二硫化钼双分子层中扭曲外延金纳米片的扫描透射电镜观察。

IF 2.5 3区工程技术 Q1 MICROSCOPY

Micron Pub Date : 2024-12-27 DOI:10.1016/j.micron.2024.103776

Yi Cui 崔一, Pawel Czaja, Yi Cui 崔屹, Robert Sinclair

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引用次数: 0

摘要

采用原子尺度、扫描透射电子显微镜（STEM）分析了扭曲层二硫化钼包裹的扭曲外延金纳米片的波纹结构。高角环形暗场STEM成像显示，随着双层二硫化钼的不同扭转角度，金与二硫化钼之间的波纹图案周期变化，范围从1.80 nm（金的外延排列）到1.53 nm（金的扭曲外延排列）。此外，亮场STEM成像显示，在双层二硫化钼扭曲角较小（~ 6°）的情况下，双层二硫化钼扭曲角较小（~ 6°），这是由重叠的三层引起的，这在传统的透射电子显微镜图像中是不可见的。我们的实验表明，扫描透射电子显微镜作为一种合适的工具来分析扭曲的多层平面异质结构，补充了传统透射电子显微镜和衍射提供的信息。

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Scanning transmission election microscopy observations of twisted epitaxial gold nanodiscs in twisted molybdenum disulfide bilayers

Atomic scale, scanning transmission electron microscopy (STEM) analysis of the moiré structures in twisted epitaxial gold nanodiscs encapsulated in twisted bilayer molybdenum disulfide is presented. High angle annular dark field STEM imaging reveals that the period of the moiré patterns between gold and molybdenum disulfide varies with different twist angles of the bilayer molybdenum disulfide, ranging from 1.80 nm (epitaxial alignment of gold) to 1.53 nm (twisted epitaxial alignment of gold). Additionally, bright field STEM imaging reveals a faint, larger "moiré of moiré" structure in cases where the bilayer molybdenum disulfide twist angle is small (∼6°), arising from the overlapping three-layers, which is not visible in conventional transmission electron microscopy images. Our experiments indicate that scanning transmission electron microscopy as a suitable tool for moiré analysis of twisted multilayer planar heterostructures, complementary to information provided by conventional transmission electron microscopy and diffraction.

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来源期刊

Micron 工程技术-显微镜技术

CiteScore

4.30

自引率

4.20%

发文量

100

审稿时长

31 days

期刊介绍： Micron is an interdisciplinary forum for all work that involves new applications of microscopy or where advanced microscopy plays a central role. The journal will publish on the design, methods, application, practice or theory of microscopy and microanalysis, including reports on optical, electron-beam, X-ray microtomography, and scanning-probe systems. It also aims at the regular publication of review papers, short communications, as well as thematic issues on contemporary developments in microscopy and microanalysis. The journal embraces original research in which microscopy has contributed significantly to knowledge in biology, life science, nanoscience and nanotechnology, materials science and engineering.