56th ARFTG Conference Digest最新文献_第3页

Load Models for CPW and Microstrip SOLT Standards on GaAs GaAs上CPW和微带SOLT标准的负载模型

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327432

P. Kirby, L. Dunleavy, T. Weller

引用次数: 8

Evaluating and expressing uncertainty in complex S-parameter measurements 复杂s参数测量不确定度的评定与表达

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327429

N. Ridler, M. Salter

引用次数: 40

Carrier-to-Interference Ratio Estimation of Arbitrary Signals Distorted by Nonlinear Devices 非线性器件畸变任意信号的载波干扰比估计

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327419

H. Ku, W. Woo, J. Kenney

引用次数: 0

Finite Aperture Time and Sampling Jitter Effects in Wideband Data Acquisition Systems 宽带数据采集系统中的有限孔径时间和采样抖动效应

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327443

Haruo Kobayashi, Kensuke Kobayashi, Yuuich Takahashi, Kouhei Enomoto, Hideyuki Kogure, Y. Onaya, M. Morimura

引用次数: 12

Lumped-Element Models for On-Wafer Calibration 片上校准的集总元件模型

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327431

D. Walker, R. F. Kaiser, Dylan F. Williams, K. Coakley

引用次数: 2

Nonlinear Characterization of Multiple Carrier Power Amplifiers 多载波功率放大器的非线性特性

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327433

O. Andersen, P. Malmlof, D. Wisell

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引用次数: 14

Improved Uncertainty for the Noise Source based on the Adapter Removal Methods 基于适配器去除方法的噪声源不确定性改进

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327442

Y. Lee, Norm Royce

{"title":"Improved Uncertainty for the Noise Source based on the Adapter Removal Methods","authors":"Y. Lee, Norm Royce","doi":"10.1109/ARFTG.2000.327442","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327442","url":null,"abstract":"Noise is the fundamental to our understanding communication. For the last ten years and with the emerging of the wireless communication industry, the demand of making high accurate noise generator measurements has increased dramatically. The increased accuracy specification of the Noise Figure Analyzers is based in part on better calibrations of the Noise Source. Our primary noise source standards were calibrated by NIST in APC-7, X-band, P-band, K-band, R-band, and Q-band. Calibrated adapters are used on the NIST calibrated noise sources to characterize the system for the connector option of the noise source being used. The uncertainty of these adapter calibrations degrades the reported uncertainty. The old method would measure pairs of adapters (P-band to Type-N male & Type-N female to P-band) and split the loss of the pair as a best guess of each adapter loss. An increase in the uncertainty budget was made. The new method will require the testing of 3 different adapters. Each adapter is paired back-to-back with the two others and a measurement is made. This results in 3 measurements, 3 equations, and 3 unknowns, which can be solved for each adapter¿s transmission loss. No assumption about loss split is make.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127957604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Synchronous Sampling and Applications to Analytic Signal Estimation 同步采样及其在分析信号估计中的应用

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327436

S. Pepper

引用次数: 4

Microwave Electric-Field Mapping Using Optical-Fiber-Mounted Electro-Optic Probes 利用光纤光电探针进行微波电场测绘

56th ARFTG Conference Digest Pub Date : 1900-01-01 DOI: 10.1109/ARFTG.2000.327437

K. Yang, J. Whitaker, L. Katehi

引用次数: 0

A Closer Look at the Nose-to-Nose Calibration: Cyrano de Bergerac and Gepetto the Carpenter 近距离观察鼻对鼻校准:Cyrano de Bergerac和Gepetto the Carpenter

56th ARFTG Conference Digest Pub Date : 1900-01-01 DOI: 10.1109/arftg.2000.327449

Cyrano de Bergerac, G. Carpenter

引用次数: 0