Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium最新文献

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Thermal resistance measurement of LEDswith multi-chip packages 多芯片封装led的热阻测量
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625226
L. Kim, M. Shin
{"title":"Thermal resistance measurement of LEDswith multi-chip packages","authors":"L. Kim, M. Shin","doi":"10.1109/STHERM.2006.1625226","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625226","url":null,"abstract":"Thermal transient measurements of high power GaN-based LEDs with multi-chip designs are presented and discussed in the paper. Once transient cooling curve was obtained, the structure function theory was applied to determine the thermal resistance of packages. The total thermal resistance from junction to ambient considering optical power is 19.87 K/W, 10.78 K/W, 6.77 K/W for the one-chip, two-chip and four-chip packages, respectively. The contribution of each component to the total thermal resistance of the package can be determined from the cumulative structure function and differential structure function. The total thermal resistance of multi-chip packages is found to decrease with the number of chips due to parallel heat dissipation. Moreover, an important thermal design rule for high power multi-chip LEDs is analogized from the experiments. With the number of chips increasing, the thermal resistance can be decreased, but the impact will be different with the ratio of partial thermal resistance","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114478867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Thermal management of an led light engine for airborne applications 机载led光引擎的热管理
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625225
R. Wilcoxon, D. Cornelius
{"title":"Thermal management of an led light engine for airborne applications","authors":"R. Wilcoxon, D. Cornelius","doi":"10.1109/STHERM.2006.1625225","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625225","url":null,"abstract":"Rockwell Collins has recently developed a light engine, which uses four light emitting diodes (LEDs) as the light source, for a cockpit display system. Under worst case operating conditions, the local heat flux from these LEDs can be more than 1000 W/cm2. This paper describes the thermal management approach for the light engine and presents the results of finite element modeling. This modeling was used to assess various design aspects of the light engine to understand their effects on the overall thermal resistance. Thermal testing of a set of light engines was eventually found to be quite comparable to the modeling results, although a discrepancy between testing and modeling results did help to identify a manufacturing defect that occurred in some early prototype devices, which significantly increased their thermal resistance","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114361948","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Hot spot cooling using embedded thermoelectric coolers 热点冷却采用嵌入式热电冷却器
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625219
G. J. Snyder, Marco Soto, Randy Alley, David Koester, Bob Conner Nextreme
{"title":"Hot spot cooling using embedded thermoelectric coolers","authors":"G. J. Snyder, Marco Soto, Randy Alley, David Koester, Bob Conner Nextreme","doi":"10.1109/STHERM.2006.1625219","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625219","url":null,"abstract":"Localized areas of high heat flux on microprocessors produce hot spots that limit their reliability and performance. With increasingly dense circuits and the integration of high power processors with low power memory, non-uniform thermal profiles will become more dramatic and difficult to manage. Chip scale thermal solutions designed to keep hot spots below a critical temperature unnecessarily overcool the rest of the CPU and add to heat-sink load. Localized hot spot cooling solutions, even active systems that contribute some additional heat, can do a better job controlling hot spot temperatures when efficiently integrated with a heat spreader. Embedded thermoelectric cooling (eTEC) is a promising approach to reduce the temperature of highly localized, high heat flux hot spots generated by today's advanced processors","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125171174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 117
Thermal performance of thermoelectric cooler (tec) integrated heat sink and optimizing structure for low acoustic noise / power consumption 热电冷却器(tec)的热性能集成散热器和优化结构,以降低噪音/功耗
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625220
M. Ikeda, T. Nakamura, Y. Kimura, H. Noda, I. Sauciuc, H. Erturk
