2012 2nd IEEE CPMT Symposium Japan最新文献

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Wireless body area communication using electromagnetic resonance coupling 利用电磁共振耦合的无线体域通信
2012 2nd IEEE CPMT Symposium Japan Pub Date : 2012-12-01 DOI: 10.1109/ICSJ.2012.6523439
F. Koshiji, N. Yuyama, K. Koshiji
{"title":"Wireless body area communication using electromagnetic resonance coupling","authors":"F. Koshiji, N. Yuyama, K. Koshiji","doi":"10.1109/ICSJ.2012.6523439","DOIUrl":"https://doi.org/10.1109/ICSJ.2012.6523439","url":null,"abstract":"In this paper, a new highly efficient wireless communication link around human body using electromagnetic resonance coupling was proposed and investigated. The communication between wearable devices located on forearm and upper arm, like a wristwatch or armband, is assumed as a model for body area communication. The transmission characteristics S21, between transmitting and receiving antenna which is put on forearm and upper arm, respectively, like a wristwatch or armband, were analyzed and measured. As a result, the transmission characteristics S21 showed the maximum value of -12 dB, and was excellent compared with that of conventional body area communication using the electrodes in contact with the body. Moreover, the SAR of the body was less than a three-hundredth compared with the safety limit of 2 W/kg. Therefore, we confirmed that the wireless communication link using magnetic resonance coupling is useful for body area communication.","PeriodicalId":174050,"journal":{"name":"2012 2nd IEEE CPMT Symposium Japan","volume":"50 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115861395","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Productivity improvement of copper pillar flip-chip package by pre-applied materials and press machine 采用预敷材料和压片机提高铜柱倒装封装的生产率
2012 2nd IEEE CPMT Symposium Japan Pub Date : 2012-12-01 DOI: 10.1109/ICSJ.2012.6523392
K. Motomura, H. Maruo, Wanyu Tie, H. Eifuku, S. Sakemi, T. Sakai
{"title":"Productivity improvement of copper pillar flip-chip package by pre-applied materials and press machine","authors":"K. Motomura, H. Maruo, Wanyu Tie, H. Eifuku, S. Sakemi, T. Sakai","doi":"10.1109/ICSJ.2012.6523392","DOIUrl":"https://doi.org/10.1109/ICSJ.2012.6523392","url":null,"abstract":"In this report, authors describe improvement effort of fine pitch flip-chip interconnection based on pre-applied material process. For evaluation, IC with copper pillar bumps (50 μm pitch) and organic boards (FR-5) have been used. NCF and B-stage material have been used as pre-applied connecting material. As a result, we have developed temporary alignment and subsequent batch bonding process to improve productivity.","PeriodicalId":174050,"journal":{"name":"2012 2nd IEEE CPMT Symposium Japan","volume":"85 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125389435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Temporary bonding/de-bonding and permanent wafer bonding solutions for 3D integration 用于3D集成的临时键合/脱键和永久晶圆键合解决方案
2012 2nd IEEE CPMT Symposium Japan Pub Date : 2012-12-01 DOI: 10.1109/ICSJ.2012.6523416
H. Ishida, S. Sood, C. Rosenthal, S. Lutter
{"title":"Temporary bonding/de-bonding and permanent wafer bonding solutions for 3D integration","authors":"H. Ishida, S. Sood, C. Rosenthal, S. Lutter","doi":"10.1109/ICSJ.2012.6523416","DOIUrl":"https://doi.org/10.1109/ICSJ.2012.6523416","url":null,"abstract":"Thin wafer handling (or temporary bonding/de-bonding) and permanent wafer bonding are two of the key enabling technologies for 3D-IC integration process. Temporary bonding adhesive in conjunction with de-bonding method has to be carefully selected to obtain damage-free thinned processed wafers. Room temperature mechanical lift-off de-bonding method with proper de-bond wave front control is considered to be promising. Metal-adhesive or metal-oxide hybrid bonding can create a final stacked 3D-IC structure with superior mechanical strength, electrical performance and excellent post-bond alignment.","PeriodicalId":174050,"journal":{"name":"2012 2nd IEEE CPMT Symposium Japan","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126808854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Novel technology for power integrity using a metal particle conductive layer 利用金属颗粒导电层实现电源完整性的新技术
2012 2nd IEEE CPMT Symposium Japan Pub Date : 2012-12-01 DOI: 10.1109/ICSJ.2012.6523445
Noifumi Sasaoka, Takafumi Ochi, M. Oono, C. Ueda, Y. Akiyama, K. Otsuka, Nippon Kodoshi Corporation, Haruno-Cho Hirooka-Kami
{"title":"Novel technology for power integrity using a metal particle conductive layer","authors":"Noifumi Sasaoka, Takafumi Ochi, M. Oono, C. Ueda, Y. Akiyama, K. Otsuka, Nippon Kodoshi Corporation, Haruno-Cho Hirooka-Kami","doi":"10.1109/ICSJ.2012.6523445","DOIUrl":"https://doi.org/10.1109/ICSJ.2012.6523445","url":null,"abstract":"Power integrity (PI) for recent electronics circuits and systems is the most important technological issue in the field and has been addressed in important papers through several approaches[1][2]. A novel technology is used in our study only using a conductive layer of dispersed metal particles instead of copper plane. We investigate physical phenomena and some fundamental data for PI. The transmission lines which uses metal particle conductive layer(MPCL), it causes the change in a variety of electromagnetic wave transmission speeds such as increases 76% and decrease by 21%. As a result, Z11 value of power/GND plane test coupon at 5GHz is from 2.01 (ICEP2011 [3]) to 1.79 ohm. Also we made a trial PCB in which we only replaced from the power copper metal plane in the circuit board with MPCL. The voltage fluctuation was decreased about 60% using a MPCL structure. Our developed MPCL structure has excellent characteristics not only for PI but also SI in the desirable high-frequency region. This phenomenon must be clarified as the physical basis for more progressive PI and SI issues. We suppose that these characteristic is due to interactions between electromagnetic wave and metal surface electrons. So we think that the morphology of MPCL must be an important point of improving PI and SI in the desirable high frequency region.","PeriodicalId":174050,"journal":{"name":"2012 2nd IEEE CPMT Symposium Japan","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121623746","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Board level drop test modeling 板级跌落测试建模
2012 2nd IEEE CPMT Symposium Japan Pub Date : 1900-01-01 DOI: 10.1109/icsj.2012.6523419
M. Amagai, J. Seungmin
{"title":"Board level drop test modeling","authors":"M. Amagai, J. Seungmin","doi":"10.1109/icsj.2012.6523419","DOIUrl":"https://doi.org/10.1109/icsj.2012.6523419","url":null,"abstract":"Recently, drop test reliability has become a major concern for mobile electronic products. Especially, system-in-package (SIP) like stacked-die-package and package-on-package may lead to increased stress in solder joints during drop impacts due to their complicate structures. In this study, evaluations of test board material properties, damping parameters, the correlation of displacements and strains between model and drop test and also parameters of fail cyclic life prediction were performed with three point bend tests, acceleration sensors, strain gauges, a high speed camera, drop testers, dynamic finite element models.","PeriodicalId":174050,"journal":{"name":"2012 2nd IEEE CPMT Symposium Japan","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132166018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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