Micron最新文献

{"title":"Toward cancer detection by label-free microscopic imaging in oncological surgery: Techniques, instrumentation and applications","authors":"Roberta Galli ,&nbsp;Ortrud Uckermann","doi":"10.1016/j.micron.2025.103800","DOIUrl":"10.1016/j.micron.2025.103800","url":null,"abstract":"<div><div>This review examines the clinical application of label-free microscopy and spectroscopy, which are based on optical signals emitted by tissue components. Over the past three decades, a variety of techniques have been investigated with the aim of developing an in situ histopathology method that can rapidly and accurately identify tumor margins during surgical procedures. These techniques can be divided into two groups. One group encompasses techniques exploiting linear optical signals, and includes infrared and Raman microspectroscopy, and autofluorescence microscopy. The second group includes techniques based on nonlinear optical signals, including harmonic generation, coherent Raman scattering, and multiphoton autofluorescence microscopy. Some of these methods provide comparable information, while others are complementary. However, all of them have distinct advantages and disadvantages due to their inherent nature. The first part of the review provides an explanation of the underlying physics of the excitation mechanisms and a description of the instrumentation. It also covers endomicroscopy and data analysis, which are important for understanding the current limitations in implementing label-free techniques in clinical settings. The second part of the review describes the application of label-free microscopy imaging to improve oncological surgery with focus on brain tumors and selected gastrointestinal cancers, and provides a critical assessment of the current state of translation of these methods into clinical practice. Finally, the potential of confocal laser endomicroscopy for the acquisition of autofluorescence is discussed in the context of immediate clinical applications.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"191 ","pages":"Article 103800"},"PeriodicalIF":2.5,"publicationDate":"2025-02-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143350200","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Single long linear flat-top, double and triple optical beams formation by an azimuthally polarized laser light using a seven-zone BPPF system","authors":"K. Lalithambigai ,&nbsp;P.M. Anbarasan ,&nbsp;Mohd. Shkir","doi":"10.1016/j.micron.2025.103788","DOIUrl":"10.1016/j.micron.2025.103788","url":null,"abstract":"<div><div>This study explores the focusing of an azimuthally polarized laser beam with a double-ring shape as it propagates through a seven-zone Binary Phase Pupil Filtration (BPPF) system with a conventional lens, using the concept of vector diffraction. The key features of the focal region in a five-zone BPPF and a seven-zone BPPF system are analyzed and compared using mathematical findings. The commonly utilized long linear flat-top beam may be created by applying suitable angles to the seven-zone BPPF system for a conventional lens with a numerical aperture of 0.9. The intensity of the focus zones was significantly affected when the truncation parameter of the incoming polarized beams was adjusted from a lower to a higher value, generating double and triple focal ring segments. Consequently, it is a simple and novel method to adjust the spacing between focal holes, enabling the trapping of two focal segments simultaneously from the centre. This technique used in cell manipulation, molecular biology used to study the mechanical properties of DNA and proteins, and to investigate molecular motors and other biomolecules, optical engineering, optical microscopy, optical tweezers, lithography, optical micromanipulation, data storage, and beam shaping, etc.,</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"191 ","pages":"Article 103788"},"PeriodicalIF":2.5,"publicationDate":"2025-02-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143259429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Transmission electron microscopy analysis of Co3O4 degradation induced by electron irradiation","authors":"Jingying Sun ,&nbsp;Mei Li ,&nbsp;Hao Liu ,&nbsp;Linna Guo ,&nbsp;Xin Dong ,&nbsp;Chaolun Liang","doi":"10.1016/j.micron.2025.103786","DOIUrl":"10.1016/j.micron.2025.103786","url":null,"abstract":"<div><div>This study presents an investigation into the electron beam damage phenomenon of Co₃O₄ under transmission electron microscopy (TEM). It was found that after irradiation at a dose rate of 6.78 × 10⁶ e/nm²s, Co₃O₄ crystals exhibited surface reconstruction and faceting features. Electron energy loss spectroscopy (EELS) analysis indicates that the damage process initiates with the desorption of oxygen anions, which subsequently leads to a reduction in the valence state of cobalt cations and corresponding atomic rearrangement. High resolution TEM (HRTEM) reveals that surface faceting, which has an epitaxial relationship with the bulk, could help maintain the crystal lattice of face-centered cubic (fcc) Co₃O₄ despite Co-O bond breakage upon beam exposure. With a finely focused electron beam, the hole drilling effect was observed. The structural degradation is proposed to arise from inelastic damage that induced partial desorption of oxygen anions and rearrangement of valence-reduced cobalt cations to epitaxially grow on the surface, suggesting an interplay between irradiation damage and material restructuring. The relative phase stability of Co₃O₄, combined with its interfacial structure developed upon irradiation, are beneficial to magnetic loss and interfacial polarization loss, thereby rendering Co₃O₄ a promising candidate as an effective EMW absorber.