{"title":"Functional testing and reconfiguration of MIMD machines","authors":"C. Aktouf, C. Robach, G. Mazaré, J. Johansson","doi":"10.1109/DFTVS.1993.595645","DOIUrl":null,"url":null,"abstract":"The authors present a strategy for testing MIMD parallel machines. First they detail a functional testing methodology. Based on a functional fault model for the communications between processors, the authors propose a distributed diagnosis strategy and the test program generation process. Next, a fault-tolerant routing algorithm is proposed. Taking into account the results obtained from the testing phase, this algorithm allows successful routing of messages between fault-free cells.","PeriodicalId":213798,"journal":{"name":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1993-10-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1993 IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DFTVS.1993.595645","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 4
Abstract
The authors present a strategy for testing MIMD parallel machines. First they detail a functional testing methodology. Based on a functional fault model for the communications between processors, the authors propose a distributed diagnosis strategy and the test program generation process. Next, a fault-tolerant routing algorithm is proposed. Taking into account the results obtained from the testing phase, this algorithm allows successful routing of messages between fault-free cells.