{"title":"集成电路自灵敏度估计中防止灾难性故障的方法","authors":"A. Tsirkov","doi":"10.1109/MWENT55238.2022.9802407","DOIUrl":null,"url":null,"abstract":"The suitability of electronics for space application greatly depends on ICs tolerance to single event effects, such as latchup (SEL), caused by heavy ions. Such events can lead to irreversible failures if specific prevention actions are not taken. This paper presents the results of a study of ICs functional (hard) failures prevention method. Important points are presented when configuring the protection scheme.This paper describes the use of a resistor in a power circuit and the developed system of a fast circuit breaker. The research was carried out on picosecond focused laser facility (PICO-4).","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"146 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Methods of catastrophic failure prevention during the SEL-sensitivity estimation of IC\",\"authors\":\"A. Tsirkov\",\"doi\":\"10.1109/MWENT55238.2022.9802407\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The suitability of electronics for space application greatly depends on ICs tolerance to single event effects, such as latchup (SEL), caused by heavy ions. Such events can lead to irreversible failures if specific prevention actions are not taken. This paper presents the results of a study of ICs functional (hard) failures prevention method. Important points are presented when configuring the protection scheme.This paper describes the use of a resistor in a power circuit and the developed system of a fast circuit breaker. The research was carried out on picosecond focused laser facility (PICO-4).\",\"PeriodicalId\":218866,\"journal\":{\"name\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"volume\":\"146 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWENT55238.2022.9802407\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWENT55238.2022.9802407","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Methods of catastrophic failure prevention during the SEL-sensitivity estimation of IC
The suitability of electronics for space application greatly depends on ICs tolerance to single event effects, such as latchup (SEL), caused by heavy ions. Such events can lead to irreversible failures if specific prevention actions are not taken. This paper presents the results of a study of ICs functional (hard) failures prevention method. Important points are presented when configuring the protection scheme.This paper describes the use of a resistor in a power circuit and the developed system of a fast circuit breaker. The research was carried out on picosecond focused laser facility (PICO-4).
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