novel run-time dynamic voltage scaling scheme for low-power real-time systems. It employs software feedback control of supply voltage, which is applicable to off-the-shelf processors. It avoids interface problems from variable clock frequency. It provides efficient power reduction by fully exploiting slack time arising from workload variation. Using software analysis environment, the proposed scheme is shown to achieve 80~94% power reduction for typical real-time multimedia applications.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121649859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 257
Synthesis of application-specific memories for power optimization in embedded systems 嵌入式系统电源优化专用存储器的合成
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337424
L. Benini, A. Macii, E. Macii, M. Poncino
{"title":"Synthesis of application-specific memories for power optimization in embedded systems","authors":"L. Benini, A. Macii, E. Macii, M. Poncino","doi":"10.1145/337292.337424","DOIUrl":"https://doi.org/10.1145/337292.337424","url":null,"abstract":"This paper presents a novel approach to memory power optimization for embedded systems based on the exploitation of data locality. Locations with highest access frequency are mapped onto a small, low-power application-specific memory which is placed close the processor. Although, in principle, a cache may be used to implement such a memory, more efficient solutions may be adopted. We propose an architecture that outperforms (power-wise) different types of cache memories at no penalty in performance. Power savings (averaged over a number of embedded applications running on ARM processors) range from 12% to 68%.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"10 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116885551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 34
Interconnect testing in cluster-based FPGA architectures 基于集群的FPGA架构互连测试
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337310
I. Harris, R. Tessier
{"title":"Interconnect testing in cluster-based FPGA architectures","authors":"I. Harris, R. Tessier","doi":"10.1145/337292.337310","DOIUrl":"https://doi.org/10.1145/337292.337310","url":null,"abstract":"As IC densities are increasing, cluster-based FPGA architectures are becoming the architecture of choice for major FPGA manufacturers. A cluster-based architecture is one in which several logic blocks are grouped together into a coarse-grained logic block. While the high density local interconnect often found within clusters serves to improve FPGA utilization, it also greatly complicates the FPGA interconnect testing problem. To address this issue, we have developed a hierarchical approach to define a set of FPGA configurations which enable interconnect faults to be detected. This technique enables the detection of bridging faults involving intra-cluster interconnect and extra-cluster interconnect. The hierarchical structure of a cluster-based tile is exploited to define intra-cluster configurations separately from extra-cluster configurations, thereby improving the efficiency of the configuration definition process. By guaranteeing that both intra-cluster and extra-cluster configurations have several test transparency properties, hierarchical fault detectability is ensured.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"139 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116904264","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 47
Projection frameworks for model reduction of weakly nonlinear systems 弱非线性系统模型约简的投影框架
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337380
J. Phillips
{"title":"Projection frameworks for model reduction of weakly nonlinear systems","authors":"J. Phillips","doi":"10.1145/337292.337380","DOIUrl":"https://doi.org/10.1145/337292.337380","url":null,"abstract":"In this paper we present a generalization of popular linear model reduction methods, such as Lanczos- and Arnoldi-based algorithms based on rational approximation, to systems whose response to interesting external inputs can be described by a few terms in a functional series expansion such as a Volterra series. The approach allows automatic generation of macromodels that include frequency-dependent nonlinear effects.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134482799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 140
Synthesis-for-testability of controller-datapath pairs that use gated clocks 使用门控时钟的控制器-数据路径对的可测试性综合
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337595
M. Nourani, J. Carletta, C. Papachristou
{"title":"Synthesis-for-testability of controller-datapath pairs that use gated clocks","authors":"M. Nourani, J. Carletta, C. Papachristou","doi":"10.1145/337292.337595","DOIUrl":"https://doi.org/10.1145/337292.337595","url":null,"abstract":"A method for high level synthesis-for-testability of controller-datapath pairs that use gated clocks is developed. It uses a register allocation technique that improves the observability of the controller through the datapath, and takes advantage of the unique testability properties of one-hot-encoded controllers. The resulting controller can be fully tested without isolating it from the system. Area, fault coverage, and power consumption are reported for three example circuits.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129195020","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Routing tree construction under fixed buffer locations 在固定缓冲区位置下构建路由树
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337502
J. Cong, Xin Yuan
{"title":"Routing tree construction under fixed buffer locations","authors":"J. Cong, Xin Yuan","doi":"10.1145/337292.337502","DOIUrl":"https://doi.org/10.1145/337292.337502","url":null,"abstract":"Modern high performance design requires using a large number of buffers. In practice, buffers are organized into buffer blocks and planned in the early stages of design process [1]. Thus, the locations of buffer blocks are usually fixed prior to routing tree construction. In this paper we present the first algorithm for simultaneous routing tree construction and buffer insertion for multiple-pin nets under fixed buffer locations. Given a source and n sinks of a net, the required arrival time associated with each sink, and m buffers with fixed locations, our algorithm can construct a routing tree for this net with possible insertion of buffers at given locations such that the required arrival time at the source is maximized. Experimental results show that our algorithm is efficient to handle fixed buffer location constraints and can also be used for routing tree construction without buffer insertion. Moreover, it can handle obstacles and congestion which will benefit its adaption in a global router. Compared to the well-known BA-tree algorithm [2] followed by a post-processing step for handling fixed buffer location constraints, our algorithm outperforms it by up to 46% in terms of delay while using comparative wirelength.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133228259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 52
