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Identification and Measurement of Transmitter Non-Linearities 发射机非线性辨识与测量
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327441
D. Wisell
{"title":"Identification and Measurement of Transmitter Non-Linearities","authors":"D. Wisell","doi":"10.1109/ARFTG.2000.327441","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327441","url":null,"abstract":"In this article the effects of non-linearities and other impairments in a direct up-conversion transmitter is investigated. By using simple non-linear models for the non-linearities at baseband and for the power amplifier, a total mathematical model of the transmitter is obtained. From the model it can be seen that both the amplitude and the phase distortion of the transmitter are dependent on both the phase and the envelope of the input signal. The parameters of the non-linear baseband and RF distortion of this model are then identified separately by studying the amplitude and phase distortion of the output signal. The method is verified by measurements and it is found that the identified parameters can be used to accurately re-generate the measured output signal in the sense that all main distortion products, i.e. larger than ¿60 dBc, of the re-generated signal will be within a dB of the distortion products of the measured signal.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116550440","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Radiated Power Measurements in Reverberation Chambers 混响室辐射功率测量
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327446
G. Koepke, J. Ladbury
{"title":"Radiated Power Measurements in Reverberation Chambers","authors":"G. Koepke, J. Ladbury","doi":"10.1109/ARFTG.2000.327446","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327446","url":null,"abstract":"The electromagnetic reverberation chamber is widely used for interference and compatibility compliance testing of electronic products. Such a chamber is particularly effective in quantifying the total radiated power from an emitter regardless of the emitter¿s radiation pattern. This feature is useful for characterization of wireless devices and other transmitters, especially as the front-end components and the antenna become more integrated and less accessible. We examine techniques for measuring radiated emissions using power received from an antenna in the chamber, and demonstrate a correlation to free-field measurements.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128441517","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
A Wideband Method for the Rigorous Low-Impedance Loadpull Measurement of High-Power Transistors Suitable for Large-Signal Model Validation 一种适用于大信号模型验证的高功率晶体管严格低阻抗负载拉测量的宽带方法
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327435
P. Aaen, J. Plá, D. Bridges, E. Shumate
{"title":"A Wideband Method for the Rigorous Low-Impedance Loadpull Measurement of High-Power Transistors Suitable for Large-Signal Model Validation","authors":"P. Aaen, J. Plá, D. Bridges, E. Shumate","doi":"10.1109/ARFTG.2000.327435","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327435","url":null,"abstract":"This paper presents a rigorous method for low impedance loadpull measurements using a 6-section Tschebyscheff transforming water-cooled pre-matching test fixture. The transformers were designed to be able to accurately determine S-parameters that represent each fixture half at the fundamental frequency of operation fo and its second and third harmonics, 2fo and 3fo. A two-tier non-50 ¿ TRL calibration technique was used to establish the measurement reference planes. In order to accurately establish the calibrated system impedance, a simulated Time Domain Reflectometry (TDR) technique was employed. The calibration of the loadpull system was confirmed by calculating the difference between the measured and calculated transducer gain (¿Gt). This difference provides a measure of the measurement uncertainty. The largest uncertainty, in areas of interest on the Smith chart, was found to be 0.25 dB. The fixture was successfully utilized to measure the loadpull performance of one of Motorola's LDMOS, 90 Watt, 1.9 GHz high power transistors.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129863046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
A New Technique for Low-Jitter Measurements Using Equivalent-Time Sampling Oscilloscopes 一种利用等时间采样示波器进行低抖动测量的新技术
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327422
Michael Nelson
{"title":"A New Technique for Low-Jitter Measurements Using Equivalent-Time Sampling Oscilloscopes","authors":"Michael Nelson","doi":"10.1109/ARFTG.2000.327422","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327422","url":null,"abstract":"A new timebase technology for equivalent-time sampling oscilloscopes is presented. The technology is based on the qualification of a high-Q resonator with traditional analog signal processing, and provides a startable oscillator for generating trigger-to-strobe delays with excellent long term jitter performance.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123396404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Behavioral models of microwave circuits with fading memory 具有记忆衰退的微波电路行为模型
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327420
N. Tufillaro, D. Walker