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103786"},"PeriodicalIF":2.5,"publicationDate":"2025-01-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143075076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Comparative electron diffraction analysis of strain relaxation in AlxGa1-xN materials in the microelectronics industry: 4D-STEM approach vs. TEM-based N-PED solution","authors":"Estève Drouillas ,&nbsp;Jean-Gabriel Mattei ,&nbsp;Bénédicte Warot-Fonrose","doi":"10.1016/j.micron.2025.103785","DOIUrl":"10.1016/j.micron.2025.103785","url":null,"abstract":"<div><div>Owing to its high spatial resolution and its high sensitivity to chemical element detection, transmission electron microscopy (TEM) technique enables to address high-level materials characterization of advanced technologies in the microelectronics field. TEM instruments fitted with various techniques are well-suited for assessing the local structural and chemical order of specific details. Among these techniques, 4D-STEM is suitable to estimate the strain distribution of a large field of view. This study tends to discuss the viability of using two existing commercial solutions with a low-convergence angle 4D-STEM technique and TEM-based Nanobeam Precession Electron Diffraction (N-PED) methods for strain analysis in an industrial context. In such a framework, strain measurements intend to point out the extent of defects and thus reveal a trend of the stress field, rather than to precisely estimate the absolute values of the deformations. Strain distribution maps have been obtained for AlGaN/GaN HEMT devices using two transmission electron diffraction analysis methods. The performances of 4D-STEM and Nanobeam Precession Electron Diffraction (N-PED) solution for strain mapping have been compared for both a relatively thin (≈ 55 nm) and a thick (≈ 150 nm) TEM cross section specimen. The strain maps obtained with both methods have shown comparable results for a thin sample, with the ability to characterize the deformation induced by a 1 nm-thick layer of AlN spacer grown between the AlGaN barrier and GaN channel forming the 2DEG of the HEMT device. The results presented here also illustrate the limitation of both commercial solutions in the case of a thick sample.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103785"},"PeriodicalIF":2.5,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143029086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A statistical approach for interplanar spacing metrology at a relative uncertainty below 10−4 using scanning transmission electron microscopy","authors":"Amram Azulay ,&nbsp;Itai Silber ,&nbsp;Yoram Dagan ,&nbsp;Amit Kohn","doi":"10.1016/j.micron.2025.103783","DOIUrl":"10.1016/j.micron.2025.103783","url":null,"abstract":"<div><div>Atomic-scale metrology in scanning transmission electron microscopy (STEM) allows to measure distances between individual atomic columns in crystals and is therefore an important aspect of their structural characterization. Furthermore, it allows to locally resolve strain in crystals and to calibrate precisely the pixel size in STEM. We present a method dedicated to the evaluation of interplanar spacing (d-spacing) based on an algorithm including curve fitting of processed high-angle annular dark-field STEM (HAADF STEM) signals. By examining simulated data of perovskite cubic SrTiO₃, we confirm that our proposed method is unbiased, and the precision is better than the significant digit of the input value. Then, we study experimental data to learn how electron dose, sampling resolution, and statistical sampling affect the mean and precision values of <em>d</em>₁₁₀. For single d-spacing measurements using a probe corrected STEM, we find that uncertainty ranges between 1 and 3 pm. Here, we measure numerous d-spacings in an automated and statistical approach, resulting in relative uncertainties in mean values ≤ 10⁻⁴. Thus, we propose to calibrate TEMs using this method as it enables measuring lattice parameters at uncertainties comparable to reports of x-ray diffraction measurements, but with a significantly lower sample volume, in this case ∼ 10⁻³ µm³.