Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems最新文献

A logistic regression yield model for SRAM bit fail patterns SRAM位失效模式的逻辑回归良率模型

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595735

R. S. Collica

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引用次数: 9

Functional testing and reconfiguration of MIMD machines MIMD设备的功能测试和重新配置

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595645

C. Aktouf, C. Robach, G. Mazaré, J. Johansson

引用次数: 4

The T9 transputer: A practical example of the application of standard test techniques T9转发器:标准测试技术应用的一个实际例子

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595806

Graham Frearson

引用次数: 0

High level synthesis techniques for efficient built-in-self-repair 高效内置自我修复的高水平合成技术

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595623

L. Guerra, M. Potkonjak, J. Rabaey

引用次数: 26

Device mismatch limitations on performance of a Hamming distance classifier 设备不匹配对汉明距离分类器性能的限制

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595829

N. Kumar, P. Pouliquen, A. Andreou

引用次数: 4

Neural networks for multiple fault diagnosis in analog circuits 神经网络在模拟电路多故障诊断中的应用

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595826

A. Fanni, A. Giua, Enrico Sandoli

引用次数: 13

On the configuration of degradable VLSI/WSI arrays 可降解VLSI/WSI阵列的结构研究

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595639

C. Low, H. Leong

引用次数: 5

Detection of defective media in disks 检测磁盘中的缺陷介质

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595628

H. Kari, Heikki Saikkonen, F. Lombardi

引用次数: 15

Design of self-parity combinational circuits for self-testing and on-line detection 自检验与在线检测的自宇称组合电路设计

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595814

E. Sogomonyan, M. Gössel

引用次数: 10

Topological optimization of PLAs for yield enhancement 提高成品率的聚乳酸拓扑优化

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI: 10.1109/DFTVS.1993.595768

V. Chiluvuri, I. Koren

引用次数: 2