片上线阶边效应的精确表征

56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI:10.1109/ARFTG.2000.327445

T. Winkel, L. S. Dutta, H. Grabinski

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引用次数: 1

摘要

互连步骤处的电散射场可以通过宽线的虚拟附加线长来考虑[1]。当表征带有不连续的片上和片外互连时，必须考虑到这种影响。理论将被讨论和测量结果将被提出。

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Accurate Characterization of Fringing Effects at On-Chip Line Steps

The electrical scattering field at steps on interconnects can be taken into account by a virtual additional line length of the wider line [1]. This effect must be taken into account when characterizing on and off-chip interconnects with discontinuities. The theory will be discussed and measurement results will be presented.

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56th ARFTG Conference Digest

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