{"title":"Thermal performance of thermoelectric cooler (tec) integrated heat sink and optimizing structure for low acoustic noise / power consumption","authors":"M. Ikeda, T. Nakamura, Y. Kimura, H. Noda, I. Sauciuc, H. Erturk","doi":"10.1109/STHERM.2006.1625220","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625220","url":null,"abstract":"In this paper, authors are proposing the idea of applying thermoelectric cooler (TEC) to CPU cooling. The proposed cooling system is a no moving parts apparatus that can improve thermal performance by keeping same form factor. This system will accommodate an increase in the CPU thermal design power and/or lower the noise of the cooling solution. The thermal performance of this proposed device will be presented together with the optimization for low acoustic noise and low TEC power consumption. As a result, we found out that \"hybrid structure\", which was composed of an integrated combination of TEC integrated heat sink and heat pipe remote heat sink, could reduce acoustic fan noise and required TEC power consumption to cool the CPU. In one particular case, we succeeded to develop a compact cooling device which had a capability of CPU cooling for 130 W at acoustic fan noise less than 40 dB, with COP = 10.8","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"80 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131367154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Optimization of doping concentration for three-dimensional bulk silicon microrefrigerators 三维体积硅微制冷机掺杂浓度优化
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625234
Yan Zhang, G. Zeng, A. Shakouri, Peng Wang, Bao Yang, A. Bar-Cohen
{"title":"Optimization of doping concentration for three-dimensional bulk silicon microrefrigerators","authors":"Yan Zhang, G. Zeng, A. Shakouri, Peng Wang, Bao Yang, A. Bar-Cohen","doi":"10.1109/STHERM.2006.1625234","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625234","url":null,"abstract":"We designed and fabricated a three-dimensional (3D) silicon microrefrigerator, which demonstrates a cooling power density over 200W/cm with only ~1degC cooling. The high cooling power density is mainly due to the high thermal conductivity and heat spreading effects. These devices have potential application in hot-spots management to reduce the chip peak temperature and realize on chip thermal management. A finite element model is developed to study and optimize these 3D devices. The simulation results showed that the optimized doping concentration to achieve the maximum cooling for these 3D silicon microrefrigerators (5e18 cm-3) is different from the conventional ID device, where S2sigma achieves the maximum at the doping of 5e19 cm-3. At its optimized doping concentration, these silicon microrefrigerators could reach a maximum cooling of 3degC. Further studies prove that this deviation is due to the nonidea factors inherent within the device, e.g. semiconductor-metal contact resistance, Joule-heating from probe contact resistance etc. Thus to optimize the real device, it is necessary to chose a full model considering all the nonideal factors","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133113912","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Advanced DBC (direct bonded copper) substrates for high power and high voltage electronics 用于大功率和高压电子设备的先进DBC(直接键合铜)衬底
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625233
J. Schulz-Harder
{"title":"Advanced DBC (direct bonded copper) substrates for high power and high voltage electronics","authors":"J. Schulz-Harder","doi":"10.1109/STHERM.2006.1625233","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625233","url":null,"abstract":"Direct bond copper (DBC) substrates have been proven for many years as an excellent solution for electrical isolation and thermal management of high power semiconductor modules. The advantages of DBC-substrates are high current carrying capability due to thick copper metallization and a thermal expansion close to that of silicon at the copper surface due to high bond strength of copper to ceramic. The integration of this DBC substrate to a liquid cold plate made by the DBC process has made thermal resistances in the range of 30mK/W possible for a wide range of power applications. The main exception is in the case of high voltages (3 kV to 7 kV) where the partial discharge of typical DBC substrates makes them unacceptable. Increasing requirements for thermal performance and partial discharge free behavior of high power modules have driven research to further improve DBC substrates and the thermal performance available to high voltage applications. This paper will present recent developments of partial discharge free and liquid cooled substrates","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114933550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Experimental study on a hybrid liquid/air cooling system 液/空混合冷却系统的实验研究
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625199
D. Xiong, K. Azar, B. Tavassoli
