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Design, Automation and Test in Europe最新文献

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All things are connected 所有事物都是相互联系的
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457248
A. Sangiovanni-Vincentelli
{"title":"All things are connected","authors":"A. Sangiovanni-Vincentelli","doi":"10.1109/DATE.2010.5457248","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457248","url":null,"abstract":"Design of complex system is essentially about connections: Connection of concepts, connection of objects, connection of teams. And products of the future will be connected seamlessly across physical and virtual domains. Connections can produce systems that offer more than the sum of the components but they can also yield to systems that are less powerful than the sum of the components or that are so compromised by their interactions that they do not work at all.\u0000 Collaboration is the name of the game for design, for production, for operation of multi-scale systems.\u0000 There is increasingly less distance between design and operation of systems. An efficient management of interactions among deployed parts of a larger system requires principles that are common to the design methods developed at the bleeding edge of technology. I will examine the evolution of design principles and of multiscale systems and the challenges we are facing today. I will point to a number of exciting fields where advances are constantly made towards the mastering of connections.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114761851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The road to energy-efficient systems: from hardware-driven to software-defined 节能系统之路:从硬件驱动到软件定义
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457157
G. Fettweis
{"title":"The road to energy-efficient systems: from hardware-driven to software-defined","authors":"G. Fettweis","doi":"10.1109/DATE.2010.5457157","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457157","url":null,"abstract":"Innovations in micro and nano technology form the basis of modern ICT. However, the steady growth in the ICT sector has meanwhile a significant ecological footprint: 2% of global CO2 emissions are due to ICT systems already today - one fourth of the emissions caused by cars. The energy costs for running ICT infrastructure have turned into a significant economical factor. The most urgent challenge in the area of micro and nanotechnology is therefore to massively increase energy efficiency, in particular for ICT as a key sector for economic growth. Significant improvements in this area can only be achieved through disruptive innovations and new system approaches, which rely on a combination of excellent research & development and world leading know-how of semiconductor production.\u0000 But will hardware be the driver to fulfill these requirements and software has to adapt to whatever hardware concepts are developed? Or should the ability to program systems energy-efficiently define the design of the hardware architecture? This session will present the different perspectives on the problem and try to bring both sides together.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120924500","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Panel: First commandment at least, do nothing well! 小组:至少第一条戒律，什么都不要做好!
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457027
M. Casale-Rossi, G. Micheli, A. Domic, E. Macii, P. Perlo, Andreas Wild, R. Zafalon
{"title":"Panel: First commandment at least, do nothing well!","authors":"M. Casale-Rossi, G. Micheli, A. Domic, E. Macii, P. Perlo, Andreas Wild, R. Zafalon","doi":"10.1109/DATE.2010.5457027","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457027","url":null,"abstract":"In a recent keynote speech [1], UCB Prof. Randy Katz defined power as the 21st century's most limited, as well as most wasted resource: not only we seem to be unable to generate “greener” power but, at all levels, we seem to be really poor even in making an efficient use of our precious power. We waste while doing things, as well as while doing nothing! “Electronics is sized for peak power consumption, and designed for continuous activity.”","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114864272","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Great challenges in nanoelectronics and impact on academic research: more than Moore or beyond CMOS? 纳米电子学的巨大挑战及其对学术研究的影响:超越摩尔还是超越CMOS?
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5457084
R. D. Keersmaeker, M. Roukes, D. Antoinadis, H. Man, G. Bourianoff, M. Brillouët, L. Samuelson
{"title":"Great challenges in nanoelectronics and impact on academic research: more than Moore or beyond CMOS?","authors":"R. D. Keersmaeker, M. Roukes, D. Antoinadis, H. Man, G. Bourianoff, M. Brillouët, L. Samuelson","doi":"10.1109/DATE.2010.5457084","DOIUrl":"https://doi.org/10.1109/DATE.2010.5457084","url":null,"abstract":"This panel session will address the post-CMOS research great challenges and opportunities corresponding to the More Than Moore and Beyond CMOS domains. The opening talk of the panel will set the ground for discussion with some key examples placed at the intersection of the two domains. Especially the role of functional diversification and of new research and application drivers, different from scaling, will be critically discussed by a team of high-level experts in the field. Moreover, the impact of post-CMOS era on the way the academic research and the education of engineering are conceived today and should be adapted in the future will be the center of the debate.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130065414","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The challenges of heterogeneous multi-core debug 异构多核调试的挑战
Design, Automation and Test in Europe Pub Date : 2010-03-08 DOI: 10.1109/DATE.2010.5456944
G. Martin, A. Mayer
{"title":"The challenges of heterogeneous multi-core debug","authors":"G. Martin, A. Mayer","doi":"10.1109/DATE.2010.5456944","DOIUrl":"https://doi.org/10.1109/DATE.2010.5456944","url":null,"abstract":"We have seen the practical use of multi-processors in complex SoCs and systems grow in the past several years, and the discussion range from architectures through to programming models. One of the issues that poses several challenges to design and verification teams is that of multi-core debug, especially in heterogeneous systems where the processors may be from different vendors, and even when from the same vendor, may be very application-specific. In this panel, designers and researchers who have practical experience with heterogeneous multiprocessor systems, both commercial and research, will draw on those experiences.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-03-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134551440","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Embedded tutorial - Understanding multicore technologies 嵌入式教程-了解多核技术
