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Design, Automation and Test in Europe最新文献

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Smart systems at ST ST的智能系统
Design, Automation and Test in Europe Pub Date : 2011-03-14 DOI: 10.1109/DATE.2011.5763196
C. Papa
{"title":"Smart systems at ST","authors":"C. Papa","doi":"10.1109/DATE.2011.5763196","DOIUrl":"https://doi.org/10.1109/DATE.2011.5763196","url":null,"abstract":"Summary form only given. The exponential increase of world energy demand, with a forecasted rise of 45% between 2010 and 2030, makes energy management one of the most urgent topics of the century and a key driver for semiconductors and electronics products evolution. The main solutions for world energy demand and global warming issues have been divided in two main streams: an increasing offer from alternative energy sources and their integration into the new Smart Grid and a reduction of the demand through an increase in the efficiency of systems.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"322 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121484369","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Beyond UPF & CPF: Low-power design and verification 超越UPF和CPF:低功耗设计和验证
Design, Automation and Test in Europe Pub Date : 2011-03-14 DOI: 10.1109/DATE.2011.5763051
B. Pangrle, J. Biggs, Cristophe Clavel, O. Domerego, K. M. Just
{"title":"Beyond UPF & CPF: Low-power design and verification","authors":"B. Pangrle, J. Biggs, Cristophe Clavel, O. Domerego, K. M. Just","doi":"10.1109/DATE.2011.5763051","DOIUrl":"https://doi.org/10.1109/DATE.2011.5763051","url":null,"abstract":"Two formats for specifying power intent are currently in wide use in the industry today and as designers continue to strive for more power efficient designs new issues arise that need new solutions to improve on today's standards. This panel will discuss areas for improving today's power formats and the direction that these formats need to move, in order to provide the most efficient flows for design and verification and especially with regards to low-power. The scope of the formats and their suitability from early ESL design exploration to back-end signoff checking will also be discussed.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126268509","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Panel and embedded tutorial - Logic synthesis and place and route: After 20 years of engagement, wedding in view? 面板和嵌入式教程-逻辑合成与位置和路线:订婚20年后，婚礼在即?
Design, Automation and Test in Europe Pub Date : 2011-03-14 DOI: 10.1109/DATE.2011.5763016
M. Casale-Rossi, A. Domic
{"title":"Panel and embedded tutorial - Logic synthesis and place and route: After 20 years of engagement, wedding in view?","authors":"M. Casale-Rossi, A. Domic","doi":"10.1109/DATE.2011.5763016","DOIUrl":"https://doi.org/10.1109/DATE.2011.5763016","url":null,"abstract":"The first half of the 80's marked a fundamental milestone in the history of design implementation: an amazing number of key research papers were published, in a relatively short period of time; suddenly, logic synthesis, placement, and routing algorithms reached a maturity level which enabled the birth of the first wave of modern EDA companies and design implementation tools: Silvar-Lisco, Cadence, Synopsys, Tangent…","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132781861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Smart devices panel session - Integrating the real world interfaces 智能设备小组会议-集成现实世界的接口
Design, Automation and Test in Europe Pub Date : 2011-03-01 DOI: 10.1109/DATE.2011.5763147
A. Jerraya, J. Goodacre
{"title":"Smart devices panel session - Integrating the real world interfaces","authors":"A. Jerraya, J. Goodacre","doi":"10.1109/DATE.2011.5763147","DOIUrl":"https://doi.org/10.1109/DATE.2011.5763147","url":null,"abstract":"Smart systems require intefacing more of the world in an integrated solution (Camera, gyroscope, compass, temp, direction, ….). This is imposed by social evolution and enabled by new integration technologies. So far, many products featuring a variety of hardware and software have been developed and many more seems to be coming in a fast growing market. The panel will present the most promising products and solutions and discuss the innovations enabling future smart systems.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122170004","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Wireless communication: successful differentiation on standard technology by innovation 无线通信:通过创新成功实现标准技术的差异化
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457245
Herman Eul
{"title":"Wireless communication: successful differentiation on standard technology by innovation","authors":"Herman Eul","doi":"10.1109/DATE.2010.5457245","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457245","url":null,"abstract":"The rise of the wireless internet is the megatrend in communication industry. Mobile communication devices will be the dominant platform for information access, gaming, music and spending time with distant friends. About 5 bn or three quarters of the world population is using mobile phones. Internet enabled mobile phones at affordable cost will be the most common internet access device in the near future. At the high end powerful and versatile smartphones need faster and more energy efficient semiconductors.\u0000 The presentation will start with a brief summary of the paradigm shifts in the \"mobile world\" from voice calls to data transmission and the current situation in the renascent mobile ecosystem. The entry of powerful internet and consumer brands and now even luxury designer brands into the mobile handset arena mark the start of a new era changing the dynamics in this field.\u0000 Today, fabless or fab-lite business models are common in the wireless semiconductor value chain. In this model vendors differentiate through services, architectures, design but also their capability to extract maximum product benefits in density, power consumption, performance, functionality and robustness/yield from a standard CMOS process. In the highly competitive mobile phone market growth and profit depends on differentiation by innovation. This requires technology know-how being effectively transferred into the design system and application specific device structures to create optimized circuits.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133244238","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Are we there yet? Has IP block assembly become as easy as LEGO? 我们到了吗?IP积木组装是否变得像乐高一样简单?
