Surface and Interface Analysis最新文献_第4页

Tailoring the mechanical and high‐temperature tribological properties of Si‐DLC films by controlling the Si content 通过控制硅含量定制硅-DLC 薄膜的机械性能和高温摩擦学性能

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-04-05 DOI: 10.1002/sia.7308

Weijie Yu, Qiuping Mei, Weijiu Huang, Junjun Wang, Yongyao Su

{"title":"Tailoring the mechanical and high‐temperature tribological properties of Si‐DLC films by controlling the Si content","authors":"Weijie Yu, Qiuping Mei, Weijiu Huang, Junjun Wang, Yongyao Su","doi":"10.1002/sia.7308","DOIUrl":"https://doi.org/10.1002/sia.7308","url":null,"abstract":"The poor high‐temperature tribological performance of diamond‐like carbon (DLC) films severely limits their applications. To address this issue, silicon (Si) doped DLC films with Si content ranging from 0 to 11.52 at.% were synthesized utilizing the plasma‐assisted reactive magnetron sputtering technique. The influence of Si incorporation on the microstructure and mechanical properties was meticulously investigated by Raman spectroscopy, scanning electron microscope (SEM), X‐ray photoelectron spectroscopy (XPS), nanoindentation, and scratch testing. To ascertain the tribological behavior of the Si‐DLC films under elevated temperature conditions, in situ high‐temperature tests were conducted, spanning temperatures from ambient to 500°C. The findings indicated that distinct lubrication mechanisms prevail for Si‐DLC films with varying Si content across different temperature domains. As the test temperature and Si content increased, the lubrication mechanism exhibited a gradual transitions from high‐temperature induced graphitization to a particle wear regime dominated by SiC and formed SiO2 abrasive phases. The comprehensive performance of the films peaked at a Si content of 4.72 at.%, suggesting an optimal composition for high‐temperature applications. It is postulated that the in‐depth investigation presented herein holds considerable value for the design and fabrication of DLC films intended for use in high‐temperature settings, potentially unlocking their full potential in such demanding environments.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"66 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-04-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140588501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The effect of sputtering parameters and doping on the properties of CrN‐based coatings—A critical review 溅射参数和掺杂对氮化铬涂层性能的影响--重要综述

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-28 DOI: 10.1002/sia.7306

Sunil Kumar Tiwari, Akula Umamaheswara Rao, Archana Singh Kharb, Devesh Kumar Avasthi, Piyush Chandra Verma, Amit Kumar Chawla

{"title":"The effect of sputtering parameters and doping on the properties of CrN‐based coatings—A critical review","authors":"Sunil Kumar Tiwari, Akula Umamaheswara Rao, Archana Singh Kharb, Devesh Kumar Avasthi, Piyush Chandra Verma, Amit Kumar Chawla","doi":"10.1002/sia.7306","DOIUrl":"https://doi.org/10.1002/sia.7306","url":null,"abstract":"Chromium‐based coatings have been of interest to researchers for the last two decades because of their extraordinary properties like high hardness, high wear, and corrosion resistance properties. However, it is in practice and research to increase the properties of Cr‐based coatings for high‐temperature applications. Numerous dopants like silicon (Si), titanium (Ti), vanadium (V), aluminum (Al), and zirconium (Zr) have been used together with Cr to achieve enhanced properties. The plasma‐based sputtering process is one of the popular and reliable techniques to deposit thin film coatings. The substrate material, processed gas and pressure, substrate temperature, film thickness, and so on also play a significant role in varying the properties and microstructure of the deposited film. Several researchers have deposited Cr/CrN‐based thin films via the chemical vapor deposition technique (CVD) and physical vapor deposition technique (PVD) to study their properties and behavior at room temperature as well as for high‐temperature applications. This work reflects the review of work done to deposit Cr/CrN‐based coatings deposited via PVD: more specifically sputtering technique. The effect of doping in the CrN matrix and variation in sputtering parameters on the properties of CrN‐based coatings have also been studied.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"45 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140323001","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Surface science insight note: Optimizing XPS instrument performance for quantification of spectra 表面科学启示录：优化 XPS 仪器性能，实现光谱量化