Design, Automation and Test in Europe Pub Date : 2009-04-20 DOI: 10.1109/DATE.2009.5090819
A. Jerraya, G. Nicolescu
{"title":"Embedded tutorial - Understanding multicore technologies","authors":"A. Jerraya, G. Nicolescu","doi":"10.1109/DATE.2009.5090819","DOIUrl":"https://doi.org/10.1109/DATE.2009.5090819","url":null,"abstract":"Multicore SoCs integrate an increasing number of heterogeneous programmable units and sophisticated communication interconnects. Unlike classic computers, the design of SoC includes the building of application specific architecture and specific interconnect and other hardware components required to execute the software for a well defined class of applications. In this case, the programming model hides both hardware and software interfaces that may include sophisticated communication and synchronisation concepts to handle parallel programs running on the processors. This embedded tutorial introduces the key technologies for the design of such complex devices.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"227 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114967772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Formal approaches to analog circuit verification 模拟电路验证的正式方法
Design, Automation and Test in Europe Pub Date : 2009-04-20 DOI: 10.1109/DATE.2009.5090759
E. Barke, D. Grabowski, H. Graeb, L. Hedrich, S. Heinen, Ralf Popp, S. Steinhorst, Yifan Wang
{"title":"Formal approaches to analog circuit verification","authors":"E. Barke, D. Grabowski, H. Graeb, L. Hedrich, S. Heinen, Ralf Popp, S. Steinhorst, Yifan Wang","doi":"10.1109/DATE.2009.5090759","DOIUrl":"https://doi.org/10.1109/DATE.2009.5090759","url":null,"abstract":"For a speed-up of analog design cycles to keep up with the continuously decreasing time to market, iterative design refinement and redesigns are more than ever regarded as showstoppers. To deal with this issue, referred to as design and verification gap, the development of a continuous and consistent verification is mandatory. In digital design, formal verification methods are considered as a key technology for efficient design flows. However, industrial availability of formal methods for analog circuit verification is still negligible despite a growing need. In recent years, research institutions have made considerable advances in the area of formal verification of analog circuits. This paper presents a selection of four recent approaches in analog verification that cover a broad scope of verification philosophies.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121934183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Programming MPSoC platforms: road works ahead! 编程MPSoC平台:前方道路工程!
Design, Automation and Test in Europe Pub Date : 2009-04-20 DOI: 10.1109/DATE.2009.5090917
R. Leupers, A. Vajda, M. Bekooij, S. Ha, R. Dömer, A. Nohl
{"title":"Programming MPSoC platforms: road works ahead!","authors":"R. Leupers, A. Vajda, M. Bekooij, S. Ha, R. Dömer, A. Nohl","doi":"10.1109/DATE.2009.5090917","DOIUrl":"https://doi.org/10.1109/DATE.2009.5090917","url":null,"abstract":"This paper summarizes a special session on multi-core/multi-processor system-on-chip (MPSoC) programming challenges. The current trend towards MPSoC platforms in most computing domains does not only mean a radical change in computer architecture. Even more important from a SW developer's viewpoint, at the same time the classical sequential von Neumann programming model needs to be overcome. Efficient utilization of the MPSoC HW resources demands for radically new models and corresponding SW development tools, capable of exploiting the available parallelism and guaranteeing bug-free parallel SW. While several standards are established in the high-performance computing domain (e.g. OpenMP), it is clear that more innovations are required for successful deployment of heterogeneous embedded MPSoC. On the other hand, at least for coming years, the freedom for disruptive programming technologies is limited by the huge amount of certified sequential code that demands for a more pragmatic, gradual tool and code replacement strategy.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129964735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Has anything changed in electronic design since 1983? 自1983年以来，电子设计有什么变化吗?
Design, Automation and Test in Europe Pub Date : 2009-04-20 DOI: 10.1109/DATE.2009.5090622
M. Muller
{"title":"Has anything changed in electronic design since 1983?","authors":"M. Muller","doi":"10.1109/DATE.2009.5090622","DOIUrl":"https://doi.org/10.1109/DATE.2009.5090622","url":null,"abstract":"In this talk Mike answers the question, has anything changed in electronic design since 1983. That was the year in which work began on the design of the first ARM micro processor chip set for a home computer. Leading edge semiconductor manufacturing was at 3000 nanometers (nm) and COBOL was the world's most popular programming language. 25 years later has system design really changed that much when today's Hi-Fi remote control has the same architecture as the original home computers? Is designing for a 32 nm process any different? Does programming in Java and JavaScript change anything? Recent changes in the power/performance scaling of semiconductor processes and the increase in variability fundamentally challenges the design assumption we have been comfortable with for so many years and requires new approaches to system architecture, micro architecture and device architecture. Changing consumer expectations also require product manufactures to increasingly provide services to complete their offerings dramatically changing the importance that software plays in the design process.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116925423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Panel Session - Vertical integration versus disaggregation 小组讨论:垂直整合与拆分
Design, Automation and Test in Europe Pub Date : 2009-04-20 DOI: 10.1109/DATE.2009.5090737
Y. Zorian
{"title":"Panel Session - Vertical integration versus disaggregation","authors":"Y. Zorian","doi":"10.1109/DATE.2009.5090737","DOIUrl":"https://doi.org/10.1109/DATE.2009.5090737","url":null,"abstract":"As the complexity of SoC design and manufacturing continues to grow, would it be better to have specialised companies optimising their corresponding segments of the SoC development ecosystem or we rather have vertically integrated companies that include all necessary specialties under a single roof.","PeriodicalId":205976,"journal":{"name":"Design, Automation and Test in Europe","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-04-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123974281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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