Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)最新文献

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Full system power delivery analysis for single ended interface 单端接口全系统功率输出分析
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643577
H. Shu, B. E. Cheah, J. Kong, S. G. Pang, Li Chuang Quek
{"title":"Full system power delivery analysis for single ended interface","authors":"H. Shu, B. E. Cheah, J. Kong, S. G. Pang, Li Chuang Quek","doi":"10.1109/ASQED.2013.6643577","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643577","url":null,"abstract":"The conventional power delivery analysis applying Icc(t) approach has the propensity to yield pessimistic outcome that leads to power delivery network (PDN) over-design. In addition, the noise profile captured using Icc(t) approach has high prospect of miscorrelation with the lab measurement data. Recent works adopting the signal integrity and power delivery (SIPD) co-simulation approach was found fruitful to produce better results compare to the conventional Icc(t) approach. However, the SIPD co-simulation approach is still unable to address the miscorrelation between the simulation and validation results based on time domain analysis. In this paper, the limitations of the Icc(t) based methodology and several important simulation assumptions that are critical to further improve the simulation accuracy are discussed. Key parameters that pose significant impacts to power delivery noise behavior are characterized through this evaluation. The impact of the power delivery noise to overall signaling perfomance is also discussed in this paper for future design references.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123061257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Cluster-based thermal-aware 3D-floorplanning technique with post-floorplan TTSV insertion at via-channels 基于集群的热感知3d地板规划技术,通过通道插入TTSV
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643588
Chia-chen Wen, Ying-Jung Chen, S. Ruan
{"title":"Cluster-based thermal-aware 3D-floorplanning technique with post-floorplan TTSV insertion at via-channels","authors":"Chia-chen Wen, Ying-Jung Chen, S. Ruan","doi":"10.1109/ASQED.2013.6643588","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643588","url":null,"abstract":"In 3D-IC architecture, thermal issues largely affect design reliability. The three-dimensional structure impedes heat dissipation and leads to high temperature when designs in execution. In this paper, we propose a cluster-based 3D-floorplanning approach to place modules based on the factors of area, wire-length, and power density. Then we construct a precise thermal conduction model to compute temperature distribution in terms of the resultant floorplan. The thermal-vias will be placed at some reserved regions, called via-channels, by analytical computation based on temperature distribution. The thermal-via insertion procedure will repeat until the peak temperature is acceptable. The experimental results show that our framework is able to effectively reduce the peak temperature in hot-spots based on a precise temperature computation model.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"166 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127201063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A new TSV set architecture for high reliability 一种新的TSV集架构,具有高可靠性
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643574
Jaeseok Park, Sungho Kang
{"title":"A new TSV set architecture for high reliability","authors":"Jaeseok Park, Sungho Kang","doi":"10.1109/ASQED.2013.6643574","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643574","url":null,"abstract":"Recently, 3D IC design is a very attracting issue, and the importance of system reliability increases. This paper proposes a new reliable and repairable TSV set architecture. The proposed architecture supports the previous TSV repair scheme using TSV redundancies and provides a defect/error detection function reutilizing residual TSV redundancies for high reliability of 3D ICs. This can be applied to both online test and soft error detection/analysis. The results show that the proposed TSV set architecture guarantees high TSV redundancy efficiency and reliability. And, the results show that the proposed TSV architecture achieves defect/error coverages which are steady and predictable by a simple formula.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123714598","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A possibility of crystalline Indium-Gallium-Zinc-Oxide 铟镓锌氧化物结晶的可能性
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643553
S. Yamazaki
