K. Motomura, H. Maruo, Wanyu Tie, H. Eifuku, S. Sakemi, T. Sakai
{"title":"采用预敷材料和压片机提高铜柱倒装封装的生产率","authors":"K. Motomura, H. Maruo, Wanyu Tie, H. Eifuku, S. Sakemi, T. Sakai","doi":"10.1109/ICSJ.2012.6523392","DOIUrl":null,"url":null,"abstract":"In this report, authors describe improvement effort of fine pitch flip-chip interconnection based on pre-applied material process. For evaluation, IC with copper pillar bumps (50 μm pitch) and organic boards (FR-5) have been used. NCF and B-stage material have been used as pre-applied connecting material. As a result, we have developed temporary alignment and subsequent batch bonding process to improve productivity.","PeriodicalId":174050,"journal":{"name":"2012 2nd IEEE CPMT Symposium Japan","volume":"85 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Productivity improvement of copper pillar flip-chip package by pre-applied materials and press machine\",\"authors\":\"K. Motomura, H. Maruo, Wanyu Tie, H. Eifuku, S. Sakemi, T. Sakai\",\"doi\":\"10.1109/ICSJ.2012.6523392\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this report, authors describe improvement effort of fine pitch flip-chip interconnection based on pre-applied material process. For evaluation, IC with copper pillar bumps (50 μm pitch) and organic boards (FR-5) have been used. NCF and B-stage material have been used as pre-applied connecting material. As a result, we have developed temporary alignment and subsequent batch bonding process to improve productivity.\",\"PeriodicalId\":174050,\"journal\":{\"name\":\"2012 2nd IEEE CPMT Symposium Japan\",\"volume\":\"85 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 2nd IEEE CPMT Symposium Japan\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSJ.2012.6523392\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 2nd IEEE CPMT Symposium Japan","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSJ.2012.6523392","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Productivity improvement of copper pillar flip-chip package by pre-applied materials and press machine
In this report, authors describe improvement effort of fine pitch flip-chip interconnection based on pre-applied material process. For evaluation, IC with copper pillar bumps (50 μm pitch) and organic boards (FR-5) have been used. NCF and B-stage material have been used as pre-applied connecting material. As a result, we have developed temporary alignment and subsequent batch bonding process to improve productivity.