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103783"},"PeriodicalIF":2.5,"publicationDate":"2025-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143008268","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Grids designed for tomography: Stereovision transmission electron microscopy makes it easy to determine the winding handedness of helical nanocoils","authors":"Noriyuki Ishii ,&nbsp;Yoshikatsu Ogawa","doi":"10.1016/j.micron.2025.103784","DOIUrl":"10.1016/j.micron.2025.103784","url":null,"abstract":"<div><div>Determining the handedness of helical nanocoils using transmission electron microscopy (TEM) has traditionally been challenging due to the deep depth of field and transmission nature of TEM, complementary techniques are considered necessary and have been practiced such as low angle rotary shadowing, scanning electron microscopy (SEM), or atomic force microscopy (AFM). These methods require customized sample preparation, making direct comparison difficult. Inspired by the need to identify the helical winding direction from TEM images alone, we developed a specialized tomography grid to capture stereo-pair images, enabling stereopsis. By leveraging previous research on nano-coiled structures using identical materials and tomography grids, we successfully identified the handedness of helical coils. Our model sample consisted of graphitic nanotubes with bilayer ribbons of π-stacked hexa-<em>peri</em>-hexabenzocoronene (HBC) units, forming right- and left-handed helical coils from (S)- and (R)-enantiomers of the amphiphile [Jin W. et al. (2005) Proc. Natl. Acad. Sci. U.S.A. 102, 10801–10806]. Using stereo-pair TEM images, we evaluated the accuracy of our approach in visually determining the handedness of helical coils. The technique provides a valuable tool for sample inspection, screening, and assessing relative positions, including the determination of helical handedness.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103784"},"PeriodicalIF":2.5,"publicationDate":"2025-01-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142983956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Development of an accurate simplified approach for data processing in AFM indentation experiments","authors":"S.V. Kontomaris ,&nbsp;A. Malamou ,&nbsp;A. Stylianou","doi":"10.1016/j.micron.2024.103782","DOIUrl":"10.1016/j.micron.2024.103782","url":null,"abstract":"<div><div>Atomic Force Microscopy (AFM) nanoindentation is the most effective method for determining the mechanical properties of soft biological materials and biomaterials at the nanoscale, with significant applications in many areas, including cancer diagnosis. However, a major drawback of this method is the complexity of the experimental procedure and data processing, which requires several calibration steps.To avoid this complexity, the AFM tip is usually approximated as a perfect cone. In this case, <span><math><mrow><mi>F</mi><mo>=</mo><mi>c</mi><msup><mrow><mi>h</mi></mrow><mrow><mn>2</mn></mrow></msup></mrow></math></span>, where <em>F</em> is the applied force, ℎ is the indentation depth, and <span><math><mi>c</mi></math></span> is a constant that depends on both the cone’s half-angle and the material's properties. However, since AFM tips are pyramidal with a rounded tip apex (or similar to a truncated cone in some cases), the conical approximation may lead to non-negligible errors. Although equations exist that relate the applied force, indentation depth, and the sample’s Young’s modulus for real indenters, they are rarely used because they do not directly relate the applied force to the indentation depth (i.e., the fitting process is much more complicated compared to the conical approximation). In this paper, a new, accurate, simplified approach for data processing is proposed, based on fitting the force–indentation data to a quadratic equation of the form: <span><math><mrow><mi>F</mi><mo>=</mo><msub><mrow><mi>c</mi></mrow><mrow><mn>2</mn></mrow></msub><msup><mrow><mi>h</mi></mrow><mrow><mn>2</mn></mrow></msup><mo>+</mo><msub><mrow><mi>c</mi></mrow><mrow><mn>1</mn></mrow></msub><mi>h</mi></mrow></math></span>. It is proven that the parameter <span><math><msub><mrow><mi>c</mi></mrow><mrow><mn>2</mn></mrow></msub></math></span> is independent of the tip apex properties. On the other hand, the parameter <span><math><msub><mrow><mi>c</mi></mrow><mrow><mn>1</mn></mrow></msub></math></span> depends on the material properties, the cone’s half angle, and the shape and dimensions of the tip apex. Simulated force-indentation data from sphero-conical and blunted pyramidal indenters, along with real experimental data from lung tissues, are processed using the proposed approach. The key result is that Young’s modulus can be accurately determined using only the <span><math><msub><mrow><mi>c</mi></mrow><mrow><mn>2</mn></mrow></msub></math></span> parameter; therefore, tip characterization can be avoided.