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2009 20th International Zurich Symposium on Electromagnetic Compatibility最新文献

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Chip Level Techniques for EMI Reduction in LCD Panels 降低LCD面板电磁干扰的芯片级技术
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783485
Min-woo Kim, Do-wan Kim, Bonhyuck Koo, Yong-bum Kim, O. Choi, N. Kim
{"title":"Chip Level Techniques for EMI Reduction in LCD Panels","authors":"Min-woo Kim, Do-wan Kim, Bonhyuck Koo, Yong-bum Kim, O. Choi, N. Kim","doi":"10.1109/EMCZUR.2009.4783485","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783485","url":null,"abstract":"This paper presents chip level techniques to improve electro-magnetic interference (EMI) characteristics of LCD-TV panels. A timing controller (TCON) uses over-driving algorithms to improve the response time of liquid crystals (LC). Since this algorithm needs previous frame data, external memory such as double data rate synchronous DRAM (DDR SDRAM) is widely used as a frame buffer. A TTL interface between the TCON and memory is used for read and write operations, generating EMI noise. For reduction of this EMI, three methods are described. The first approach is to reduce the driving current of data I/O buffers. The second is to adopt spread spectrum clock generation (SSCG), and the third is to apply a proposed algorithm which minimizes data transitions. EMI measurement of a 32\" LCD-TV panel shows that these approaches are very effective for reduction of EMI, achieving 20dB reduction at 175MHz.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116528856","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Reradiation interference computation model of high voltage transmission line to the shortwave radio direction finding station 高压输电线对短波无线电测向站的辐射干扰计算模型
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783452
Zhang Xiao-wu, Tang Jian, Zhang Huan-guo, Liu Xing-fa
{"title":"Reradiation interference computation model of high voltage transmission line to the shortwave radio direction finding station","authors":"Zhang Xiao-wu, Tang Jian, Zhang Huan-guo, Liu Xing-fa","doi":"10.1109/EMCZUR.2009.4783452","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783452","url":null,"abstract":"Till now there is no mature calculation method to analyze the passive interference of the high voltage transmission line to the radio station nearby. Based on the production mechanism of the reradiation, the paper gives the simplified model of the tower and the transmission line by using equivalent way, which make the simulation for the passive interference to realize .Finally, it verified the model's enough precision by comparing it with the shortwave radio direction finding error experiments data, applicable in designing the protecting distance between the UHV transmission line and the wireless radio station nearby in the future.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115662351","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Lightning-Transmission Line Current Transient TLM Numerical Simulation 雷电传输线电流瞬态TLM数值模拟
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783406
M. A. F. Mattos
{"title":"Lightning-Transmission Line Current Transient TLM Numerical Simulation","authors":"M. A. F. Mattos","doi":"10.1109/EMCZUR.2009.4783406","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783406","url":null,"abstract":"Recently, the lightning strokes to transmission lines are been watched more carefully due to the needs to improve the transmission lines performance and the power quality. The TLM (Transmission-Line-Model) numerical technique is applied to model a distribution line, surge arresters, grounding electrodes impedance time varying, and the connecting leads to ground. Two simulations are shown and compared with measurements.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124773947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Numerical Investigation of the Impact of Dielectric Components on Electromagnetic Field Distributions in the Passenger Compartment of a Vehicle 介电分量对汽车客舱电磁场分布影响的数值研究
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783428
A. Ruddle, Hui Zhang, L. Low, Jonathan Rigelsford, Richard Langley
{"title":"Numerical Investigation of the Impact of Dielectric Components on Electromagnetic Field Distributions in the Passenger Compartment of a Vehicle","authors":"A. Ruddle, Hui Zhang, L. Low, Jonathan Rigelsford, Richard Langley","doi":"10.1109/EMCZUR.2009.4783428","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783428","url":null,"abstract":"Numerical methods have been used to investigate the possible impact of various dielectric components of vehicles on internal electromagnetic field distributions for frequencies up to 2 GHz. The electrical parameters used in the models were derived from measurements on samples obtained from vehicle components. It is found that the dielectrics investigated have a relatively small impact on the internal field populations due to sources located inside the passenger compartment. Under plane wave illumination from the front, however, the dielectric parts dampen the low frequency resonances, while the glass reduces the internal fields for horizontal polarization. Simulations of lossy materials in a vehicle-like cavity indicate that it may be possible to reduce field levels using readily available materials.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124819165","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 15
An Improved Model for Prediction of the Dynamics of Lightning Channel Corona Sheath 雷电通道电晕鞘层动力学预测的改进模型
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783405
G. Masłowski, V. Rakov, J. Cvetic, M. Miki
{"title":"An Improved Model for Prediction of the Dynamics of Lightning Channel Corona Sheath","authors":"G. Masłowski, V. Rakov, J. Cvetic, M. Miki","doi":"10.1109/EMCZUR.2009.4783405","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783405","url":null,"abstract":"We consider dynamics of the lightning-channel corona sheath that is implicitly specified by lumped-current-source lightning return-stroke models. Two slightly different corona models for prediction of charge motion in the corona sheath are proposed. Both models can be viewed as generalizations of the model proposed by Maslowski and Rakov (2006) [2] and are in agreement with measurements of the horizontal (radial) electric field component made in the immediate vicinity of triggered lightning channel.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124000155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 24