{"title":"Behavioral models of microwave circuits with fading memory","authors":"N. Tufillaro, D. Walker","doi":"10.1109/ARFTG.2000.327420","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327420","url":null,"abstract":"This particular circuit is meant to be a transistor `analog' of a high-frequency microwave transistor [13]. In addition to acting as an ampli er, this circuit also tries to mimic certain (memory dependent) charge storage e ects which should be active in this example in a frequency range around 0.5 kHz. Models are also built from numerical models and data from simulations. The notion of a system having fading memory\" is that input signals far in the past should have almost no e ect on the present state. A precise mathematical de nition of this concept is usually stated in the space of input/output functional (integral) equations. Boyd and Chua hint that the notion of fading memory should also have a (di erential) state space formulation [4]. In the following example, we show that the essential ingredients of such a state space formulation is that the attracting solution should forget both its initial condition and input sequences far in the past. Both conditions are usually ful lled if the system has a unique attracting xed point. Consider a closed RC circuit driven by a voltage source vs. The voltage around a closed loop is","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129043729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A Method to Evaluate Power Sensor Calibration Systems 一种评估功率传感器校准系统的方法
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327448
J. G. Burns
{"title":"A Method to Evaluate Power Sensor Calibration Systems","authors":"J. G. Burns","doi":"10.1109/ARFTG.2000.327448","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327448","url":null,"abstract":"This Power Sensor Calibration System used an indirect comparison method to calibrate a Device Under Test (DUT). A thermistor mount, calibrated by an external Calibration Laboratory, was the Standard Mount. The Effective Efficiencies and the associated accuracies of the Standard Mount were entered into a table the system computer. This system used a two step approach to perform the full measurement cycle. The first step was to measure the complex reflection coefficients of the DUT. The second step is shown in Figure 1. A power divider input was connected to a signal generator and amplifier. The Standard Mount was connected to one output of the divider. Another thermistor mount was connected to the other divider output.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"746 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122006705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Improving the Uncertainty Analysis of NIST's Pulse Parameter Measurement Service 改进NIST脉冲参数测量服务的不确定度分析
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327423
N. Paulter, D. R. Larson
{"title":"Improving the Uncertainty Analysis of NIST's Pulse Parameter Measurement Service","authors":"N. Paulter, D. R. Larson","doi":"10.1109/ARFTG.2000.327423","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327423","url":null,"abstract":"A new uncertainty analysis is being performed for NIST¿s pulse parameter measurement service that represents the new pulse parameter measurement and extraction process. This new analysis is expected to have lower uncertainties compared to those presently reported.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124380155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
The Microwave Component Analyzer: A Novel Instrument for Measuring Pulsed or CW Signal-to-Noise Ratio 微波分量分析仪:一种测量脉冲或连续波信噪比的新型仪器
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327434
L. Hoover, A. MacMullen
{"title":"The Microwave Component Analyzer: A Novel Instrument for Measuring Pulsed or CW Signal-to-Noise Ratio","authors":"L. Hoover, A. MacMullen","doi":"10.1109/ARFTG.2000.327434","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327434","url":null,"abstract":"The Microwave Component Analyzer (MCA) is introduced as a novel instrument for making automated signal-to-noise ratio (SNR) measurements in pulsed or CW mode. With an advanced vector demodulator, the MCA converts a microwave signal into error-corrected I (In-phase) and Q (Quadrature-phase) digitized signals. Utilizing a rotating phase reference technique, vector demodulator linear distortions are automatically error-corrected with an internal self-calibration. High-speed digital signal processing of the I and Q signals results in the ability to make real-time measurements of SNR. The noise behavior of a pulsed amplifier in compression is measured by the MCA and the results are compared to theory.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122785737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electro-optic sampling of coplanar to coaxial transitions to enhance the calibration of fast oscilloscopes 共面到同轴转换的电光采样提高了快速示波器的校准
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327439
Andrew J. A. Smith, A. Roddie, P. Woolliams
{"title":"Electro-optic sampling of coplanar to coaxial transitions to enhance the calibration of fast oscilloscopes","authors":"Andrew J. A. Smith, A. Roddie, P. Woolliams","doi":"10.1109/ARFTG.2000.327439","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327439","url":null,"abstract":"Improvements to the NPL time domain measurement facility for the calibration of fast oscilloscope risetime are described. Particular emphasis is placed on characterising a coplanar waveguide to coaxial connector transition between a photoconductive pulse generator and the input of an oscilloscope sampling head. Two methods of measuring the transition are described and it is shown that test electrical pulses of less than 4 ps width can be applied to the oscilloscope.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129796355","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Accurate Characterization of Fringing Effects at On-Chip Line Steps 片上线阶边效应的精确表征
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327445
T. Winkel, L. S. Dutta, H. Grabinski
{"title":"Accurate Characterization of Fringing Effects at On-Chip Line Steps","authors":"T. Winkel, L. S. Dutta, H. Grabinski","doi":"10.1109/ARFTG.2000.327445","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327445","url":null,"abstract":"The electrical scattering field at steps on interconnects can be taken into account by a virtual additional line length of the wider line [1]. This effect must be taken into account when characterizing on and off-chip interconnects with discontinuities. The theory will be discussed and measurement results will be presented.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124303244","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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