Grids designed for tomography: Stereovision transmission electron microscopy makes it easy to determine the winding handedness of helical nanocoils

IF 2.5 3区 工程技术 Q1 MICROSCOPY
Noriyuki Ishii , Yoshikatsu Ogawa
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引用次数: 0

Abstract

Determining the handedness of helical nanocoils using transmission electron microscopy (TEM) has traditionally been challenging due to the deep depth of field and transmission nature of TEM, complementary techniques are considered necessary and have been practiced such as low angle rotary shadowing, scanning electron microscopy (SEM), or atomic force microscopy (AFM). These methods require customized sample preparation, making direct comparison difficult. Inspired by the need to identify the helical winding direction from TEM images alone, we developed a specialized tomography grid to capture stereo-pair images, enabling stereopsis. By leveraging previous research on nano-coiled structures using identical materials and tomography grids, we successfully identified the handedness of helical coils. Our model sample consisted of graphitic nanotubes with bilayer ribbons of π-stacked hexa-peri-hexabenzocoronene (HBC) units, forming right- and left-handed helical coils from (S)- and (R)-enantiomers of the amphiphile [Jin W. et al. (2005) Proc. Natl. Acad. Sci. U.S.A. 102, 10801–10806]. Using stereo-pair TEM images, we evaluated the accuracy of our approach in visually determining the handedness of helical coils. The technique provides a valuable tool for sample inspection, screening, and assessing relative positions, including the determination of helical handedness.
为断层扫描设计的栅格:立体视觉透射电子显微镜使得确定螺旋纳米线圈的旋向性变得容易。
利用透射电子显微镜(TEM)确定螺旋纳米线圈的手性传统上是具有挑战性的,由于TEM的深景深和透射性质,补充技术被认为是必要的,并且已经被实践,如低角度旋转阴影,扫描电子显微镜(SEM)或原子力显微镜(AFM)。这些方法需要定制样品制备,使直接比较困难。受仅从TEM图像中识别螺旋缠绕方向的需求的启发,我们开发了一个专门的断层扫描网格来捕获立体对图像,从而实现立体视觉。通过利用先前对使用相同材料和断层扫描网格的纳米线圈结构的研究,我们成功地确定了螺旋线圈的手性。我们的模型样品由石墨纳米管组成,石墨纳米管带有π堆积的六-六苯并二烯(HBC)单元的双层带,由两亲分子的(S)-和(R)-对映体形成左右螺旋线圈[Jin W. et al. (2005) Proc. Natl.]。学会科学。[美][j]。使用立体对TEM图像,我们评估了我们的方法在视觉上确定螺旋线圈的手性的准确性。该技术为样品检查、筛选和评估相对位置提供了有价值的工具,包括确定螺旋手性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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来源期刊
Micron
Micron 工程技术-显微镜技术
CiteScore
4.30
自引率
4.20%
发文量
100
审稿时长
31 days
期刊介绍: Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.
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