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2009 20th International Zurich Symposium on Electromagnetic Compatibility最新文献

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Characteristics of EMD source Caused by valves in ±800-kV UHVDC Converter Station ±800kv特高压直流换流站阀源EMD特性研究
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783409
Jie Zhao, Zhanqing Yu, Jinliang He, R. Zeng, H. Rao, Xiaolin Li, Ying Huang
{"title":"Characteristics of EMD source Caused by valves in ±800-kV UHVDC Converter Station","authors":"Jie Zhao, Zhanqing Yu, Jinliang He, R. Zeng, H. Rao, Xiaolin Li, Ying Huang","doi":"10.1109/EMCZUR.2009.4783409","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783409","url":null,"abstract":"The wide-band frequency electro-magnetic (EM) noise is generated during turn-on and turn-off processes of thyristor valves in converter stations. It will be conducted along the primary circuitry, and may interfere with secondary systems by the way of conducted and radiated coupling. The ±800-kV UHVDC transmission project is one of newly developed technique and used barely in the world. The electro-magnetic interference (EMI) problem is one of most important issue that should be studied deeply in the design stage. Transients during turn-on and turn-off processes are introduced. Characteristics of electromagnetic disturbance (EMD) caused by valves are analyzed. Main influence factors on the characteristics of the EMD source such as voltages, currents, operation modes, are described based on calculation results.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133768238","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Study on the Characteristics of S21 and EMI on a Shifted Electromagnetic Band Gap (EBG) Structure 位移电磁带隙(EBG)结构上S21和电磁干扰特性的研究
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783425
S. Nara
{"title":"Study on the Characteristics of S21 and EMI on a Shifted Electromagnetic Band Gap (EBG) Structure","authors":"S. Nara","doi":"10.1109/EMCZUR.2009.4783425","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783425","url":null,"abstract":"AI-EBGs attenuate the through characteristics with broad bands of high frequency. AI-EBGs have structures in which sections of low characteristic impedance and high characteristic impedance are arranged periodically. However, the characteristics of radiated EMI of AI-EBGs are not well known. In this study, the characteristics of S21 and EMI are examined when the patch and the branch sizes are varied while the size of the printed circuit board and the number of patches are kept constant. In addition, the characteristics of S21 and EMI are examined when the dielectric thickness is varied. An AI-EBG structure with a thin dielectric is found to give the optimal S21 and EMI characteristics. Finally, a shifted EBG structure is proposed.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124410223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
EMC-Influences on Digital Broadcasting Services in Vehicular Environments emc对车载环境下数字广播服务的影响
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783427
Niels Koch
{"title":"EMC-Influences on Digital Broadcasting Services in Vehicular Environments","authors":"Niels Koch","doi":"10.1109/EMCZUR.2009.4783427","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783427","url":null,"abstract":"From home entertainment we know a number of digital entertainment sources which we cherish. Especially Digital Broadcasting, such as DAB, DVB, HD-Radio and SDARS just to name a few, are entering the automotive market. Premium car manufacturers are offering DAB, DVB-T as well as HD-Radio and SDARS as digital sound broadcasting for their customers. However, a lot of efforts need to be undertaken to get good performance. This paper deals with answering the often asked question, why digital broadcasting systems in vehicular environments do not perform as good as their theoretical performance should intend. With an excessive measurement campaign with a number of premium car manufacturers in Germany, we found three main arguments; a) the digital modulation becomes week in terms of bit-errors with enhanced data rates b) wideband modulation schemes, such as COFDM for example, are fragile in fading environments, especially reactive on frequency selective fading and c) used coding and modulation techniques can cope with single-frequency and single-event interferences well but not with permanent broadband interference, which are often found in EMC signatures in well-equipped luxury cars.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117077212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Signal Integrity Ensured Through Impedance Characterization of Advanced High-Speed Design 先进高速设计的阻抗特性保证了信号完整性
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783437
A. Amédéo, C. Gautier, F. Costa, Laurent Bernard
{"title":"Signal Integrity Ensured Through Impedance Characterization of Advanced High-Speed Design","authors":"A. Amédéo, C. Gautier, F. Costa, Laurent Bernard","doi":"10.1109/EMCZUR.2009.4783437","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783437","url":null,"abstract":"It is increasingly important to use Controlled Impedance for manufacturing High-Speed and High Density-Interconnect (HDI) Printed Circuit Board (PCB). Furthermore, signal integrity (SI) tools are required to prevent and reduce most of impedance mismatch and crosstalk problems. This paper presents the impedance characterization of PCB traces, created in an industrial context. From the first specifications to Time domain Reflectometer (TDR) measurements in PCB, we describe the differences between calculated impedances in layer stack, coupon and micro-section analysis. Besides, the impact of Net geometry on characteristic impedance is evaluated through both 2D and 3D simulations.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124076637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Modelling Approaches Taking into Account the Vehicle's Environment in the Development of Embedded RF Receivers 嵌入式射频接收机开发中考虑车辆环境的建模方法
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783495
Raed El-Makhour, F. De-Daran, F. Lafon, M. Drissi, E. Fourn
