Improved test methodology for multi-clock domain SoC ATPG testing

Ee Mei Ooi, Chin Hai Ang
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引用次数: 1

Abstract

This paper proposes a test strategy for improving SoC ATPG testing. On-chip clock controller (OCC) is used to yield better at-speed test coverage and pattern generation. In addition, clock gating structure, coupled with virtual clock grouping constraint is implemented to guide stuck-at ATPG generation process. The proposed solution enables fewer ATPG generation iteration which helps to reduce test pattern count and optimize ATPG run time.
改进的测试方法多时钟域SoC ATPG测试
本文提出了一种改进SoC ATPG测试的测试策略。使用片上时钟控制器(OCC)可以获得更好的高速测试覆盖率和模式生成。此外,采用时钟门控结构,结合虚拟时钟分组约束来指导卡滞ATPG生成过程。该方案减少了ATPG生成迭代次数,减少了测试模式数,优化了ATPG运行时间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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