{"title":"Power analysis for two-stage high resolution pipeline SAR ADC","authors":"Kairang Chen, Quoc-Tai Duong, A. Alvandpour","doi":"10.1109/MIXDES.2015.7208570","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208570","url":null,"abstract":"In this paper, we provide a detailed analysis on the power consumption of two-stage pipeline successive approximation analog-to-digital converter (SAR ADC) and also show the relationship between stage resolution and the total power consumption in 65 nm technology. Thereafter, we evaluate the analysis results with designing a 15-bit pipeline SAR ADC in 65 nm technology and also a power comparison between two-stage pipeline SAR ADC and single SAR ADC is analyzed with the parameters from same technology. The finally results demonstrate that for high resolution ADC design, a particular range is obtained, in which the total power consumption of two-stage pipeline SAR ADC is much lower than single SAR ADC.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"106 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116463981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Lung/airway dynamic model using ABM elements and PSPICE","authors":"F. Masana","doi":"10.1109/MIXDES.2015.7208511","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208511","url":null,"abstract":"The aim of the present work is the construction of a nonlinear dynamic model of lung/airway mechanics using generic instead of specific software, in an attempt to offer an open simulation environment. Based on the analogy between pneumatic and electric magnitudes, an electrical equivalent circuit of the lung/airway mechanics is derived. Then, the nonlinear circuit elements are constructed by means of the powerful Analog Behavioral Modeling (ABM) building blocks and the system is solved using PSPICE. Five lumps are defined: two capacitors (elastances) corresponding to lung and collapsible airway segment and three resistors, corresponding to lung, collapsible airway segment and upper airway. The model does not attempt to mimic any particular system by adjusting a given set of parameters but instead to provide a tool to explore the relationship between a given parameter or set of parameters and the system response, in particular for the Forced Vital Capacity (FVC) maneuver.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114453911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of the electrothermal average inductor model for analyses of boost converters","authors":"K. Górecki, J. Zarebski, K. Detka","doi":"10.1109/MIXDES.2015.7208554","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208554","url":null,"abstract":"This paper describes the boost converter analyses using electrothermal average models. The form of electrothermal average models of the diode - transistor switch and the inductor dedicated for SPICE is shown. The usefulness of the presented models to calculate the characteristics of the boost converters is shown on the example of a boost converter containing the inductor with the ferrite core. The obtained results of computations of the electrothermal average model are compared with the results of measurements and computations made by the selected literature models.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128433317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Integration of SBML models for the description of biological system in a lab-on-chip","authors":"A. Rezgui, M. Madec, C. Lallement, J. Haiech","doi":"10.1109/MIXDES.2015.7208504","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208504","url":null,"abstract":"Lab-on-chips (LOCs) are small systems, which integrate, in the same device, several functions involving chemical analysis with bio-processing functionalities typically performed in a laboratory. As a consequence, it is a multi-domain system that can be described and designed with VHDL-AMS, a hardware description language that natively supports electronics, thermics and fluidics. On the other hand, the biological part of the LOC is often modeled and simulated with languages suitable to the field of biology. One of the most commonly used ones is SBML (System Biology Markup Language). To promote the integration of biological parts of the LOCs in the VHDL-AMS environment, we have developed software that automatically generates the VHDL-AMS models from SBML descriptions. The potential of this tool is illustrated in the context of the design of the lab-on-chip suitable for the detection of micro-pollutants in drinking water.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131042367","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Nico Hellwege, N. Heidmann, M. Erstling, D. Peters-Drolshagen, S. Paul
{"title":"An aging-aware transistor sizing tool regarding BTI and HCD degradation modes","authors":"Nico Hellwege, N. Heidmann, M. Erstling, D. Peters-Drolshagen, S. Paul","doi":"10.1109/MIXDES.2015.7208525","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208525","url":null,"abstract":"In this paper we present a tool based approach for an aging-aware design method. Extending the gm/ID sizing method by operating point-dependent degradation caused by BTI and HCD enables an innovative design flow. This design flow considers performance characteristics for a fresh circuit and also those of a degraded circuit at design time. Once the degradation from a single transistor is computed, the GMID-Tool does not need any further SPICE or aging simulation. The impact of the change in design methodology is shown for a typical differential amplifier structure.