Ultramicroscopy最新文献

{"title":"Focused ion beam milling and MicroED structure determination of metal-organic framework crystals","authors":"Andrey A. Bardin ,&nbsp;Alison Haymaker ,&nbsp;Fateme Banihashemi ,&nbsp;Jerry Y.S. Lin ,&nbsp;Michael W. Martynowycz ,&nbsp;Brent L. Nannenga","doi":"10.1016/j.ultramic.2023.113905","DOIUrl":"10.1016/j.ultramic.2023.113905","url":null,"abstract":"<div><p>We report new advancements in the determination and high-resolution structural analysis of beam-sensitive metal organic frameworks (MOFs) using microcrystal electron diffraction (MicroED) coupled with focused ion beam milling at cryogenic temperatures (cryo-FIB). A microcrystal of the beam-sensitive MOF, ZIF-8, was ion-beam milled in a thin lamella approximately 150 nm thick. MicroED data were collected from this thin lamella using an energy filter and a direct electron detector operating in counting mode. Using this approach, we achieved a greatly improved resolution of 0.59 Å with a minimal total exposure of only 0.64 e⁻/A². These innovations not only improve model statistics but also further demonstrate that ion-beam milling is compatible with beam-sensitive materials, augmenting the capabilities of electron diffraction in MOF research.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138545145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"“Depo-all-around”: A novel FIB-based TEM specimen preparation technique for solid state battery composites and other loosely bound samples","authors":"Thomas Demuth ,&nbsp;Till Fuchs ,&nbsp;Andreas Beyer ,&nbsp;Jürgen Janek ,&nbsp;Kerstin Volz","doi":"10.1016/j.ultramic.2023.113904","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113904","url":null,"abstract":"<div><p>Interfacial phenomena between active cathode materials and solid electrolytes play an important role in the function of solid-state batteries. (S)TEM imaging can give valuable insight into the atomic structure and composition at the various interfaces, yet the preparation of TEM specimen by FIB (focused ion beam) is challenging for loosely bound samples like composites, as they easily break apart during conventional preparation routines. We propose a novel preparation method that uses a frame made of deposition layers from the FIB's gas injection system to prevent the sample from breaking apart. This technique can of course be also applied to other loosely bound samples, not only those in the field of batteries.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-12-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399123002218/pdfft?md5=5bc4b2396d2e3845974855c4ac91e802&pid=1-s2.0-S0304399123002218-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138501718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Time calibration studies for the Timepix3 hybrid pixel detector in electron microscopy","authors":"Yves Auad,&nbsp;Jassem Baaboura,&nbsp;Jean-Denis Blazit,&nbsp;Marcel Tencé,&nbsp;Odile Stéphan,&nbsp;Mathieu Kociak,&nbsp;Luiz H.G. Tizei","doi":"10.1016/j.ultramic.2023.113889","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113889","url":null,"abstract":"<div><p><span>Direct electron detection is currently revolutionizing many fields of electron microscopy<span> due to its lower noise, its reduced point-spread function, and its increased quantum efficiency. More specifically to this work, Timepix3 is a hybrid-pixel direct electron detector capable of outputting temporal information of individual hits in its pixel array. Its architecture results in a data-driven detector, also called event-based, in which individual hits trigger the data off the chip for readout as fast as possible. The presence of a pixel threshold value results in an almost readout-noise-free detector while also defining the hit time of arrival and the time the signal stays over the pixel threshold. In this work, we have performed various experiments to calibrate and correct the Timepix3 temporal information, specifically in the context of electron microscopy. These include the energy calibration, and the time-walk and pixel delay corrections, reaching an average temporal resolution throughout the entire pixel matrix of </span></span><span><math><mrow><mn>1</mn><mo>.</mo><mn>37</mn><mo>±</mo><mn>0</mn><mo>.</mo><mn>04</mn><mspace></mspace><mi>ns</mi></mrow></math></span><span>. Additionally, we have also studied cosmic rays tracks to characterize the charge dynamics along the volume of the sensor layer, allowing us to estimate the limits of the detector’s temporal response depending on different bias voltages, sensor thickness, and the electron beam ionization volume. We have estimated the uncertainty due to the ionization volume ranging from about 0.8 ns for 60 keV electrons to 8.8 ns for 300 keV electrons.</span></p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-12-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138490728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Segmentability evaluation of back-scattered SEM images of multiphase materials","authors":"Manolis Chatzigeorgiou ,&nbsp;Vassilios Constantoudis ,&nbsp;Marios Katsiotis ,&nbsp;Margarita Beazi-Katsioti ,&nbsp;Nikos Boukos","doi":"10.1016/j.ultramic.2023.113892","DOIUrl":"10.1016/j.ultramic.2023.113892","url":null,"abstract":"<div><p>Segmentation methods are very useful tools in the Electron Microscopy inspection of materials, enabling the extraction of quantitative results from microscopy images. Back-Scattered Electron (BSE) images carry information of the mean atomic number in the interaction volume and hence can be used to quantify the phase composition in multiphase materials. Since phase composition and proportion affects the material properties and hence its applications, the segmentation accuracy of such images rendered of critical importance for material science. In this work, the notion of segmentability for BSE images is proposed to define the ability of an image to be segmented accurately. This notion can be used to guide the image acquisition process so that segmentability is maximized and segmentation accuracy is ensured. An index is devised to quantify segmentability based on a combination of the modified Fisher Discrimination Ratio and of the second Minkowski functional capturing intensity and spatial aspects of BSE images respectively. The suggested Segmentability Index (SI) is validated in synthetic BSE images which are generated with a novel algorithm allowing the independent control of spatial distribution of phases and their grayscale intensity histograms. Additionally, SI is applied in real-synthetic BSE images, where the real greyscale distributions of Ordinary Portland Cement (OPC) clinker crystallographic phases are used, to demonstrate the ability of SI to indicate the optimum choice of critical image acquisition settings leading to the more accurate segmentation output.