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103782"},"PeriodicalIF":2.5,"publicationDate":"2024-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142971558","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Scanning transmission election microscopy observations of twisted epitaxial gold nanodiscs in twisted molybdenum disulfide bilayers","authors":"Yi Cui 崔一,&nbsp;Pawel Czaja,&nbsp;Yi Cui 崔屹,&nbsp;Robert Sinclair","doi":"10.1016/j.micron.2024.103776","DOIUrl":"10.1016/j.micron.2024.103776","url":null,"abstract":"<div><div>Atomic scale, scanning transmission electron microscopy (STEM) analysis of the moiré structures in twisted epitaxial gold nanodiscs encapsulated in twisted bilayer molybdenum disulfide is presented. High angle annular dark field STEM imaging reveals that the period of the moiré patterns between gold and molybdenum disulfide varies with different twist angles of the bilayer molybdenum disulfide, ranging from 1.80 nm (epitaxial alignment of gold) to 1.53 nm (twisted epitaxial alignment of gold). Additionally, bright field STEM imaging reveals a faint, larger \"moiré of moiré\" structure in cases where the bilayer molybdenum disulfide twist angle is small (∼6°), arising from the overlapping three-layers, which is not visible in conventional transmission electron microscopy images. Our experiments indicate that scanning transmission electron microscopy as a suitable tool for moiré analysis of twisted multilayer planar heterostructures, complementary to information provided by conventional transmission electron microscopy and diffraction.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103776"},"PeriodicalIF":2.5,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142915232","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Microscopic investigation of pollen attachment on different fabric types: Implications for forensic and allergy research","authors":"Zelal Küçük ,&nbsp;Sevcan Celenk","doi":"10.1016/j.micron.2024.103781","DOIUrl":"10.1016/j.micron.2024.103781","url":null,"abstract":"<div><div>Pollen grains, in addition to their allergenic properties, play an important role in the temporal and spatial analysis of forensic events and are considered secondary trace evidence. Pollen analysis requires expertise in microscopy techniques and palynology. This study aims to determine the persistence of pollen on common used fabric types and how much of it can be removed through washing. The structural properties of the tested pollen grains and fabrics were analyzed using light microscopy (LM) and scanning electron microscopy (SEM). Additionally, the study aims to provide data to help individuals sensitive to allergenic pollens in selecting suitable fabrics. Pollen grains from <em>Ambrosia artemisiifolia</em>, <em>Chenopodium album</em>, <em>Corylus avellana</em>, <em>Parietaria officinalis</em>, and <em>Platanus × acerifolia</em>, which had not been tested in previous studies, were examined on five different fabric types commonly used in the textile industry: denim, artificial leather, lacoste cotton fabric, linen, and printed cotton fabric. It was determined that pollen adhesion capacity and persistence varied based on the fabric's structure and first wash was the most effective for removing pollen from fabrics. Removal of pollen grains through washing from linen, printed cotton fabric, and lacoste cotton fabric were found to be easier from denim and artificial leather. The study revealed that pollen could still be detected on fabrics even after six washes. This finding highlights the potential use of pollen grains as valuable trace evidence in forensic cases.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103781"},"PeriodicalIF":2.5,"publicationDate":"2024-12-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142927278","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Effect of pre-deformation on microstructure and mechanical properties of a fine-grained 2A97 alloy","authors":"Fengjiao Niu ,&nbsp;Zibo Ma ,&nbsp;Yixuan Hao ,&nbsp;Yajie Guo ,&nbsp;Peng Cao","doi":"10.1016/j.micron.2024.103779","DOIUrl":"10.1016/j.micron.2024.103779","url":null,"abstract":"<div><div>This study investigates the effect of pre-deformation by cold rolling after solution annealing on the microstructure and properties of the fine-grained Al-Li alloy 2A97. Electron backscatter diffraction (EBSD), X-ray diffraction (XRD) and transmission electron microscopy (TEM) were used to characterize grain boundaries, dislocations, precipitates and calculate their contribution to strength. It is found that the changes in precipitation behavior predominantly account for the enhanced tensile properties observed in the deformed alloys, where yield and tensile strengths are increased by 85 MPa and 63 MPa, respectively. The peak-aged samples without pre-deformation are mainly strengthened by the T₁ phase, δ'/θ'/δ' composite and σ phase. In contrast, deformation of 10 % prior to aging facilitates the precipitation of the T₁ and lath-like S phases while concurrently inhibiting the precipitation of the σ phase and δ'/θ'/δ' composite phases. In addition, for fine-grained alloys, low-angle grain boundaries induce the precipitation of the finer T₁ phase compared to the T₁ phase located inside the grain, which contributes to the good performance of 2A97 alloy.</div></div>","PeriodicalId":18501,"journal":{"name":"Micron","volume":"190 ","pages":"Article 103779"},"PeriodicalIF":2.5,"publicationDate":"2024-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142895733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}