{"title":"总剂量效应和重离子照射下收发器辐射硬度的系统研究","authors":"Roman Vaskin, G. Sorokoumov, Vasilina Saprykina","doi":"10.1109/MWENT55238.2022.9802392","DOIUrl":null,"url":null,"abstract":"This article presents a methodological approach to measuring the parameters of the criterion of acceptability for transceivers during a radiation experiment. The article describes the main radiation effects in transceivers when exposed to ionizing radiation from outer space. A classification of failures in transceivers and methods for carrying out functional and parametric control are also presented.","PeriodicalId":218866,"journal":{"name":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"A Methodical Approach to the Study of the Radiation Hardness of Transceivers under the Total Dose Effect and Heavy Ions Exposure\",\"authors\":\"Roman Vaskin, G. Sorokoumov, Vasilina Saprykina\",\"doi\":\"10.1109/MWENT55238.2022.9802392\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents a methodological approach to measuring the parameters of the criterion of acceptability for transceivers during a radiation experiment. The article describes the main radiation effects in transceivers when exposed to ionizing radiation from outer space. A classification of failures in transceivers and methods for carrying out functional and parametric control are also presented.\",\"PeriodicalId\":218866,\"journal\":{\"name\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-06-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWENT55238.2022.9802392\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 Moscow Workshop on Electronic and Networking Technologies (MWENT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWENT55238.2022.9802392","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A Methodical Approach to the Study of the Radiation Hardness of Transceivers under the Total Dose Effect and Heavy Ions Exposure
This article presents a methodological approach to measuring the parameters of the criterion of acceptability for transceivers during a radiation experiment. The article describes the main radiation effects in transceivers when exposed to ionizing radiation from outer space. A classification of failures in transceivers and methods for carrying out functional and parametric control are also presented.
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