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138531070","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Correlating electrochemical stimulus to structural change in liquid electron microscopy videos using the structural dissimilarity metric","authors":"Justin T. Mulvey ,&nbsp;Katen P. Iyer ,&nbsp;Tomàs Ortega ,&nbsp;Jovany G. Merham ,&nbsp;Yevheniy Pivak ,&nbsp;Hongyu Sun ,&nbsp;Allon I. Hochbaum ,&nbsp;Joseph P. Patterson","doi":"10.1016/j.ultramic.2023.113894","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113894","url":null,"abstract":"<div><p>In-situ liquid cell transmission electron microscopy (LCTEM) with electrical biasing capabilities has emerged as an invaluable tool for directly imaging electrode processes with high temporal and spatial resolution. However, accurately quantifying structural changes that occur on the electrode and subsequently correlating them to the applied stimulus remains challenging. Here, we present structural dissimilarity (DSSIM) analysis as segmentation-free video processing algorithm for locally detecting and quantifying structural change occurring in LCTEM videos. In this study, DSSIM analysis is applied to two in-situ LCTEM videos to demonstrate how to implement this algorithm and interpret the results. We show DSSIM analysis can be used as a visualization tool for qualitative data analysis by highlighting structural changes which are easily missed when viewing the raw data. Furthermore, we demonstrate how DSSIM analysis can serve as a quantitative metric and efficiently convert 3-dimensional microscopy videos to 1-dimenional plots which makes it easy to interpret and compare events occurring at different timepoints in a video. In the analyses presented here, DSSIM is used to directly correlate the magnitude and temporal scale of structural change to the features of the applied electrical bias. ImageJ, Python, and MATLAB programs, including a user-friendly interface and accompanying documentation, are published alongside this manuscript to make DSSIM analysis easily accessible to the scientific community.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399123002115/pdfft?md5=2378b1bb70879e5ee3b2fafc25142455&pid=1-s2.0-S0304399123002115-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138490146","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Noise-dependent bias in quantitative STEM-EMCD experiments revealed by bootstrapping","authors":"Hasan Ali ,&nbsp;Jan Rusz ,&nbsp;Daniel E. Bürgler ,&nbsp;Roman Adam ,&nbsp;Claus M. Schneider ,&nbsp;Cheuk-Wai Tai ,&nbsp;Thomas Thersleff","doi":"10.1016/j.ultramic.2023.113891","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113891","url":null,"abstract":"<div><p>Electron magnetic circular dichroism (EMCD) is a powerful technique for estimating element-specific magnetic moments of materials on nanoscale with the potential to reach atomic resolution in transmission electron microscopes. However, the fundamentally weak EMCD signal strength complicates quantification of magnetic moments, as this requires very high precision, especially in the denominator of the sum rules. Here, we employ a statistical resampling technique known as bootstrapping to an experimental EMCD dataset to produce an empirical estimate of the noise-dependent error distribution resulting from application of EMCD sum rules to bcc iron in a 3-beam orientation. We observe clear experimental evidence that noisy EMCD signals preferentially bias the estimation of magnetic moments, further supporting this with error distributions produced by Monte-Carlo simulations. Finally, we propose guidelines for the recognition and minimization of this bias in the estimation of magnetic moments.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399123002085/pdfft?md5=b790a3861451dc102f6c9e7bca3c641e&pid=1-s2.0-S0304399123002085-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138475085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Weighted Burgers Vector analysis of orientation fields from high-angular resolution electron backscatter diffraction","authors":"Joe Gardner ,&nbsp;David Wallis ,&nbsp;Lars N. Hansen ,&nbsp;John Wheeler","doi":"10.1016/j.ultramic.2023.113893","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113893","url":null,"abstract":"<div><p>The Weighted Burgers Vector (WBV) method can extract information about dislocation types and densities present in distorted crystalline materials from electron backscatter diffraction (EBSD) maps, using no assumptions about which slip systems might be present. Furthermore, high-angular resolution EBSD (HR-EBSD) uses a cross-correlation procedure to increase the angular precision of EBSD measurements by an order of magnitude compared to conventional EBSD. However, the WBV technique has not previously been applied to HR-EBSD data and therefore it remains unclear as to which low-angle substructures can be reliably characterised by WBV analysis of conventional EBSD data and which require additional HR-EBSD processing. To establish some practical examples that can be used to guide future data-acquisition strategies, we compare the output of the WBV method when applied to conventional EBSD data and HR-EBSD