表面分析见解说明：在正电极-电解质相间研究中考虑 X 射线束损伤效应

IF 1.6 4区化学 Q4 CHEMISTRY, PHYSICAL

Surface and Interface Analysis Pub Date : 2024-02-20 DOI:10.1002/sia.7294

Roberto Fantin, Ambroise Van Roekeghem, Jean-Pascal Rueff, Anass Benayad

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引用次数: 0

摘要

我们研究了在对 LiNiO2 电极进行 X 射线光电子能谱测量时 X 射线束损伤的影响。比较了原始电极和循环电极在实验室和同步辐射 X 射线辐射下的损伤程度，突出了正固态电极-电解质间相在保护循环 LiNiO2 表面免受光束损伤方面的作用。此外，还概述了避免或至少减少光束诱导效应的可能步骤。

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Surface analysis insight note: Accounting for X-ray beam damage effects in positive electrode-electrolyte interphase investigations

We investigated the effects of X-ray beam damage during X-ray photoelectron spectroscopy measurement on LiNiO₂ electrodes. The degree of damage induced by lab-based and synchrotron X-ray radiation has been compared between pristine and cycled electrodes, highlighting the role of positive solid electrode–electrolyte interphase to protect the cycled LiNiO₂ surface from beam damage. The possible steps to avoid or at least reduce the beam-induced effects are outlined.

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来源期刊

Surface and Interface Analysis 化学-物理化学

CiteScore

3.30

自引率

5.90%

发文量

130

审稿时长

4.4 months

期刊介绍： Surface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces and thin films. Papers dealing with standardization and quantification are particularly welcome, and also those which deal with the application of these techniques to industrial problems. Papers dealing with the purely theoretical aspects of the technique will also be considered. Review articles will be published; prior consultation with one of the Editors is advised in these cases. Papers must clearly be of scientific value in the field and will be submitted to two independent referees. Contributions must be in English and must not have been published elsewhere, and authors must agree not to communicate the same material for publication to any other journal. Authors are invited to submit their papers for publication to John Watts (UK only), Jose Sanz (Rest of Europe), John T. Grant (all non-European countries, except Japan) or R. Shimizu (Japan only).