Ultramicroscopy最新文献_第10页

Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materials 在含锂材料的电子显微镜表征中预测初级撞击损伤

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-11-11 DOI: 10.1016/j.ultramic.2023.113884

Ali Jaberi, Nicolas Brodusch, Jun Song, Raynald Gauvin

{"title":"Prediction of primary knock-on damage during electron microscopy characterization of lithium-containing materials","authors":"Ali Jaberi, Nicolas Brodusch, Jun Song, Raynald Gauvin","doi":"10.1016/j.ultramic.2023.113884","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113884","url":null,"abstract":"<div>To fulfill power and energy demands, lithium-ion battery (LIB) is being considered as a promising energy storage device. For the development of LIBs, high-resolution electron microscopy characterization of battery materials is crucial. During this characterization, the interaction of beam-electrons with Li-containing materials causes damage through several processes, especially knock-on damage. In this study, we investigated this damage by determining the probability of knock-on damage and performing Monte Carlo simulation. For this objective, the threshold displacement energies (TDEs) were computed using sudden approximation technique for three sets of materials, including pure elements, LiX (X = F, Cl, Br), and Li2MSiO4 (M = Fe, Co, Mn). By including the Climbing-Image Nudge Elastic Band (CI-NEB) method into the sudden approximation approach, it was found that the accuracy of the predicted TDEs could be improved. Results also indicated that at moderate electron energies, the knock-on damage for Li in both its elemental and compound forms maximized. In addition, it was shown that the TDE should be the principal parameter for assessing the Li sensitivity to knock-on damage across similar structures. Nonetheless, other parameters, including cross-section, density, weight fraction, atomic weight, and atomic number, were found to impact the knock-on damage.</div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134656865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Improving the temporal resolution of event-based electron detectors using neural network cluster analysis 利用神经网络聚类分析提高基于事件的电子探测器的时间分辨率

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-11-11 DOI: 10.1016/j.ultramic.2023.113881

Alexander Schröder , Christopher Rathje , Leon van Velzen , Maurits Kelder , Sascha Schäfer

引用次数: 1

Momentum transfer resolved electron correlation microscopy 动量转移分辨电子相关显微镜

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-11-11 DOI: 10.1016/j.ultramic.2023.113886

Shuoyuan Huang, Paul M Voyles

{"title":"Momentum transfer resolved electron correlation microscopy","authors":"Shuoyuan Huang, Paul M Voyles","doi":"10.1016/j.ultramic.2023.113886","DOIUrl":"10.1016/j.ultramic.2023.113886","url":null,"abstract":"<div>Electron correlation microscopy (ECM) characterizes local structural relaxation dynamics in fluctuating systems like supercooled liquids with nanometer spatial resolution. We have developed a new type of ECM technique that provides moderate resolution in momentum transfer or k space using five-dimensional scanning transmission electron microscopy. k-resolved ECM on a Pt57.5Cu14.7Ni5.3P22.5 metallic supercooled liquids measures rich spatial and momentum structure in the relaxation time data <math><mrow><mi>τ</mi><mo>(</mo><mrow><mi>r</mi><mo>,</mo><mi>k</mi></mrow><mo>)</mo></mrow></math>. Relaxation time maps <math><mrow><mi>τ</mi><mo>(</mo><mi>r</mi><mo>)</mo></mrow></math> at each azimuthal k are independent samples of the material's underlying relaxation time distribution, and <math><mi>τ</mi></math> of radial k shows more complex behavior than the de Gennes narrowing observed in analogous X-ray experiments. We have determined the requirements for electron counts per k-pixel, number of k-pixels per speckle, and time sampling to obtain reliable k-resolved ECM data.</div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135670131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples 用于精确模拟生物样品冷冻电镜图像的非晶冰计算模型

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-11-04 DOI: 10.1016/j.ultramic.2023.113882

James M. Parkhurst , Anna Cavalleri , Maud Dumoux , Mark Basham , Daniel Clare , C. Alistair Siebert , Gwyndaf Evans , James H. Naismith , Angus Kirkland , Jonathan W. Essex

{"title":"Computational models of amorphous ice for accurate simulation of cryo-EM images of biological samples","authors":"James M. Parkhurst , Anna Cavalleri , Maud Dumoux , Mark Basham , Daniel Clare , C. Alistair Siebert , Gwyndaf Evans , James H. Naismith , Angus Kirkland , Jonathan W. Essex","doi":"10.1016/j.ultramic.2023.113882","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113882","url":null,"abstract":"<div>Simulations of cryo-electron microscopy (cryo-EM) images of biological samples can be used to produce test datasets to support the development of instrumentation, methods, and software, as well as to assess data acquisition and analysis strategies. To be useful, these simulations need to be based on physically realistic models which include large volumes of amorphous ice. The gold standard model for EM image simulation is a physical atom-based ice model produced using molecular dynamics simulations. Although practical for small sample volumes; for simulation of cryo-EM data from large sample volumes, this can be too computationally expensive. We have evaluated a Gaussian Random Field (GRF) ice model which is shown to be more computationally efficient for large sample volumes. The simulated EM images are compared with the gold standard atom-based ice model approach and shown to be directly comparable. Comparison with experimentally acquired data shows the Gaussian random field ice model produces realistic simulations. The software required has been implemented in the Parakeet software package and the underlying atomic models are available online for use by the wider community.</div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-11-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399123001997/pdfft?md5=41f8dc87b7909c3e15715682352759e0&pid=1-s2.0-S0304399123001997-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134656193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

