2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS)最新文献_第3页

Ultra low-power MEMS based radios for the IoT 物联网超低功耗MEMS无线电

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841173

R. Thirunarayanan, A. Heragu, D. Ruffieux, C. Enz

引用次数: 0

High-performance bivariate numeric function approximation for hardware-efficient QR-decomposition 硬件高效qr分解的高性能二元数值函数近似

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841181

Jochen Rust, Benjamin Knoop, S. Paul

引用次数: 0

Maximizing the fundamental period of a dithered digital delta-sigma modulator with constant input 使恒定输入的抖动数字δ - σ调制器基频周期最大化

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841241

Hongjia Mo, Xiao Tan, Michael Peter Kennedy

引用次数: 0

Broadly tunable frequency division duplex transceiver: Theory and operation 宽可调谐频分双工收发机:理论与操作

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841295

Hazal Yüksel, D. Yang, Zachariah Boynton, Emory Enroth, Thomas Tapen, A. Molnar, A. Apsel

引用次数: 1

Device matching measurements in 28nm technology for high energy physics experiments 28nm高能物理实验器件匹配测量

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841120

M. Elkhayat, Stefano Mangiarotti, C. D. Berti, M. Grassi, P. Malcovati, D. Albano, A. Baschirotto

{"title":"Device matching measurements in 28nm technology for high energy physics experiments","authors":"M. Elkhayat, Stefano Mangiarotti, C. D. Berti, M. Grassi, P. Malcovati, D. Albano, A. Baschirotto","doi":"10.1109/ICECS.2016.7841120","DOIUrl":"https://doi.org/10.1109/ICECS.2016.7841120","url":null,"abstract":"This work lies within SCALTECH28 project, whose main purpose is to investigate the performance of the 28nm technology in terms of signal processing quality, power consumption, and radiation hardness for applications in instrumentation electronics for particle physics with respect to previous technological generations. An additional target is to experimentally evaluate radiation damage effects on single devices and on full circuits to develop rad-models for simulations. A test chip including elementary device arrays and dedicated read-out circuits has been developed and fully characterized. In particular, a capacitance to frequency converter has been integrated to measure the matching between different capacitors of a programmable array. Experimental results show that matching performance is comparable to previous technologies, making the 28nm technology eligible for analog signal processing in front-end circuits for physical experiments and related data converters. Samples have been sent to irradiation facility for high energy experiments compliance verification.","PeriodicalId":205556,"journal":{"name":"2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134205641","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Improved winner-take-all circuit for neural network based on frequency-modulated signals 基于调频信号的神经网络赢家通吃电路的改进

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841138

H. Hikawa

引用次数: 5

Investigating the efficiency and accuracy of a data type reduction technique for soft error analysis 研究一种用于软误差分析的数据类型缩减技术的效率和准确性

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841185

Ghaith Kazma, Ghaith Bany Hamad, O. Mohamed, Y. Savaria

{"title":"Investigating the efficiency and accuracy of a data type reduction technique for soft error analysis","authors":"Ghaith Kazma, Ghaith Bany Hamad, O. Mohamed, Y. Savaria","doi":"10.1109/ICECS.2016.7841185","DOIUrl":"https://doi.org/10.1109/ICECS.2016.7841185","url":null,"abstract":"The progressive scaling of semiconductor technologies has led to significant performance improvements in digital designs. However, ultra-deep sub-micron technologies have increased the vulnerability of VLSI designs to soft errors. It is crucial to analyze this vulnerability early in the design process. In this paper we propose a new technique to model, analyze and estimate the propagation of Single Event Upsets (SEUs) in combinational designs at the Register Transfer Level (RTL) using Satisfiability Modulo Theories (SMT). The propagation of SEUs through RTL bit-vector constructs is modeled as a Satisfiability problem using the SMT theory of bit-vectors. Two different analysis techniques, concrete and abstract modeling, are used in order to investigate the efficiency and accuracy of a data type reduction technique for soft error analysis. Concrete modeling uses two versions of the design, one faulty and one fault-free, in order to analyze SEU propagation. Abstract modeling uses data type reduction to evaluate the difference in performance and accuracy over the first method. Experimental results demonstrate that the loss in accuracy due to abstract modeling depends on the design behavior. For example, for some circuits, the loss in accuracy was arround 73%, while for other circuits it was as low as 0.03%. However, abstract modeling allows reducing processing time significantly and an average reduction factor of 3.88 is reported.","PeriodicalId":205556,"journal":{"name":"2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134280024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

A new compact wireless power transfer system using C-shaped printed resonators 使用c形印刷谐振器的新型紧凑型无线电力传输系统

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841197

Ramy Sharaf, Sherif Hekal, A. A. El-Hameed, A. A. El-Rahman, R. Pokharel

引用次数: 8

A 6-bit, two-step, successive approximation logarithmic ADC for biomedical applications 用于生物医学应用的6位，两步，连续逼近对数ADC

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841123

Y. Sundarasaradula, T. Constandinou, A. Thanachayanont

引用次数: 8

Local congestion and blockage aware routability analysis using adaptive flexible modeling 基于自适应柔性建模的局部拥塞和阻塞感知可达性分析

2016 IEEE International Conference on Electronics, Circuits and Systems (ICECS) Pub Date : 2016-12-01 DOI: 10.1109/ICECS.2016.7841230

A. Ivanov, P. Hallschmid, Zhonghua Zhou

引用次数: 1