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-15 DOI: 10.1002/sia.7296

Vincent Fernandez, Olivier Renault, Neal Fairley, Jonas Baltrusaitis

{"title":"Surface science insight note: Optimizing XPS instrument performance for quantification of spectra","authors":"Vincent Fernandez, Olivier Renault, Neal Fairley, Jonas Baltrusaitis","doi":"10.1002/sia.7296","DOIUrl":"https://doi.org/10.1002/sia.7296","url":null,"abstract":"X‐ray photoelectron spectroscopy (XPS) provides quantitative information from photoemission peaks and shapes observed within the background due to the inelastic scattering of photoelectrons. To quantify the signal, both photoemission peaks and background in spectra must be adjusted for instrumental transmission variations that are a consequence of changes in efficiency when recording electrons with different kinetic energy. While it is generally assumed that correcting spectroscopic data for transmission is a necessary part of quantification by XPS, there are consequences for the quantification of spectra measured using an instrument for which transmission has significant curvature. In this Insight, the implications of curvature in transmission characteristics are discussed and a method based on XPS microscopy is proposed that ensures the transmission response of an instrument is free from significant curvature. An example of an instrument for which a flat transmission response is presented is achieved through collecting spectra using lens modes designed to measure stigmatic images.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"3 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140147268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Quantification of aluminium and silicon-containing materials using Ag Lα X-rays 使用 Ag Lα X 射线定量分析含铝和硅的材料

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-14 DOI: 10.1002/sia.7301

Stuart R. Leadley

{"title":"Quantification of aluminium and silicon-containing materials using Ag Lα X-rays","authors":"Stuart R. Leadley","doi":"10.1002/sia.7301","DOIUrl":"https://doi.org/10.1002/sia.7301","url":null,"abstract":"In recent years, instrument manufacturers have been providing laboratory-based HAXPES (hard X-ray photoelectron spectroscopy) instruments that have monochromated silver Lα, chromium Kα and gallium Kα X-ray sources. To be more than a qualitative tool, two things are required: calibration of the signal intensity as a function of kinetic energy (spectrometer response function) and relative sensitivity factors. This is now possible because of routines being available to generate the spectrometer response functions for dual Al Kα/Ag Lα X-ray sources and the availability of Cant average matrix relative sensitivity factors (AMRSFs). However, to improve accuracy when using the Cant AMRSF care needs to be taken in the definition of the peak areas being used. This is because they need to include the total intrinsic signal that often extends beyond the main peak. This is a particular challenge when quantifying using the Al 1s peak generated with Ag Lα X-rays as some of the intrinsic signal overlaps with the Al KLL Auger peak. When materials include both aluminium and silicon atoms, the Si 2s and 2p peaks sit upon extended signals coming from the Al 2s and 2s peaks, respectively. Thus, quantification should be limited to using the main peak area, which necessitates different relative sensitivity factors (RSFs). Using polydimethylsiloxane (PDMS) and sapphire (Al2O3) as model systems, experimental RSFs have been determined for use with the main peaks for O 1s, Al 1s, Al2s Al 2p, Si 1s, Si 2s and Si 2p subshells normalized to the RSF of the carbon 1s main peak.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"2 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140147305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

The development of laboratory‐based high energy sources for XPS 开发用于 XPS 的实验室高能源

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-14 DOI: 10.1002/sia.7300

John F. Watts, James E. Castle

{"title":"The development of laboratory‐based high energy sources for XPS","authors":"John F. Watts, James E. Castle","doi":"10.1002/sia.7300","DOIUrl":"https://doi.org/10.1002/sia.7300","url":null,"abstract":"Over the last fifty years, a number of higher energy X‐ray sources have been suggested as alternatives for the usual AlKα source found in the first commercial XPS systems and still the standard anode material for XPS today. This paper reviews the development of a number of such sources, predominantly in the authors' laboratory, and the rationale behind the desire to extend the binding energy range of the technique. The achromatic sources SiKα, ZrLα and TiKα are described along with monochromatic sources AgLα and CrKβ, both based on the standard quartz monochromator geometry but taking higher orders of diffraction. The driving force for much of this development was the desire to probe deeper core levels and CCC Auger transitions. These could be combined into initial or final state Auger parameters as described in much of the work cited in this review. The highest energy source considered is the CuKα source based around an external X‐ray tube, which provides much insight into the electronic structure of steels by measurement of the Fe1s and FeKLL peaks. The last decade or so has seen a significant increase of interest in HAXPES, and all manufacturers of turn‐key XPS instruments offer HAXPES options of one form or another, there are three dedicated HAXPES systems commercially available, which are very briefly described.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"50 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140147267","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Challenges in quantifying Pt concentrations in Pd alloys by using secondary ion mass spectrometry: Strong grain orientation effects 利用二次离子质谱法量化钯合金中铂浓度的挑战：强烈的晶粒取向效应