{"title":"A possibility of crystalline Indium-Gallium-Zinc-Oxide","authors":"S. Yamazaki","doi":"10.1109/ASQED.2013.6643553","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643553","url":null,"abstract":"Crystalline IGZO thin films were first used in consumer products successfully by a joint development with Sharp Corporation. The crystalline IGZO thin films have a CAAC (C-axis Aligned Crystal) structure, a novel crystalline structure without clear grain boundaries. We examined the mechanism of formation of the structure on a given surface and fabricated TFTs using CAAC-IGZO. We examined their characteristics and found that the TFTs had little variation in characteristic and high reliability even with a short channel length L. Application of CAAC-IGZO to various LSIs is expected.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117080154","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
The effects of elliptical gate cross section on carbon nanotube gate-all-around field effect transistor 椭圆栅极截面对碳纳米管栅极-全能场效应晶体管的影响
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643599
Hao Wang, Sheng Chang, Cheng Wang, Yue Hu, Hongyu He, Jin He, Qingxing He, Caixia Du, Shengju Zhong
{"title":"The effects of elliptical gate cross section on carbon nanotube gate-all-around field effect transistor","authors":"Hao Wang, Sheng Chang, Cheng Wang, Yue Hu, Hongyu He, Jin He, Qingxing He, Caixia Du, Shengju Zhong","doi":"10.1109/ASQED.2013.6643599","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643599","url":null,"abstract":"In this paper, the gate-all-around carbon nanotube field effect transistor (FET) with elliptical shaped gate is studied with numerical simulation to explore the gate dielectric variation effects. The simulations are carried out with the three dimensional self-consistence Poisson-Schrodinger equations with the non-equilibrium Green's function method. The on current, potential distribution, local density of states, and transmission coefficients of the devices of different geometry are examined. The performances of elliptical shaped gate device are compared to the round shaped gate ones and it is observed that the geometry has notable effects on the characteristics of the devices.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124646887","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Heterogeneous stacking of 3D MPSoC architecture: Physical implementation analysis and performance evaluation 三维MPSoC架构的异构堆叠:物理实现分析和性能评估
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643575
M. H. Jabbar, D. Houzet, O. Hammami
{"title":"Heterogeneous stacking of 3D MPSoC architecture: Physical implementation analysis and performance evaluation","authors":"M. H. Jabbar, D. Houzet, O. Hammami","doi":"10.1109/ASQED.2013.6643575","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643575","url":null,"abstract":"3D integration is one of the feasible technologies for producing advanced computing architecture to support ever-increasing demand of higher performance computing especially in mobile devices. The emerging trend of multiprocessor architecture has made Network on Chip (NoC) architecture the best solution for future manycore architecture devices. In this work, we explore the implementation of heterogeneous 3D Multiprocessor System on Chip (MPSoC) stacking architecture and evaluate its performance in terms of timing and power consumption compared with its 2D counterpart. The proposed heterogeneous 3D MPSoC implementation approach is considered to be the best solution for the time being as there are no 3D-aware EDA tools available in the markets that capable of performing 3D optimization as in 2D EDA tools. We also perform physical implementation analysis on the clock tree structure between 2D and 3D architecture and examine the impact of using 2D EDA tools for designing 3D architecture. The implementation is based on industry-specific Tezzaron 3D IC technology and the evaluation is based on the GDSII results from physical design implementations.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130507831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Improved test methodology for multi-clock domain SoC ATPG testing 改进的测试方法多时钟域SoC ATPG测试
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643560
Ee Mei Ooi, Chin Hai Ang
{"title":"Improved test methodology for multi-clock domain SoC ATPG testing","authors":"Ee Mei Ooi, Chin Hai Ang","doi":"10.1109/ASQED.2013.6643560","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643560","url":null,"abstract":"This paper proposes a test strategy for improving SoC ATPG testing. On-chip clock controller (OCC) is used to yield better at-speed test coverage and pattern generation. In addition, clock gating structure, coupled with virtual clock grouping constraint is implemented to guide stuck-at ATPG generation process. The proposed solution enables fewer ATPG generation iteration which helps to reduce test pattern count and optimize ATPG run time.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123200938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Exploration of 2D EDA tool impact on the 3D MPSoC architectures performance 探索2D EDA工具对3D MPSoC架构性能的影响