{"title":"Modelling Approaches Taking into Account the Vehicle's Environment in the Development of Embedded RF Receivers","authors":"Raed El-Makhour, F. De-Daran, F. Lafon, M. Drissi, E. Fourn","doi":"10.1109/EMCZUR.2009.4783495","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783495","url":null,"abstract":"Large and complex systems such as vehicles contain different structures and require various modelling methods and calculation due to the difference between components scales. One of the main issues in the automotive EMC (Electromagnetic Compatibility) is that the car is rarely available during the product's development phase, which means that more often, the product must be finalised before even it can be tested in its real environment. This article presents modelling techniques aiming at predicting the real performance of a RF (Radio Frequency) receiver ahead of its installation into a vehicle.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124848055","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Modeling of Frequency Dependent Losses of Transmission Lines with VHDL-AMS in Time Domain 时域VHDL-AMS对传输线频率相关损耗的建模
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783453
Kerstin Siebert, Harald Gunther, S. Frei, W. Mickisch
{"title":"Modeling of Frequency Dependent Losses of Transmission Lines with VHDL-AMS in Time Domain","authors":"Kerstin Siebert, Harald Gunther, S. Frei, W. Mickisch","doi":"10.1109/EMCZUR.2009.4783453","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783453","url":null,"abstract":"A time domain model of a three conductor transmission line considering frequency depended losses, e.g. skin-effect, for the modeling language VHDL-AMS was developed. The calculation features of VHDL-AMS were considered and flexible and efficient approximations for the frequency dependent propagation and admittance functions could be implemented. The model can be used for linear and non-linear time and frequency domain simulations. It forms a basis for EMC extensions that can be implemented using the developed approximation techniques. Modern standardized modeling languages like VHDL-AMS (Very High Speed Integrated Circuit Hardware Description Language - Analog and Mixed Signal) have the important advantage that growing model libraries permit fast creation of complex simulation models. Exchange and extension of models is easily possible. After a short introduction and presentation of the theory used for modeling, application examples are shown. The developed model is compared to measurement results and to a lossless multiconductor transmission line model. The validity of the implemented VHDL-AMS model is proved.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121567820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Worst Case Evaluation of Magnetic Field in the vicinity of Electric Power Substations 变电站附近磁场的最坏情况评估
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783447
Gerhard Braunlich, R. Braunlich
{"title":"Worst Case Evaluation of Magnetic Field in the vicinity of Electric Power Substations","authors":"Gerhard Braunlich, R. Braunlich","doi":"10.1109/EMCZUR.2009.4783447","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783447","url":null,"abstract":"A simple procedure for the evaluation of magnetic field in the vicinity of substations is presented and discussed. The approach is based on the concept that all power installations can be decomposed into conductor loops and characterized by their magnetic dipole moment. A practical example for worst-case values of the magnetic stray flux is enclosed, where the effectiveness of the method is verified with practical measurements at a substation in well defined operation.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122565224","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Measurement of Radiated Electromagnetic field Intensity due to Micro gap discharge as low voltage ESD 微间隙放电对低电压ESD辐射电磁场强度的测量
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783474
K. Kawamata, S. Minegishi, O. Fujiwara
{"title":"Measurement of Radiated Electromagnetic field Intensity due to Micro gap discharge as low voltage ESD","authors":"K. Kawamata, S. Minegishi, O. Fujiwara","doi":"10.1109/EMCZUR.2009.4783474","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783474","url":null,"abstract":"The micro-gap discharge shows very fast transition duration of about 32 ps or less. Besides, breakdown field strength was examined to corroborate the very fast transition durations of about 32ps. Also, a relationship between breakdown field strength and radiated electromagnetic field intensity was examined in experimental study. As a consequence of the experiment using the system, the breakdown field strength was very high of about 80 MV/m in low voltage discharging of below 350V. And so, the average electromagnetic field intensity is proportion to the breakdown field strength in under the maximum electromagnetic field intensity. In addition, maximum radiated EM field intensity shows approximately 3.5Vp-p respectively, the field radiation due to micro gap discharge has the some limit value in the maximum","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126251936","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design of a Test Vehicle for Nanowire Characterization for Signal Integrity Applications 用于信号完整性应用的纳米线特性测试车的设计
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783430
G. Antonini, M. di Clerico, A. Orlandi, E. Palange, V. Ricchiuti, M. Passacantando, S. Santucci
{"title":"Design of a Test Vehicle for Nanowire Characterization for Signal Integrity Applications","authors":"G. Antonini, M. di Clerico, A. Orlandi, E. Palange, V. Ricchiuti, M. Passacantando, S. Santucci","doi":"10.1109/EMCZUR.2009.4783430","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783430","url":null,"abstract":"This paper illustrates the design steps of a printed circuit board used as test vehicles for the measurement of the electrical properties of carbon nanotube's deposit. The board has been built and used for the measurements. The measured data are post-processed in order to extract the required properties of the only nanotubes. An equivalent circuit is extracted for further use in EDA simulators and the IEEE P1597 Standard is used to compare the results.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116725625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Corona Charged Subnanosecond Impulse Generator 电晕带电亚纳秒脉冲发生器
2009 20th International Zurich Symposium on Electromagnetic Compatibility Pub Date : 2009-02-13 DOI: 10.1109/EMCZUR.2009.4783379
N. Mora, F. Vega, F. Roman, N. Peña, F. Rachidi
{"title":"Corona Charged Subnanosecond Impulse Generator","authors":"N. Mora, F. Vega, F. Roman, N. Peña, F. Rachidi","doi":"10.1109/EMCZUR.2009.4783379","DOIUrl":"https://doi.org/10.1109/EMCZUR.2009.4783379","url":null,"abstract":"An impulse generation system based on the floating electrodes corona charging mechanism is presented. Measurement results demonstrate that it is possible to obtain sub nanosecond impulses with this novel charging technique.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131442408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
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