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Experimental Results for Parasitic Coupling and Attenuation of Coplanar Waveguides on High Resistivity Silicon 高阻硅上共面波导寄生耦合与衰减的实验结果
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327426
B. Lakshminarayanan, T. Weller
{"title":"Experimental Results for Parasitic Coupling and Attenuation of Coplanar Waveguides on High Resistivity Silicon","authors":"B. Lakshminarayanan, T. Weller","doi":"10.1109/ARFTG.2000.327426","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327426","url":null,"abstract":"In high density MMIC circuits, parasitic coupling becomes a critical design consideration and adequate spacing between closely placed circuits is necessary to avoid unwanted interaction. In this paper, a measurement-based estimate for minimum spacing required between CPW lines fabricated on silicon is presented. It is shown that parasitic coupling between CPW lines can be reduced by a factor of 10dB if the silicon substrate around the ground plane is etched. Measured results for attenuation are also presented for CPW lines fabricated on a 425¿m thick Si substrate using 1¿m layers of either high temperature oxide (HTO) or evaporated SiO. It is shown that the loss on SiO is 3× lower when compared to SiO2 - based configurations.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124420983","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Overview of applications of optical measurements in microwave circuit and antenna array design 光学测量在微波电路和天线阵列设计中的应用综述
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327440
M. Weiss, J. Whitaker, Z. Popovic
{"title":"Overview of applications of optical measurements in microwave circuit and antenna array design","authors":"M. Weiss, J. Whitaker, Z. Popovic","doi":"10.1109/ARFTG.2000.327440","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327440","url":null,"abstract":"An overview of both photoconductive sampling and optoelectronic mapping measurements (developed at the University of Michigan by the Whitaker and Katehi group) and their benefit in expediting microwave circuit and array design is presented. In particular, photoconductively sampled time-domain waveforms of switched-mode nonlinear power amplifiers and X-band and high-efficiency multipliers at C-band will be discussed. The high-impedance optical sampling probe enables measurements of waveforms within a microwave circuit. This in turn enables us to validate designs of nontraditional nonlinear circuits, as well as to diagnose problems associated with improperly terminated harmonics, leading to new improved circuit designs. We also present near-field measurements using an electro-optic crystal probe. As an example, a 30 GHz (Ka-band) active amplifier antenna array power combiner is examined in detail. The effects of mutual coupling between array elements, and bias line influence on RF mutual coupling between elements are presented. An extensive list of references that contain more details of the overviewed material is also given.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125978456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Millimeter Wave Vector Analysis Calibration and Measurement Problems Caused by Common Waveguide Irregularities 常见波导不规则引起的毫米波矢量分析、校准和测量问题
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327428
C. Oleson, A. Denning
{"title":"Millimeter Wave Vector Analysis Calibration and Measurement Problems Caused by Common Waveguide Irregularities","authors":"C. Oleson, A. Denning","doi":"10.1109/ARFTG.2000.327428","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327428","url":null,"abstract":"This paper was prompted by an effort to develop vector network analysis calibration kits for the WR-08 through WR-03 waveguide bands. A lack of repeatability (instability) of vector network analyzer (VNA) calibrations above 90 GHz was encountered which led to the investigation of not only the calibration kit artifacts but into the ¿MIL SPECS MIL.-F-3922/67B-xxx¿ defined tolerances and actual properties of commonly available components for these waveguide bands. The following frequent sources of errors were identified: 1) The common tendency of waveguide at these frequencies to be oversize causing the incorrect entry of the waveguide¿s cutoff frequency during VNA calibration. 2) Significant waveguide flange misalignment possible with current MIL SPECS specified tolerances with no widely accepted technique for precise alignment. 3) Common waveguide component irregularities that occur due to inadequately developed manufacturing and assembly processes and that are so small that they can only be discovered with microscopic examination.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132220176","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 38
Modeling Load Variations with Artificial Neural Networks to Improve On-Wafer OSLT Calibrations 用人工神经网络建模负载变化以改善片上OSLT校准
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327430
J. Jargon, P. Kirby, K. Gupta, L. Dunleavy, T. Weller
{"title":"Modeling Load Variations with Artificial Neural Networks to Improve On-Wafer OSLT Calibrations","authors":"J. Jargon, P. Kirby, K. Gupta, L. Dunleavy, T. Weller","doi":"10.1109/ARFTG.2000.327430","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327430","url":null,"abstract":"We demonstrate that on-wafer open-short-load-thru (OSLT) calibrations of vector network analyzers can be improved by applying artificial neural networks (ANNs) to model the correlation between DC resistance and RF variations in load terminations. The ANNs are trained with measurement data obtained from a benchmark multiline thru-reflect-line (TRL) calibration. The open, short, and thru standards do not vary significantly from wafer to wafer, so we also model these standards using ANNs trained with calibrated measurement data chosen from an arbitrary wafer. We assess the accuracy of five OSLT calibrations with varying load terminations using the ANN-modeled standards, and find that they compare favorably (a difference of less than 0.04 in magnitude at most frequencies) to the benchmark multiline TRL calibration over a 66 GHz bandwidth. We demonstrate that ANN models offer a number of advantages over using calibrated measurement files or equivalent circuit models, including ease of use, reduced calibration times, and compactness.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131488477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers 不同金属化层中耦合CMOS互连的高频特性