A methodology for efficient high-level dataflow simulation of mixed-signal front-ends of digital telecom transceivers 数字通信收发器混合信号前端的高效高级数据流仿真方法
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337535
G. Vandersteen, P. Wambacq, Y. Rolain, P. Dobrovolný, S. Donnay, M. Engels, I. Bolsens
{"title":"A methodology for efficient high-level dataflow simulation of mixed-signal front-ends of digital telecom transceivers","authors":"G. Vandersteen, P. Wambacq, Y. Rolain, P. Dobrovolný, S. Donnay, M. Engels, I. Bolsens","doi":"10.1145/337292.337535","DOIUrl":"https://doi.org/10.1145/337292.337535","url":null,"abstract":"The explosion of the telecommunications market requires miniaturization and cost-effective realization of the front-ends of transceivers for digital telecommunications. New architectures must therefore be simulated at high level. Current methodologies and corresponding tools suffer from common drawbacks, such as lower accuracy, slow simulation speed, etc. A new methodology has been developped for the efficient simulation, at the architectural level, of mixed-signal front-ends of digital telecom transceivers. The efficient execution is obtained using a multi-rate, multi-carrier signal representation together with a dataflow simulation scheme which switches dynamically towards the most efficient signal processing technique available. An implementation of this methodology shows both excellent runtimes and a high accuracy.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127280198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Boolean satisfiability in electronic design automation 电子设计自动化中的布尔可满足性
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337611
Joao Marques-Silva, K. Sakallah
{"title":"Boolean satisfiability in electronic design automation","authors":"Joao Marques-Silva, K. Sakallah","doi":"10.1145/337292.337611","DOIUrl":"https://doi.org/10.1145/337292.337611","url":null,"abstract":"Boolean Satisfiability (SAT) is often used as the underlying model for a significant and increasing number of applications in Electronic Design Automation (EDA) as well as in many other fields of Computer Science and Engineering. In recent years, new and efficient algorithms for SAT have been developed, allowing much larger problem instances to be solved. SAT “packages” are currently expected to have an impact on EDA applications similar to that of BDD packages since their introduction more than a decade ago. This tutorial paper is aimed at introducing the EDA professional to the Boolean satisfiability problem. Specifically, we highlight the use of SAT models to formulate a number of EDA problems in such diverse areas as test pattern generation, circuit delay computation, logic optimization, combinational equivalence checking, bounded model checking and functional test vector generation, among others. In addition, we provide an overview of the algorithmic techniques commonly used for solving SAT, including those that have seen widespread use in specific EDA applications. We categorize these algorithmic techniques, indicating which have been shown to be best suited for which tasks.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"255 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123286439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 134
Communication architecture tuners: a methodology for the design of high-performance communication architectures for system-on-chips 通信架构调谐器:一种用于设计片上系统的高性能通信架构的方法
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337561
K. Lahiri, A. Raghunathan, G. Lakshminarayana, S. Dey
{"title":"Communication architecture tuners: a methodology for the design of high-performance communication architectures for system-on-chips","authors":"K. Lahiri, A. Raghunathan, G. Lakshminarayana, S. Dey","doi":"10.1145/337292.337561","DOIUrl":"https://doi.org/10.1145/337292.337561","url":null,"abstract":"In this chapter, we present a general methodology for the design of custom system-on-chip communication architectures. Our technique is based on the addition of a layer of circuitry, called the Communication Architecture Tuner (CAT), around any existing communication architecture topology. The added layer enhances the ability of the system to adapt to changing communication needs of its constituent components. For example, more critical data may be handled differently, leading to lower communication latencies. The CAT monitors the internal state and communication transactions of each component, and “predicts” the relative importance of each communication transaction in terms of its potential impact on different system-level performance metrics. It then configures the protocol parameters of the underlying communication architecture (e.g., priorities, DMA modes,etc.) to best suit the system's changing communication needs.\u0000We illustrate issues and tradeoffs involved in the design of CAT-based communication architectures, and present algorithms to automate the key steps. Experimental results indicate that performance metrics (e.g. number of missed deadlines, average processing time) for systems with CAT-based communication architectures are significantly (sometimes, over an order of magnitude) better than those with conventional communication architectures.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"279 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116322672","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 54
Modeling and simulation of real defects using fuzzy logic 用模糊逻辑对真实缺陷进行建模与仿真
Proceedings 37th Design Automation Conference Pub Date : 2000-06-01 DOI: 10.1145/337292.337601
A. Attarha, M. Nourani, C. Lucas
{"title":"Modeling and simulation of real defects using fuzzy logic","authors":"A. Attarha, M. Nourani, C. Lucas","doi":"10.1145/337292.337601","DOIUrl":"https://doi.org/10.1145/337292.337601","url":null,"abstract":"Real defects (e.g. stuck-at or bridging faults) in the VLSI circuits cause intermediate voltages and can not be modeled as ideal shorts. In this paper we first show that the traditional zero-resistance model is not sufficient. Then, we present a resistive fault model for real defects and use fuzzy logic techniques for fault simulation and test pattern generation at the gate-level. Our method produces more realistic fault coverage compared to the conventional methods. The experimental results include the fault coverage and test pattern statistics for the ISCAS85 benchmarks.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116474252","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
相关产品
×
本文献相关产品
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信