data collected from the most common minerals in Earth's lower crust (plagioclase feldspar) and upper mantle (olivine). The results demonstrate that HR-EBSD and WBV processing are complementary techniques. The increase in angular precision achieved with HR-EBSD processing allows low-angle (on the order of 0.1°) structures, which are obscured by noise in conventional EBSD data, to be analyzed quantitatively using the WBV method. Combining the WBV and HR-EBSD methods increases the precision of calculated WBV directions, which is essential when using information about active slip systems to infer likely deformation mechanisms from naturally deformed microstructures. This increase in precision is particularly important for low-symmetry crystals, such as plagioclase, that have a wide range of available slip systems that vary in relative activity with changing pressure, temperature and differential stress. Because WBV directions are calculated using no assumptions about which slip systems may be present, combining this technique with HR-EBSD to refine the precision of lattice orientation gradients is ideal for investigating complex natural materials with unknown deformation histories.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399123002103/pdfft?md5=e4a6d48cabca001b106cb06215a0a6ea&pid=1-s2.0-S0304399123002103-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138490727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Preface to the twelfth international workshop on low energy microscopy and photoemission electron microscopy (LEEM/PEEM 12)","authors":"Michael Foerster ,&nbsp;Juan de la Figuera ,&nbsp;Irene Palacio ,&nbsp;Lucia Aballe","doi":"10.1016/j.ultramic.2023.113887","DOIUrl":"10.1016/j.ultramic.2023.113887","url":null,"abstract":"","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138543154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Accurate magnification determination for cryoEM using gold","authors":"Joshua L. Dickerson,&nbsp;Erin Leahy,&nbsp;Mathew J. Peet,&nbsp;Katerina Naydenova,&nbsp;Christopher J. Russo","doi":"10.1016/j.ultramic.2023.113883","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113883","url":null,"abstract":"<div><p>Determining the correct magnified pixel size of single-particle cryoEM micrographs is necessary to maximize resolution and enable accurate model building. Here we describe a simple and rapid procedure for determining the absolute magnification in an electron cryomicroscope to a precision of <span><math><mo>&lt;</mo></math></span>0.5%. We show how to use the atomic lattice spacings of crystals of thin and readily available test specimens, such as gold, as an absolute reference to determine magnification for both room temperature and cryogenic imaging. We compare this method to other commonly used methods, and show that it provides comparable accuracy in spite of its simplicity. This magnification calibration method provides a definitive reference quantity for data analysis and processing, simplifies the combination of multiple datasets from different microscopes and detectors, and improves the accuracy with which the contrast transfer function of the microscope can be determined. We also provide an open source program, magCalEM, which can be used to accurately estimate the magnified pixel size of a cryoEM dataset ex post facto.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399123002000/pdfft?md5=f6ed5925a61508100520bd4110d6ad75&pid=1-s2.0-S0304399123002000-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138437679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Interfacial excess of solutes across phase boundaries using atom probe microscopy","authors":"F. Theska,&nbsp;S. Primig","doi":"10.1016/j.ultramic.2023.113885","DOIUrl":"10.1016/j.ultramic.2023.113885","url":null,"abstract":"<div><p>Three-dimensional elemental mapping in atom probe microscopy provides invaluable insights into the structure and composition of interfaces in materials. Quasi-atomic resolution facilitates access to the solute decoration of grain boundaries, advancing the knowledge on local segregation and depletion phenomena. More recent developments unlocked three-dimensional mapping of the interfacial excess across grain boundaries. Such detailed understanding of the local structure and composition of these interfaces enabled advancements in processing methods and material development. However, many engineering alloys, such as Ni-based superalloys, have much more complex microstructures with various solutes and precipitates in close proximity to grain boundaries. The complex interaction of grain boundary segregation and grain boundary precipitates requires precise compositional control. However, abrupt changes in solute solubility across phase boundaries obscure the interfacial excess in proximity to grain boundaries.</p><p>Therefore, this study provides a methodological framework of the quantitative characterization of phase boundaries in proximity to grain boundaries using atom probe microscopy. The detailed mass spectrum ranging of MC, M₂₃C₆, and M₆C carbides is explored in order to achieve satisfactory compositional information. Proximity histograms and correlating concentration difference profiles determine the interface location, where a Gibbs dividing surface is not accessible. This enables reliable direct calculation of the interfacial excess across phase boundaries. Intuitively interpretable and quantitative ‘interface plots’ are introduced, and showcased for phase boundaries between γ-matrix, γ' precipitates, GB-γ', MC, M₂₃C₆, and M₆C carbides. The presented framework advances access to the local composition in proximity to grain boundaries and may be applicable to other engineering alloys or materials with functional properties.</p></div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399123002024/pdfft?md5=14233012dc5a9bdf36d4dca964889665&pid=1-s2.0-S0304399123002024-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135664964","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}