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"2 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125906141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Fractional fourier transform and its application to engine knock detection","authors":"J. Fiolka","doi":"10.1109/MIXDES.2015.7208593","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208593","url":null,"abstract":"The fractional Fourier transform (FRFT) is a generalization of the well-known Fourier transform. The FRFT depends on an order parameter a and can be interpreted as an a-th power of the ordinary Fourier transform operator. This tool has found widespread applications in areas such as optics, wave propagation analysis, signal and image processing, solving of differential equations, mechanical vibrations analysis, quantum mechanics. The paper focuses on the use of FRFT in an automotive application to estimation of the knock intensity in a spark ignition engine. The obtained results demonstrate that the proposed method provides high accuracy with low computational complexity.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117255162","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Wavelet-based calculation of the transmission coefficient for tunneling events in Tunnel-FETs","authors":"A. Farokhnejad, M. Graef, A. Kloes","doi":"10.1109/MIXDES.2015.7208512","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208512","url":null,"abstract":"Recently, the Tunnel-FET is gaining interest due to its possibility to overcome the 60 mV/dec subthreshold slope limitation of the standard MOSFET. Due to its band-to-band (B2B) tunneling-based current transport mechanism, the requirements for sufficient tunneling models are raising. By taking into account various barrier shapes, tunneling distances and energy levels, the wavelet-based calculation of the transmission coefficient offers the possibility to calculate tunneling events as B2B tunneling at the junctions and gate leakage current in an accurate way. A comparison of the wavelet solution with the exact solution of the Schrödinger equation for rectangular barriers and the Wentzel-Kramers-Brillouin (WKB) approximation for triangular shaped barriers is presented in this paper.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"122 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114371043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A relational database environment for numerical simulation backend storage","authors":"J. Nazdrowicz","doi":"10.1109/MIXDES.2015.7208595","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208595","url":null,"abstract":"Problem of effective data processing in scientific applications is well-known. There are two reasons of that: nonoptimal front-end application code and ineffective system of scientific data management at back-end. This article presents differences between flat file and relational database data storage. It also shows (based on Microsoft SQL Server database engine) benefits and methods of taking advantages of relational database. These include creation scientific workgroup environment for high availability, fault tolerance and optimal scientific data processing with build-in implemented structures and mechanisms. Such solution can be useful in numerical methods programs, also in Finite Element Methods.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114558015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A comparison of methods for time-to-digital conversion based on independent coding lines and multi-edge coding","authors":"Dominik Sondej, R. Szplet","doi":"10.1109/MIXDES.2015.7208519","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208519","url":null,"abstract":"This paper presents the comparison of main properties of two recently developed methods for precise time-to-digital conversion based on time coding respectively in independent coding lines and with the use of multi-edge pattern signal. An essential advantage of these methods consists in capability to overcome the technological limitation of conversion resolution of methods commonly used so far. Both methods were used to design two time counters implemented in the same programmable device. Then the counters were tested in identical measurement conditions and obtained results were compared in the context of main metrological, design, technical and economic parameters.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124150278","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Wladek Grabinski, Daniel Tomaszewski, F. Jazaeri, Anurag Mangla, Jean-Michel Sallese, Maria-Anna Chalkiadaki, Antonios Bazigos, Matthias Bucher
{"title":"FOSS EKV 2.6 parameter extractor","authors":"Wladek Grabinski, Daniel Tomaszewski, F. Jazaeri, Anurag Mangla, Jean-Michel Sallese, Maria-Anna Chalkiadaki, Antonios Bazigos, Matthias Bucher","doi":"10.1109/MIXDES.2015.7208507","DOIUrl":"https://doi.org/10.1109/MIXDES.2015.7208507","url":null,"abstract":"The design of advanced integrated circuits (IC) in particular for low power analog and radio-frequency (RF) application becomes more complex as the device level modeling confronting challenges in micro- and nano-meter CMOS processes. As present CMOS technologies continue geometry scaling the designers can benefit using dedicated SPICE MOSFET models and apply specific analog design methodologies. The EKV was developed especially to meet altogether the analog/RF design requirements. This paper describes a basic set of the DC parameter extraction steps for the EKV 2.6 model. The free open source software (FOSS) Profile2D tool was used to illustrate accurate EKV 2.6 DC extraction strategy.","PeriodicalId":188240,"journal":{"name":"2015 22nd International Conference Mixed Design of Integrated Circuits & Systems (MIXDES)","volume":"283 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132569329","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}