{"title":"Experimental study on a hybrid liquid/air cooling system","authors":"D. Xiong, K. Azar, B. Tavassoli","doi":"10.1109/STHERM.2006.1625199","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625199","url":null,"abstract":"A high capacity hybrid liquid/air cooling system is proposed and partially tested in this paper. The cooling system is a compact sized package, including a forced thermal spreader with a small pump, a manifold minichannel air heat sink and an air mover. The forced thermal spreader can greatly reduce the spreading thermal resistance and bring more uniform temperature distribution on the top surface. The manifold minichannel air heat sink has a very low thermal resistance while keeping reasonable pressure drop. The heat is first transported from the chip to the liquid inside the forced thermal spreader, and then the liquid spreads to the surface of the heat sink, via circulating in the microchannels and minichannels inside the spreader. Following that, by uniquely designed manifold heat sink, the heat is transferred into ambient environment. The cooling system inherits the advantages from both liquid and air, and at the same time, it avoids problems from liquid cooling like size, leakage and high thermal resistance of air cooling side of the overall loop. A prototype has been manufactured and tested to verify the design","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130104740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaporator/boiler design for thermosyphons utilizing segregated hydrofluoroether working fluids 利用分离氢氟醚工作流体的热虹吸管蒸发器/锅炉设计
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625209
P. Tuma
{"title":"Evaporator/boiler design for thermosyphons utilizing segregated hydrofluoroether working fluids","authors":"P. Tuma","doi":"10.1109/STHERM.2006.1625209","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625209","url":null,"abstract":"In this work, a new micro porous metallic coating method is used to produce two compact boiler assemblies that are practical for use in thermosyphons in electronics systems. These assemblies were tested using a segregated hydrofluoroether (HFE) working fluid C3F7 OCH3 on 1.0, 4.0 and 13.7 cm2 heat sources at atmospheric pressure. The best of these yielded sink-to-fluid resistances, Rsf, at 230W of 0.092, 0.047 and 0.024degC/W, respectively. This boiler assembly was incorporated into a thermosyphon with a remote 100times100times2.2mm finned-tube condenser that produced a condensation resistance, Rfa, of ~0.1degC/W with a 7.6W 92times3 8mm fan. That thermosyphon was tested on the aforementioned heat sources yielding much improved Rsf values of 0.083, 0.026 and 0.014degC/W at 150W. Data gathered with larger condensers or more powerful fans suggest that it is quite practical to produce a compact thermosyphon that can cool a 20mm device generating 250W with Rsa<0.10C/W, a performance level competitive with forced water systems","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126780346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 28
Challenges in thermal interface material testing 热界面材料测试方面的挑战
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625204
C. Lasance, C. Murray, D. Saums, M. Renez
{"title":"Challenges in thermal interface material testing","authors":"C. Lasance, C. Murray, D. Saums, M. Renez","doi":"10.1109/STHERM.2006.1625204","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625204","url":null,"abstract":"Characterization of thermal properties of thermal interface materials (TIMs) has gained increasing importance as the relative percentage of overall semiconductor package material thermal resistance attributable to the TIMs has increased. The development of new TIM materials has increasingly focused on materials with very high performance and, in certain instances, with very thin in-situ application thickness. These trends have placed increasing focus on the characterization methods, characterization equipment, and accuracy and repeatability of results. This discussion focuses mainly on standardization aspects, standardized laboratory measurement methodology, and application-specific measurements","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116765291","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 63
Prediction of thermal performance degradation of air-cooled fine-pitch fin array heat sinks due to fouling 风冷细间距翅片阵列散热器因结垢导致热性能退化的预测
Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium Pub Date : 2006-03-14 DOI: 10.1109/STHERM.2006.1625198
A. Nabi, P. Rodgers, A. Bar-Cohen
{"title":"Prediction of thermal performance degradation of air-cooled fine-pitch fin array heat sinks due to fouling","authors":"A. Nabi, P. Rodgers, A. Bar-Cohen","doi":"10.1109/STHERM.2006.1625198","DOIUrl":"https://doi.org/10.1109/STHERM.2006.1625198","url":null,"abstract":"The fouling of air-cooled fine-pitch heat sinks by air born dust particles has become a major reliability concern for desktop and notebook personal computers, where significant thermal performance degradation can result. This paper investigates for the first time heat sink fouling mechanisms by both analytical and experimental analyses. The contribution of two fouling modes, namely accumulation of a thermally insulative dust coating on the fins within the heat sink channels, and blockage of the heat sink leading edge entrance, is quantified. It is found that the former fouling mode does not significantly increase heat sink thermal resistance. Instead, heat sink thermal performance degradation is essentially attributable to leading edge entrance blockage, which reduces the airflow rate through the heat sink by increasing pressure drop","PeriodicalId":222515,"journal":{"name":"Twenty-Second Annual IEEE Semiconductor Thermal Measurement And Management Symposium","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114986223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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