{"title":"Qualitative Risk Assessment in the Application of Circuit-based Protection Against SEL in Space Electronics","authors":"A. Yanenko","doi":"10.1109/MWENT55238.2022.9802351","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802351","url":null,"abstract":"The article considers the peculiarities of single event latch-up (SEL) in microelectronic devices under space high-energy particles irradiation and shows the limitations and risks of the usage of circuit-based SEL protection in space electronics. Different parameters of multiple thyristor structures in common IC chip and fixed threshold current of SEL suppressor circuit lead to a possibility not to detect some of many SEL events under ion irradiation and increase the risk of hard error due to SEL. Several salvations of this problem are discussed in the paper.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"111 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133244477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Shemonaev, A. Anikin, K. Epifantsev, P. Skorobogatov
{"title":"Latch-up in Integrated Circuits Under Single and Periodic Electrical Overstress","authors":"A. Shemonaev, A. Anikin, K. Epifantsev, P. Skorobogatov","doi":"10.1109/MWENT55238.2022.9802266","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802266","url":null,"abstract":"This paper describes the results of sensitivity test to latch-up of several types of ICs (SRAM, EEPROM memory, ADC, microcontroller) caused by single and multiple electrical overstresses. It was shown, that electrical strike with a high-repetition rate increases the sensitivity and vulnerability of ICs to latch-up. The article describes some aspects of the test procedure, which may affect on IC’s sensitivity results.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"49 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114124768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Decoding Techniques for a Multi-Tone Multi-Band DHA FH OFDMA with MaxMin Detector","authors":"D. Osipov","doi":"10.1109/MWENT55238.2022.9802296","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802296","url":null,"abstract":"Coded DHA FH OFDMA systems with noncoherent order statics-based reception are promising candidates for future generation machine type communications due to their immunity to drastic multi-user interference, imperfect channel estimation and power control. MaxMin detector is an order statistics-based detector recently proposed for such systems. It has been demonstrated that the MaxMin detector can provide better performance for the same effective rate than any other order statistic-based detector proposed while having lower complexity. In what follows a modified decoding algorithm for a multi-tone coded modulation using MaxMin detector is considered. It is shown that the modified decoding procedure proposed hereinafter provides substantial performance gain at the expense of moderate complexity increase.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116280369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Multi-Source Markovian Model for Video Streaming in Flying Ad hoc Networks","authors":"M. A. Akkad, A. Abilov, M. A. Lamri","doi":"10.1109/MWENT55238.2022.9802277","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802277","url":null,"abstract":"In multi-drone networks, video streaming helps in performing many tasks such as surveillance, inspection, and map generation. In such networks, packet loss frequently occurs due to the high mobility of the nodes and to congestion. Therefore, a model is required in order to investigate and analyze the trade-off between the end-to-end delay, packet dropping probability, and the required number of paths. In this paper, multi-source live-video streaming in Flying Ad Hoc Networks FANETs is analyzed, and a network queue model is suggested. Then, the quality of the paths is estimated, experiments are conducted, and conclusions based on the results are obtained. The network is modelled with an M/M/1 Markovian model to quantify the system’s performance. Transition sequence between good and bad states is taken into account by the proposed model as a packet loss process. The good and bad stationary probability is used, after measuring the Packet Reception Ratio PRR, in order to discriminate the good paths from the weak ones. This multi-source approach increases the network goodput and allows the system to be unlimited by the weakest source node quality.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125717690","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Methodical Approach to the Study of the Radiation Hardness of Transceivers under the Total Dose Effect and Heavy Ions Exposure","authors":"Roman Vaskin, G. Sorokoumov, Vasilina Saprykina","doi":"10.1109/MWENT55238.2022.9802392","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802392","url":null,"abstract":"This article presents a methodological approach to measuring the parameters of the criterion of acceptability for transceivers during a radiation experiment. The article describes the main radiation effects in transceivers when exposed to ionizing radiation from outer space. A classification of failures in transceivers and methods for carrying out functional and parametric control are also presented.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130405139","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. N. Egorov, O. B. Mavritskii, A. Pechenkin, D. V. Savchenkov, Marta S. Kholina
