TENCON 2015 - 2015 IEEE Region 10 Conference最新文献_第8页

Performance analysis of 3D flexure FET with meandering gate for higher sensitivity 弯曲栅极提高灵敏度的三维柔性场效应管性能分析

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7373072

Pralay Chakrabarty, K. Guha, S. Baishya

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引用次数: 2

Inertial Measurement units based wireless sensor network for real time gait analysis 基于惯性测量单元的无线传感器网络实时步态分析

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7372999

Imesh Lihinikaduarachchi, Sajith Asanka Rajapaksha, Charitha Saumya, Viraj Senevirathne, Pujitha Silva

引用次数: 1

Asymmetrical FinFET SRAM cells with wider read noise margin and lower leakage currents 非对称FinFET SRAM单元具有更宽的读噪声裕度和更低的漏电流

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7373000

S. Salahuddin, V. Kursun

引用次数: 1

Performance analysis of Solar PV-diesel based autonomous hybrid power system using FFA and CSA optimized controller 基于FFA和CSA优化控制器的太阳能-柴油自主混合动力系统性能分析

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7373073

D. Das, Ankita Sharma, Dorji Dema, Atish Modi

引用次数: 1

Effect of preparation process on tensile strength of nano-hydroxyapatite/polyetheretherketone composite materials 制备工艺对纳米羟基磷灰石/聚醚酮复合材料抗拉强度的影响

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7373112

Lin Wang, Chunbao Wang, J. Qin, Zhengzhi Wu, Shenhua Song

引用次数: 2

Multiple-event-transient soft-error gate-level simulator for harsh radiation environments 用于恶劣辐射环境的多事件瞬态软误差门级模拟器

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7373147

A. Mochizuki, N. Onizawa, A. Tamakoshi, T. Hanyu

{"title":"Multiple-event-transient soft-error gate-level simulator for harsh radiation environments","authors":"A. Mochizuki, N. Onizawa, A. Tamakoshi, T. Hanyu","doi":"10.1109/TENCON.2015.7373147","DOIUrl":"https://doi.org/10.1109/TENCON.2015.7373147","url":null,"abstract":"A gate-level simulator considering a multiple-event transient (MET) is proposed to design soft-error resilient VLSI chips for harsh radiation environments. Single event transients (SETs) at several logic gates might occur independently during a clock cycle, causing a wrong “pulse” captured in a D-flip-flop (D-F/F). To investigate the MET influence, SET effects at each gate are precisely modelled in the proposed primitive cell library. The proposed MET model can program the following three parameters of soft-error pulse as 1) probability of pulse generation, 2) the pulse width, and 3) the pulse position during each internal cycle. Moreover, the probability of generating the wrong pulse, its width, and its position are individually decided at each primitive cell, so that multi-event pulse generations at a combinational circuit are performed. For example, typical benchmark circuits synthesized under a 90nm CMOS technology are simulated in the proposed cell library, and the soft-error effect due to circuit styles is evaluated in accordance with the variety of fault-injection rate. Several correct logical values captured at each D-F/F are generated in spite of false conditions on internal nodes. This proposed cell library for a soft-error simulator at the harsh radiation environments is effectively used to re-verify the existing fault-tolerant circuits such as an ECC.","PeriodicalId":22200,"journal":{"name":"TENCON 2015 - 2015 IEEE Region 10 Conference","volume":"1 1","pages":"1-6"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88285842","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 3

The overall trend of female engineers in Thailand 泰国女性工程师的总体趋势

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7373138

Jirada Gosumbonggot

引用次数: 0

Porting an Operating System on an ARM-based sensor platform 在基于arm的传感器平台上移植操作系统

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7372829

Patrice Abbie D. Legaspi, K. K. Khan, Kathleen D. Santiago, Don F. Sayson, H. Aquino, C. V. Densing, J. Hizon, L. Alarcón

引用次数: 1

Frequency stability analysis and control for thermal-wind generation with HVDC islanded sending 高压直流孤岛式热风发电频率稳定性分析与控制

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7372744

Y. Zuo, Minxiao Han, Zheng Chao

引用次数: 3

Prototype development and performance evaluation of wireless LAN access points for Community Information Network 社区信息网络无线局域网接入点原型开发及性能评估

TENCON 2015 - 2015 IEEE Region 10 Conference Pub Date : 2015-11-01 DOI: 10.1109/TENCON.2015.7372832

Akio Ogata, Hirohide Matsuzaka, Hayato Taniguchi, Masaya Nomoto, Ayami Manaka, Koichi Saito, M. Fukuzaki, H. Ishii, Yasuhiro Nozawa, K. Utsu

引用次数: 2