{"title":"使用门控时钟的控制器-数据路径对的可测试性综合","authors":"M. Nourani, J. Carletta, C. Papachristou","doi":"10.1145/337292.337595","DOIUrl":null,"url":null,"abstract":"A method for high level synthesis-for-testability of controller-datapath pairs that use gated clocks is developed. It uses a register allocation technique that improves the observability of the controller through the datapath, and takes advantage of the unique testability properties of one-hot-encoded controllers. The resulting controller can be fully tested without isolating it from the system. Area, fault coverage, and power consumption are reported for three example circuits.","PeriodicalId":237114,"journal":{"name":"Proceedings 37th Design Automation Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Synthesis-for-testability of controller-datapath pairs that use gated clocks\",\"authors\":\"M. Nourani, J. Carletta, C. Papachristou\",\"doi\":\"10.1145/337292.337595\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A method for high level synthesis-for-testability of controller-datapath pairs that use gated clocks is developed. It uses a register allocation technique that improves the observability of the controller through the datapath, and takes advantage of the unique testability properties of one-hot-encoded controllers. The resulting controller can be fully tested without isolating it from the system. Area, fault coverage, and power consumption are reported for three example circuits.\",\"PeriodicalId\":237114,\"journal\":{\"name\":\"Proceedings 37th Design Automation Conference\",\"volume\":\"42 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-06-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings 37th Design Automation Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/337292.337595\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings 37th Design Automation Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/337292.337595","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Synthesis-for-testability of controller-datapath pairs that use gated clocks
A method for high level synthesis-for-testability of controller-datapath pairs that use gated clocks is developed. It uses a register allocation technique that improves the observability of the controller through the datapath, and takes advantage of the unique testability properties of one-hot-encoded controllers. The resulting controller can be fully tested without isolating it from the system. Area, fault coverage, and power consumption are reported for three example circuits.