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-14 DOI: 10.1002/sia.7302

Børge Holme, Silje Fosse Håkonsen, David Waller

{"title":"Challenges in quantifying Pt concentrations in Pd alloys by using secondary ion mass spectrometry: Strong grain orientation effects","authors":"Børge Holme, Silje Fosse Håkonsen, David Waller","doi":"10.1002/sia.7302","DOIUrl":"https://doi.org/10.1002/sia.7302","url":null,"abstract":"Palladium–platinum alloys were analysed by dynamic secondary ion mass spectrometry (SIMS) to investigate grain orientation effects that gave differences of up to 400% in the Pt/Pd count rate ratios, even within the same grain upon small rotations of a Pd sample with 1 wt% Pt. The sample had been homogenized by annealing, and the homogeneity was confirmed by X‐ray analysis in scanning electron microscopy (SEM). Grain orientations were determined by electron backscatter diffraction (EBSD). Crater depths were measured by white light interferometry (WLI). SEM images from the bottom of SIMS craters made in the same grain after small rotations around the sample surface normally showed different patterns of microfaceting for some rotation angles, probably exposing low‐index crystallographic planes. A complete understanding of the observed grain orientation effect is still lacking. However, factors such as ion mass, sputter rate, ion channelling, ion focusing, preferential sputtering, surface height, crater microfaceting and/or angle‐dependent sputtering seem to play a role. For these Pd–Pt alloys, the strong grain orientation effect adds another level of complexity when attempting to quantify concentrations and obtain depth profiles by SIMS. Without proper sampling and/or averaging, one could reach very wrong conclusions when comparing results from different samples.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"6 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140147298","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A study on functionalization process of silicon dioxide nanoparticles for hydrophobic coating applications 用于疏水涂层的二氧化硅纳米颗粒功能化工艺研究

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-10 DOI: 10.1002/sia.7305

Avinash Kumar, Sushant Negi, Simanchal Kar

{"title":"A study on functionalization process of silicon dioxide nanoparticles for hydrophobic coating applications","authors":"Avinash Kumar, Sushant Negi, Simanchal Kar","doi":"10.1002/sia.7305","DOIUrl":"https://doi.org/10.1002/sia.7305","url":null,"abstract":"Functionalized nano-SiO2 is an inorganic compound that exhibits hydrophobic properties upon the addition of a silane group through a chemical reaction. This property is highly effective in surface modification for various substrates, including glass, metal, and ceramics. These surface modifications find applications in self-cleaning, anti-fogging coatings, and water-repellent materials. In this work, the role of nano-SiO2 and Hexadecyltrimethoxysilane (HDTMS) functionalized nano-SiO2 has been synthesized successfully by the sol–gel method for coating applications. The outcomes of water contact angle (WCA), analysis, Fourier transform infrared spectroscopy (FTIR), thermal gravimetric analysis (TGA), scanning electron microscope (SEM), and transmission electron microscope (TEM) observations revealed the successful grafting of hydrophobic long-chain alkyl groups from HDTMS onto the surface of SiO2 nanoparticles. Notably, when the ratio of SiO2 nanoparticles to HDTMS is 0.25:1, the WCA of the functionalized SiO2 nanoparticles is enhanced significantly. This value is 5.35 times greater than the initial angle of contact before the modification, leading to the achievement of a super hydrophobic property.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"69 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140100131","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Effect of Al2O3 thickness and oxidant precursors on the interface composition and contamination in Al2O3/GaN structures Al2O3 厚度和氧化剂前驱体对 Al2O3/GaN 结构中界面成分和污染的影响

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-04 DOI: 10.1002/sia.7299

Tarek Spelta, Eugénie Martinez, Marc Veillerot, Pedro Fernandes Paes Pinto Rocha, Laura Vauche, Bassem Salem, Bérangère Hyot

