Boolean satisfiability in electronic design automation

Joao Marques-Silva, K. Sakallah
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引用次数: 134

Abstract

Boolean Satisfiability (SAT) is often used as the underlying model for a significant and increasing number of applications in Electronic Design Automation (EDA) as well as in many other fields of Computer Science and Engineering. In recent years, new and efficient algorithms for SAT have been developed, allowing much larger problem instances to be solved. SAT “packages” are currently expected to have an impact on EDA applications similar to that of BDD packages since their introduction more than a decade ago. This tutorial paper is aimed at introducing the EDA professional to the Boolean satisfiability problem. Specifically, we highlight the use of SAT models to formulate a number of EDA problems in such diverse areas as test pattern generation, circuit delay computation, logic optimization, combinational equivalence checking, bounded model checking and functional test vector generation, among others. In addition, we provide an overview of the algorithmic techniques commonly used for solving SAT, including those that have seen widespread use in specific EDA applications. We categorize these algorithmic techniques, indicating which have been shown to be best suited for which tasks.
电子设计自动化中的布尔可满足性
布尔可满足性(SAT)在电子设计自动化(EDA)以及计算机科学与工程的许多其他领域的应用中经常被用作基础模型。近年来,新的高效的SAT算法被开发出来,可以解决更大的问题实例。SAT“包”目前有望对EDA应用产生类似于十多年前引入的BDD包的影响。本教程旨在向EDA专业人员介绍布尔可满足性问题。具体来说,我们强调使用SAT模型来制定许多EDA问题,如测试模式生成,电路延迟计算,逻辑优化,组合等效检验,有界模型检验和功能测试向量生成等。此外,我们还概述了通常用于求解SAT的算法技术,包括那些在特定EDA应用中广泛使用的算法技术。我们对这些算法技术进行分类,指出哪一种算法最适合哪一种任务。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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