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457226
Bryon Moyer, J. Kunkel, J. Cornish, C. Rowen, Eshel Haritan, Y. Tanurhan
{"title":"Are we there yet? Has IP block assembly become as easy as LEGO?","authors":"Bryon Moyer, J. Kunkel, J. Cornish, C. Rowen, Eshel Haritan, Y. Tanurhan","doi":"10.1109/DATE.2010.5457226","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457226","url":null,"abstract":"With the majority of chip real estate being filled with re-used IP blocks, the process of block assembly has significantly grown in importance. Marketing literature seems to suggest that assembling a chip from IP is as easy as browsing a library of blocks, assembling them in a block diagram and then pushing a button.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"224 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116347174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Who is closing the embedded software design gap? 谁在缩小嵌入式软件设计的差距?
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5456918
W. Ecker, P. Bricaud, R. Dömer, Y. Veller, S. Heinen, J. Mössinger, A. V. Schwerin
{"title":"Who is closing the embedded software design gap?","authors":"W. Ecker, P. Bricaud, R. Dömer, Y. Veller, S. Heinen, J. Mössinger, A. V. Schwerin","doi":"10.1109/DATE.2010.5456918","DOIUrl":"https://doi.org/10.1109/DATE.2010.5456918","url":null,"abstract":"As pointed out in the ITRS roadmap, the level of embedded software complexity is greater than the pure HW complexity of SoCs when comparing, for example, lines of HDL and C code. Even worse, SW complexity grows faster than HW complexity (Moore's Law) and SW productivity increases more slowly than HW productivity. A new design gap - the gap of embedded software -- as appeared.\u0000 EDA has now identified ESL as a field with sufficient revenue and revenue growth, but do they really approach the SW productivity challenge?\u0000 This panel gives the answer by presenting recent EDS products and solutions in the area of ESW, contrasting them with needs of industry, and discussing ways out of the ESL productivity crisis.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133346830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Panel: Reliability of data centers: Hardware vs. software 专题讨论:数据中心的可靠性:硬件vs.软件
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457069
M. Tahoori, I. Parulkar, D. Alexandrescu, K. Granlund, A. Silburt, B. Vinnakota
{"title":"Panel: Reliability of data centers: Hardware vs. software","authors":"M. Tahoori, I. Parulkar, D. Alexandrescu, K. Granlund, A. Silburt, B. Vinnakota","doi":"10.1109/DATE.2010.5457069","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457069","url":null,"abstract":"In today's life, data centers are integral part of daily life. From web search to online banking, online shopping to medical records, we rely on data centers for almost everything. Malfunctions in the operation of such data centers have become an inseparable part of our daily lives as well. Major malfunction causes include hardware and software failures, design errors, malicious attacks and incorrect human interactions. The consequences of such malfunctions are enormous: loss of human life, financial loss, fraud, wastage of time and energy, loss of productivity, and frustrations with computing. Therefore, reliability of these systems plays a critical role in all aspects of our day to day life.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"97 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132365069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Nanoelectronics challenges for the 21st century 二十一世纪纳米电子学的挑战
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457026
D. Antoniadis
{"title":"Nanoelectronics challenges for the 21st century","authors":"D. Antoniadis","doi":"10.1109/DATE.2010.5457026","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457026","url":null,"abstract":"Leading edge CMOS technologies today are unique examples of nanoscale engineering at an industrial scale. As we celebrate this remarkable achievement of our industry that forms the ever-expanding technology basis of modern society we cannot help but ponder the question of how we can continue to push the envelope of nano-electronics. With the end of Si FET scaling appearing increasingly near, searching for more scalable transistor structures in Si and in \"beyond-Si\" solutions has become imperative; from relatively \"easy\" transitions to non-planar Si structures, to the incorporation of high mobility semiconductors, like Ge and III-V's, to even higher mobility new materials such as carbon nanotubes, graphene, or other molecular structures. And even further, there are searches for new information representation and processing concepts beyond charge in FETs, as for example, in spin-state devices. Of course, declaring silicon dead is premature at best, and with this in mind I will discuss the challenges and possible scenaria for the introduction of novel nano-electronic devices.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122082643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Embedded software testing: what kind of problem is this? 嵌入式软件测试:这是什么样的问题?
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457046
É. Cota
{"title":"Embedded software testing: what kind of problem is this?","authors":"É. Cota","doi":"10.1109/DATE.2010.5457046","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457046","url":null,"abstract":"This panel proposes a discussion on the role and challenges of embedded software testing. Invited speakers represent different industrial and academic points of view on this topic. Specifically, the panelists were invited to discuss what exactly defines the test of an embedded software, what is the role of the platform designer and of the software designer with respect to test, how embedded software testing really differs from traditional software testing, and whether current solutions and tools are sufficient for this task.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131478768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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