On central focusing for contrast optimization in direct electron ptychography of thick samples 在厚样品的直接电子ptychography中用于对比度优化的中心聚焦。

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-11-03 DOI: 10.1016/j.ultramic.2023.113879

C. Gao, C. Hofer, T.J. Pennycook

引用次数: 1

Optical STEM detection for scanning electron microscopy 扫描电子显微镜的光学STEM检测。

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-10-30 DOI: 10.1016/j.ultramic.2023.113877

Arent J. Kievits , B.H. Peter Duinkerken , Job Fermie , Ryan Lane , Ben N.G. Giepmans , Jacob P. Hoogenboom

引用次数: 0

Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials 薄片厚度量化在纳米多孔材料FIB层析成像数据三维重建中的作用

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-10-25 DOI: 10.1016/j.ultramic.2023.113878

Trushal Sardhara , Alexander Shkurmanov , Yong Li , Shan Shi , Christian J. Cyron , Roland C. Aydin , Martin Ritter

{"title":"Role of slice thickness quantification in the 3D reconstruction of FIB tomography data of nanoporous materials","authors":"Trushal Sardhara , Alexander Shkurmanov , Yong Li , Shan Shi , Christian J. Cyron , Roland C. Aydin , Martin Ritter","doi":"10.1016/j.ultramic.2023.113878","DOIUrl":"https://doi.org/10.1016/j.ultramic.2023.113878","url":null,"abstract":"<div>In focused ion beam (FIB) tomography, a combination of FIB with a scanning electron microscope (SEM) is used for collecting a series of planar images of the microstructure of nanoporous materials. These planar images serve as the basis for reconstructing the three-dimensional microstructure through segmentation algorithms. However, the assumption of a constant distance between consecutively imaged sections is generally invalid due to random variations in the FIB milling process. This variation complicates the accurate reconstruction of the three-dimensional microstructure. Using synthetic FIB tomography data, we present an algorithm that repositions slices according to their actual thickness and interpolates the results using machine learning-based methods. We applied our algorithm to real datasets, comparing two standard approaches of microstructure reconstruction: on-the-fly via image processing and ruler-based via sample structuring. Our findings indicate that the ruler-based method, combined with our novel slice repositioning and interpolation algorithm, exhibits superior performance in reconstructing the microstructure.</div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-10-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S030439912300195X/pdfft?md5=62650ccf6925bd8a723f9835a48daf18&pid=1-s2.0-S030439912300195X-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"92046564","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Experimental evaluation of usable specimen thickness of Si for lattice imaging by transmission electron microscopy at 300 kV 在300kV下通过透射电子显微镜对用于晶格成像的Si的可用样品厚度的实验评估。

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-10-22 DOI: 10.1016/j.ultramic.2023.113876

Keita Kobayashi, Ryosuke Kizu

引用次数: 0

Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holography 用漂移校正相移离轴电子全息法重建埃分辨出口波。

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-10-22 DOI: 10.1016/j.ultramic.2023.113880

J. Lindner , U. Ross , T. Meyer , V. Boureau , M. Seibt , Ch. Jooss

{"title":"Reconstruction of Angstrom resolution exit-waves by the application of drift-corrected phase-shifting off-axis electron holography","authors":"J. Lindner , U. Ross , T. Meyer , V. Boureau , M. Seibt , Ch. Jooss","doi":"10.1016/j.ultramic.2023.113880","DOIUrl":"10.1016/j.ultramic.2023.113880","url":null,"abstract":"<div>Phase-shifting electron holography is an excellent method to reveal electron wave phase information with very high phase sensitivity over a large range of spatial frequencies. It circumvents the limiting trade-off between fringe spacing and visibility of standard off-axis holography. Previous implementations have been limited by the independent drift of biprism and sample. We demonstrate here an advanced drift correction scheme for the hologram series that exploits the presence of an interface of the TEM specimen to the vacuum area in the hologram. It allows to obtain reliable phase information up to 2π/452 at the 1 Å information limit of the Titan 80–300 kV environmental transmission electron microscope used, by applying a moderate voltage of 250 V to a single biprism for a fringe spacing of 1 Å. The obtained phase and amplitude information is validated at a thin Pt sample by use of multislice image simulation with the frozen lattice approximation and shows excellent agreement. The presented method is applicable in any TEM equipped with at least one electron biprism and thus enables achieving high resolution off-axis holography in various instruments including those for in-situ applications. A software implementation for the acquisition, calibration and reconstruction is provided.</div>","PeriodicalId":23439,"journal":{"name":"Ultramicroscopy","volume":null,"pages":null},"PeriodicalIF":2.2,"publicationDate":"2023-10-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.sciencedirect.com/science/article/pii/S0304399123001973/pdfft?md5=1922ccc380c89e9aebb2472548a431e4&pid=1-s2.0-S0304399123001973-main.pdf","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89719649","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Optimizing experimental parameters for orbital mapping 优化轨道测绘实验参数。

IF 2.2 3区工程技术

Ultramicroscopy Pub Date : 2023-10-18 DOI: 10.1016/j.ultramic.2023.113866

Manuel Ederer, Stefan Löffler

引用次数: 0