检测磁盘中的缺陷介质

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems Pub Date : 1993-10-27 DOI:10.1109/DFTVS.1993.595628

H. Kari, Heikki Saikkonen, F. Lombardi

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引用次数: 15

摘要

本文提出了一种新的改进方法，用于检测磁盘存储介质劣化引起的磁盘子系统扇区潜在故障。通常，使用不均匀模式访问磁盘中的扇区，导致某些扇区很少被访问。如果在很少访问的扇区出现介质劣化，可能会导致硬盘的潜在故障长时间不被发现。为了发现潜在的扇区故障，需要对硬盘进行周期性扫描。提出了一种利用磁盘空闲时间对符合SCSI-II接口标准的常用磁盘进行扫描的自适应算法。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Detection of defective media in disks

The authors present new improved methods for detecting latent sector faults in a disk subsystem as caused by media deterioration of the disk magnetic storage material. Usually, sectors in a disk are accessed using uneven patterns causing some of the sectors to be accessed only seldom. In case of media deterioration on the rarely accessed sectors, a latent disk fault may remain undetected for a long time. To detect latent sector faults, a disk is scanned through periodically. An adaptive algorithm is proposed to utilize the idle time for the disk for scanning commonly used disks that comply with SCSI-II interface standards.

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来源期刊

Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems

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