{"title":"Pulsed Laser Single-Event Effect Simulation in AD8400 using Two-Photon Absorption","authors":"A. N. Egorov, O. B. Mavritskii, A. Pechenkin, D. V. Savchenkov, Marta S. Kholina","doi":"10.1109/MWENT55238.2022.9802144","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802144","url":null,"abstract":"The results of laser single-event effect (SEE) simulation in digital potentiometer AD8400, using the two-photon absorption (TPA) of tightly focused femtosecond 1200 nm laser radiation are presented. Comparative measurements obtained by the single-photon absorption (SPA) of picosecond 1064 nm laser radiation in the same device revealed the improved 3D-spatial resolution of TPA compared to SPA-based pulsed laser testing. The effective depth of single event latchup (SEL) sensitive layer estimation was calculated from experimental results.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130026279","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
V. Chumakov, N. Prokopenko, A. Bugakova, I. Pakhomov
{"title":"C-JFET OpAmp on “Folded” Cascode with Compensation Channel for the Systematic Component of the Zero Bias Voltage","authors":"V. Chumakov, N. Prokopenko, A. Bugakova, I. Pakhomov","doi":"10.1109/MWENT55238.2022.9802383","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802383","url":null,"abstract":"The article considers the original operational amplifier (OpAmp) circuits. The OpAmps is made on complementary FETs, which have a control pn-junction (C-JFET) manufactured by JSC “Integral”. The novelty of this OpAmp circuits is the introduction of identical uncontrolled JFET dynamic loads. This circuit technique minimizes the systematic component of the zero bias voltage in a wide temperature range ($-197div 27^{circ}$C) and increases the gain (up to 92 dB) of the OpAmp. Mathematical calculations of the proposed OpAmps are given. The authors of the article recommend the developed C-JFET OpAmps for low-noise, low-temperature and radiation-resistant A/D and analog interfaces (for example, comparators, signal converters, active RC/RLC filters).","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129508099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Karimov, D. Ravshanov, Lolai Husenzoda, Chorshanbe B. Ravshanov
{"title":"The Design of a Crossover that Allows you to Simulate the Operation of Two Intersecting Lines in the Same Plane","authors":"A. Karimov, D. Ravshanov, Lolai Husenzoda, Chorshanbe B. Ravshanov","doi":"10.1109/MWENT55238.2022.9802385","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802385","url":null,"abstract":"Crossover is used where there are intersecting lines that cannot be implemented in the same plane. It is worth noting that such a device takes up more space and in some applications it may be necessary to minimize them. Thus, artificial transmission lines were calculated, after installation of which it was possible to reduce the dimensions by 64.1% compared to its original design operating at a frequency of 1 GHz and implemented on a Rogers substrate. It was possible to achieve minor losses in the characteristics of the crossover. Therefore, the developed design can be recommended for use for solving a large number of tasks.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129835309","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Methods of catastrophic failure prevention during the SEL-sensitivity estimation of IC","authors":"A. Tsirkov","doi":"10.1109/MWENT55238.2022.9802407","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802407","url":null,"abstract":"The suitability of electronics for space application greatly depends on ICs tolerance to single event effects, such as latchup (SEL), caused by heavy ions. Such events can lead to irreversible failures if specific prevention actions are not taken. This paper presents the results of a study of ICs functional (hard) failures prevention method. Important points are presented when configuring the protection scheme.This paper describes the use of a resistor in a power circuit and the developed system of a fast circuit breaker. The research was carried out on picosecond focused laser facility (PICO-4).","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"146 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117010050","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Dmitrii Abrameshin, S. Tumkovskiy, V. Saenko, E. Pozhidaev
{"title":"Engineering Methodology for the Selection of a Composite Polymer Dielectric that Ensures the Absence of Electrostatic Discharges in the Design of the Onboard Electronic Equipment of the Spacecraft","authors":"Dmitrii Abrameshin, S. Tumkovskiy, V. Saenko, E. Pozhidaev","doi":"10.1109/MWENT55238.2022.9802273","DOIUrl":"https://doi.org/10.1109/MWENT55238.2022.9802273","url":null,"abstract":"an engineering technique for selecting a composite polymer dielectric with increased conductivity, ensuring the absence of electrostatic discharges, has been developed for radio electronic devices as part of the onboard equipment of spacecraft. On the basis of the developed methodology, at the stages of preliminary and technical design, calculations of the operability of the developed radioelectronic means are carried out in relation to the invariability of the operating characteristics specified according to the terms of reference, and at the same time there is no electrostatic discharges of the printed circuit board substrate - printed conductor. The method is based on comparison of the conductivity value of the composite dielectric of the printed circuit board of the developed radio-electronic apparatuses, at which its operating parameters are still unchanged, with the criterion conductivity value ensuring the absence of electrostatic discharges –10-9 Ω-1 ·m-1. The method is intended for the developed avionics of space application, operating on board the spacecraft, operated in conditions of intense impact of space plasma.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"13 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120930527","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}