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643596
M. H. Jabbar, A. M'zah, O. Hammami, D. Houzet
{"title":"Exploration of 2D EDA tool impact on the 3D MPSoC architectures performance","authors":"M. H. Jabbar, A. M'zah, O. Hammami, D. Houzet","doi":"10.1109/ASQED.2013.6643596","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643596","url":null,"abstract":"The need for higher performance devices to enable more complex applications continues to drive the growth of electronic design especially in the mobile markets. 3D integration is one of the feasible technologies to increase the system's performance and device integration by stacking multiple dies interconnected using through silicon vias (TSV). NoC-based Multiprocessor System on Chip (MPSoC) architecture has become the primary technology to provide higher performance to support more complex applications. In this paper, we perform an exploration and analysis of 2D EDA tool parameters impact on the 3D MPSoC architectures (3D Mesh MPSoC and heterogeneous 3D MPSoC stacking) performance in terms of timing and power characteristics. Exploration results show that the 2D EDA tool parameters have strong impact on the timing performance compared with power consumption. Furthermore, it is also shown that heterogeneous 3D MPSoC architecture has less footprint area, higher speed and less power consumption compared with 3D Mesh MPSoC for the same number of processing elements suggesting that it is a better design approach considering the limitation capability of 2D EDA tools for 3D design.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116203525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A fast transient response synchronous Buck converter with modified ripple-based control (MRBC) technique 基于改进纹波控制(MRBC)技术的快速瞬态响应同步降压变换器
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643556
Yunwu Zhang, Jing Zhu, Weifeng Sun, Y. Yi
{"title":"A fast transient response synchronous Buck converter with modified ripple-based control (MRBC) technique","authors":"Yunwu Zhang, Jing Zhu, Weifeng Sun, Y. Yi","doi":"10.1109/ASQED.2013.6643556","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643556","url":null,"abstract":"A new ripple controlled synchronous Buck converter featuring with improved transient response and low output voltage ripple is presented in this paper. The proposed modified ripple-based control (MRBC) technique adopting a novel ripple generate mechanism realizes the fast response ability by regulating the inductor current and output voltage through separate loops rapidly. In addition, a high-precision current sensor is utilized to form the current loop to improve the regulation accuracy. Meanwhile, the output voltage ripple is minimized by eliminating the requirement of a large ESR (equivalent series resistance) thanks to the introduced current loop. The proposed controller is implemented in a 0.5 μm BCD process of CSMC. Simulation results show that, during a 500 mA load current step change, the controller is able to regulate the output voltage to return to its nominal value within 2.6 μs with less than 50 mV overshoot/undershoot. The output voltage ripple is only 15 mV.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123715055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Ultra-sensitive polymeric sensor platforms for environmental sensing applications 用于环境传感应用的超灵敏聚合物传感器平台
Fifth Asia Symposium on Quality Electronic Design (ASQED 2013) Pub Date : 2013-10-24 DOI: 10.1109/ASQED.2013.6643562
P. Ray, H. N. Raval, V. Rao
{"title":"Ultra-sensitive polymeric sensor platforms for environmental sensing applications","authors":"P. Ray, H. N. Raval, V. Rao","doi":"10.1109/ASQED.2013.6643562","DOIUrl":"https://doi.org/10.1109/ASQED.2013.6643562","url":null,"abstract":"In this article, novel technology-platforms are discussed for possible applications in the field of environmental, security and healthcare sensing using polymeric devices. Carbon nanocomposite based microcantilevers and thin-film transistor embedded microcantilevers are discussed for force sensing applications. It is also demonstrated that exposure of ionizing radiation changes the material properties of organic semiconductors which enables the use of organic thin-film transistors (OTFTs) as ionizing radiation dosimeters. An increase in the work-function has been observed by ultraviolet photoelectron spectroscopy for the copper(II) phthalocyanine (CuPc) thin-film upon exposure to ionizing radiation of γ-rays. Furthermore, CuPc based OTFTs are demonstrated as ionizing radiation dosimeters with a silicon nitride encapsulation layer deposited by Hot-wire CVD.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126150309","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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