{"title":"Improved test methodology for multi-clock domain SoC ATPG testing","authors":"Ee Mei Ooi, Chin Hai Ang","doi":"10.1109/ASQED.2013.6643560","DOIUrl":null,"url":null,"abstract":"This paper proposes a test strategy for improving SoC ATPG testing. On-chip clock controller (OCC) is used to yield better at-speed test coverage and pattern generation. In addition, clock gating structure, coupled with virtual clock grouping constraint is implemented to guide stuck-at ATPG generation process. The proposed solution enables fewer ATPG generation iteration which helps to reduce test pattern count and optimize ATPG run time.","PeriodicalId":198881,"journal":{"name":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifth Asia Symposium on Quality Electronic Design (ASQED 2013)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASQED.2013.6643560","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper proposes a test strategy for improving SoC ATPG testing. On-chip clock controller (OCC) is used to yield better at-speed test coverage and pattern generation. In addition, clock gating structure, coupled with virtual clock grouping constraint is implemented to guide stuck-at ATPG generation process. The proposed solution enables fewer ATPG generation iteration which helps to reduce test pattern count and optimize ATPG run time.