{"title":"Effect of Al2O3 thickness and oxidant precursors on the interface composition and contamination in Al2O3/GaN structures","authors":"Tarek Spelta, Eugénie Martinez, Marc Veillerot, Pedro Fernandes Paes Pinto Rocha, Laura Vauche, Bassem Salem, Bérangère Hyot","doi":"10.1002/sia.7299","DOIUrl":"https://doi.org/10.1002/sia.7299","url":null,"abstract":"In this paper, we investigate the Al2O3/GaN critical buried interface of the next generation of gallium nitride (GaN)‐based transistors using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) and hard X‐ray photoelectron spectroscopy (HAXPES). Results highlight that gallium oxidation at this interface is enhanced when increasing the Al2O3 thickness from 3 up to 20 nm. Gallium oxidation is reduced when using both O3 and H2O as oxidant precursors, compared with only H2O during the growth of Al2O3. In addition, the O3/H2O‐based Al2O3 favors a reduction of contaminants such as hydrogen and carbon but enhances the presence of halides (Cl− and F−) at this Al2O3/GaN interface.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"49 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140032581","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Crater radius analysis after dual droplets successive oblique impact on liquid film 双液滴连续斜撞击液膜后的凹坑半径分析

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-03 DOI: 10.1002/sia.7304

Minle Bao, Denghui Zhao, Luyuan Gong, Yali Guo, Shengqiang Shen

{"title":"Crater radius analysis after dual droplets successive oblique impact on liquid film","authors":"Minle Bao, Denghui Zhao, Luyuan Gong, Yali Guo, Shengqiang Shen","doi":"10.1002/sia.7304","DOIUrl":"https://doi.org/10.1002/sia.7304","url":null,"abstract":"Droplet impact is a common occurrence in nature, agriculture, and industry. The research on the multi‐droplet impact is fundamental to understanding the tangled nature of reality. This paper numerically studies the successive oblique impact of dual droplets on the liquid film by building an effective three‐dimensional model. The leading and trailing droplets are set to pass a certain impact point with the same velocity. The main contribution of this paper is the investigation of the effects of Weber number, liquid film thickness, impact angle, and impact time interval on the interface morphology evolution after the droplet impact. Results show that splash pattern conversion of the primary or secondary crown occurs with the change of these factors. Besides, the variations of the maximum crater radius in upstream, lateral, and downstream directions with time are quantitatively analyzed. The crater radius analysis is carried out from three perspectives, the variation during the single droplet impact, the change during the dual droplets impact, and the comparison between them. It is found that the crater of dual droplets impact exhibits shape distortion in the deformation period and appears a marked dimensional increase in the secondary expansion period.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"129 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140025530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Synthesis, characterization, and performance evaluation of polyamide‐Ag@SiO2 Raman substrate 聚酰胺-Ag@SiO2 拉曼衬底的合成、表征和性能评估

IF 1.7 4区化学

Surface and Interface Analysis Pub Date : 2024-03-01 DOI: 10.1002/sia.7303

Shiying Wu, Lan Zhang, Tingting Zhang, Lujie Li, Anqi Li, Lingling Wang, Chang Liu, Weihua Li, Jiansheng Li, Rui Lu

{"title":"Synthesis, characterization, and performance evaluation of polyamide‐Ag@SiO2 Raman substrate","authors":"Shiying Wu, Lan Zhang, Tingting Zhang, Lujie Li, Anqi Li, Lingling Wang, Chang Liu, Weihua Li, Jiansheng Li, Rui Lu","doi":"10.1002/sia.7303","DOIUrl":"https://doi.org/10.1002/sia.7303","url":null,"abstract":"At present, Ag nanoparticles have been widely used as Raman substrates, but their easy oxidation and aggregation have limited practical applications. In order to address the above problems, firstly, tetraethyl orthosilicate as a precursor was applied to synthesis silver coated with silica dioxide nanoparticles (Ag@SiO2). As a result, the surface of Ag nanoparticles is uniformly coated with a thin layer of SiO2 in order to solve the easy oxidation problem without adversely affecting their surface‐enhanced Raman scattering (SERS) performance. Furthermore, Ag@SiO2 nanoparticles were electrostatically deposited onto polyamide (PA) films to form a two‐dimensional PA‐Ag@SiO2 film substrate, thus resolving nanoparticle agglomeration issues and further improving the repeatability of the entire system. As can been from the SERS detection results obtained from the probe molecules and pollutants, the Raman signal on the PA‐Ag@SiO2 thin film substrate has a good degree of sensitivity, stability, and repeatability.","PeriodicalId":22062,"journal":{"name":"Surface and Interface Analysis","volume":"16 1","pages":""},"PeriodicalIF":1.7,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140019244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"化学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0