Interactions between Vias and the PCB Power-Bus 过孔与PCB电源总线之间的相互作用
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783439
G. Heinrich, S. Dickmann
{"title":"Interactions between Vias and the PCB Power-Bus","authors":"G. Heinrich, S. Dickmann","doi":"10.1109/EMCZUR.2009.4783439","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783439","url":null,"abstract":"In this paper, a method for the investigation of the interactions between a via and a PCB power-bus is described. Starting with an initial via model and two types of de-embedding algorithm, which extract the scattering parameters of the via, the elements of the via model are derived. After that the influence of the via on the power-bus impedance and the interactions between the via and the power-bus are described.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125169016","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The Excitation of Balanced Transmission Line Modes in Bulk Current Injection Measurements 大电流注入测量中平衡传输线模式的激励
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783480
J. Mclean, R. Sutton
{"title":"The Excitation of Balanced Transmission Line Modes in Bulk Current Injection Measurements","authors":"J. Mclean, R. Sutton","doi":"10.1109/EMCZUR.2009.4783480","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783480","url":null,"abstract":"Representative bulk current injection probes are experimentally characterized showing that a significant amount of differential mode current can be excited in a two-wire transmission line, even within the published operating frequency ranges of the probes. The experiment was carried out using a specialized test fixture, which allows precise orientation of the two-wire transmission line with respect to the current probe. It was found that maximum coupling to the balanced transmission line mode occurs when the plane of the primary winding in the probe is parallel to the plane of the two-wire transmission line. The excitation of the balanced mode is tied to an azimuthal variation of the electromagnetic field of the probe. Somewhat unexpectedly, this azimuthal variation has been found to be due at least in part to loss in the magnetic material. This behaviour is qualitatively verified using an electromagnetic simulation in which the dispersion of the ferrite is included.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125271323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Characterization of On-chip Interconnections and Capacitive Coupling Effect on CMOS Operational Amplifier CMOS运算放大器片上互连及电容耦合效应的表征
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783487
Yujeong Shim, J. Pak, A. Kim, Joungho Kim
{"title":"Characterization of On-chip Interconnections and Capacitive Coupling Effect on CMOS Operational Amplifier","authors":"Yujeong Shim, J. Pak, A. Kim, Joungho Kim","doi":"10.1109/EMCZUR.2009.4783487","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783487","url":null,"abstract":"The operational amplifier is one of the most important circuits to compose ADCs, DACs and active filters. Now, there are many papers which deal with noise characters of op amps. Most of them are focused on the input signal noises which flow into circuits without account about noise source. Capacitive coupling is one of the most frequent sources of signal noise. The capacitive coupling is inevitable because of high integration. This paper investigates mechanism of input noises flowing into the op amp and effects of capacitive coupling on the op amp as on-chip interconnection modeling and analytical model of the DC output offset voltage of the OPamp are proposed. Furthermore, the models are verified by experimental measurement.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128249499","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Assessment of Equivalent Noise Source Approach for EMI Simulations of Boost Converter 升压变换器电磁干扰仿真中等效噪声源方法的评估
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783463
V. Tarateeraseth, I. Maio, F. Canavero
{"title":"Assessment of Equivalent Noise Source Approach for EMI Simulations of Boost Converter","authors":"V. Tarateeraseth, I. Maio, F. Canavero","doi":"10.1109/EMCZUR.2009.4783463","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783463","url":null,"abstract":"This paper presents the analytical equations to model the equivalent noise source for conducted EMI simulation in the frequency domain. The continuous conduction mode boost converter is modeled. By means of a test case, it is shown that the equivalent noise source provides a reasonable estimate of the switching waveform and a good estimate of the EMI noise.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"94 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125004493","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
LCL and Common Mode Current at the Outlet Do Not Tell the Common Mode Current Generated at the Remote Unbalanced Element on the Power-line 输出端LCL和共模电流不告诉电源线上远端不平衡元件产生的共模电流
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783375
M. Kitagawa
{"title":"LCL and Common Mode Current at the Outlet Do Not Tell the Common Mode Current Generated at the Remote Unbalanced Element on the Power-line","authors":"M. Kitagawa","doi":"10.1109/EMCZUR.2009.4783375","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783375","url":null,"abstract":"The radiated emission from the power-line communications (PLC) is primarily caused by the common mode (CM) current converted from the differential mode (DM) current at the remote unbalanced elements (RUE) distributed on the power-line. The LCL measured at the outlet (outlet LCL) is often used as a measure of the unbalance despite the negative results. To resolve the issue, we have formulated the transmission line theory of the LCL and the CM current due to the mode conversion at an RUE on the power-line. We have shown that the outlet LCL underestimates the CM current at the RUE due to the CM propagation loss between the outlet and the RUE. We have also shown that the CM current measured at the modem output can be arbitrarily reduced by increasing the CM impedance of the modem without reducing the radiated emission. This is a fatal loophole of the CM current based regulations.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128870036","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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