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327425
U. Arz, Dylan F. Williams, D. Walker, H. Grabinski
{"title":"High-Frequency Behavior of Coupled CMOS Interconnects Built in Different Metallization Layers","authors":"U. Arz, Dylan F. Williams, D. Walker, H. Grabinski","doi":"10.1109/ARFTG.2000.327425","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327425","url":null,"abstract":"In this paper we apply a broadband measurement method to determine the propagation characteristics of coupled-line structures fabricated in different metallization layers of a 0.25 ¿m CMOS technology. We show that the matrices of frequency-dependent line parameters, as extracted from calibrated four-port S-parameter measurements, agree well with data predicted by numerical calculations, and discuss the impact of metal level height above the substrate on the transmission characteristics.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121389490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Picosecond pulse propagation images and oppositely polarized pulse shapes on CPS lines measured by a Scanning Force Optoelectronic Microscope 皮秒脉冲传播图像和对极化脉冲形状的CPS线上测量扫描力光电显微镜
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327438
Y. Kasahara, K. Takeuchi, A. Mizuhara, K. Mizuno
{"title":"Picosecond pulse propagation images and oppositely polarized pulse shapes on CPS lines measured by a Scanning Force Optoelectronic Microscope","authors":"Y. Kasahara, K. Takeuchi, A. Mizuhara, K. Mizuno","doi":"10.1109/ARFTG.2000.327438","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327438","url":null,"abstract":"We have developed a novel ultra-fast voltage measurement system, the scanning force optoelectronic microscope (SFOEM), by integrating a scanning force microscope (SFM) and an optical sampling technique. This paper describes a method by which a 2ps pulse propagation image directed along the edge of a coplanar strip (CPS) has been recorded using the SFOEM. It also describes how oppositely polarized pulses on each line of the CPS were measured by the SFOEM. These results demonstrate that the SFOEM is a useful tool not only for measuring ultra-fast voltage and pulse propagation images but also for analyzing the operation of ultra-fast LSI devices.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122670710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Aberration measurement of fast pulse generators using sampling oscilloscopes 用采样示波器测量快速脉冲发生器的像差
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327444
Andrew J. A. Smith, A. Roddie, P. Woolliams, M. Harper
{"title":"Aberration measurement of fast pulse generators using sampling oscilloscopes","authors":"Andrew J. A. Smith, A. Roddie, P. Woolliams, M. Harper","doi":"10.1109/ARFTG.2000.327444","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327444","url":null,"abstract":"The definition, measurement, and traceability of aberrations in pulse waveform metrology is discussed. The use of reference waveforms and masks allows the definition of aberrations within specific regions relative to the transition point of a pulse generator, as desired by manufacturers and users. Of particular importance is the definition of aberrations for specific bandwidths, often required by the end user. An attempt has been made to identify anomalous structure and its source, whether in the oscilloscope or pulse generator. By using the information obtained it is now possible to correct a pulse generator waveform to a much more realistic shape and with a better correspondence to dc amplitude calibration values.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128453094","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A Quasi-Coherent Sampling Method for Wideband Data Acquisition 宽带数据采集的准相干采样方法
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327424
M. Kimura, Kensuke Kobayashi, Haruo Kobayashi
{"title":"A Quasi-Coherent Sampling Method for Wideband Data Acquisition","authors":"M. Kimura, Kensuke Kobayashi, Haruo Kobayashi","doi":"10.1109/ARFTG.2000.327424","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327424","url":null,"abstract":"This paper proposes a quasi-coherent equivalent-time sampling method to acquire repetitive wideband waveform signals with high throughput. We have already proposed a new sampling system which incorporates the pretrigger ability and the time jitter reduction function for a fluctuated input signal while maintaining the waveform recording efficiency. The quasi-coherent sampling method proposed in this paper can be adopted to it in order to improve its data acquisition throughput significantly. Numerical simulation results show effectiveness of our proposed method.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117118790","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Accurate Probing of RF Amplifiers Using Vertical Interconnect Boards 使用垂直互连板的射频放大器的精确探测
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327427
K. Naishadham
{"title":"Accurate Probing of RF Amplifiers Using Vertical Interconnect Boards","authors":"K. Naishadham","doi":"10.1109/ARFTG.2000.327427","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327427","url":null,"abstract":"Printed circuit boards with plug-in pins and edge-connectors for insertion into appropriate sockets on a mother-board are used in the electronics industry as functional circuit blocks. For example, functions such as additional RAM can be added to a personal computer by inserting cards with edge connectors to mate with the CPU mother-board. In RF amplifiers used in high-speed data transmission, video communication and broadband cable television, plug-in circuit boards save considerable real estate on the mother-board and facilitate plug-and-play convenience. At RF and microwave frequencies, it is very important to characterize the pin-socket interface on the mother-board so that the influence of its mismatch and other parasitic effects can be incorporated in the circuit design. In this paper, we discuss a calibration technique to compensate for such mismatch, and present measured data on a high-gain amplifier.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121318808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Mismatch Corrections for Electro-Optic Sampling Systems 电光采样系统的失配校正
56th ARFTG Conference Digest Pub Date : 2000-11-01 DOI: 10.1109/ARFTG.2000.327447
Dylan F. Williams, P. Hale, T. Clement, J. M. Morgan
{"title":"Mismatch Corrections for Electro-Optic Sampling Systems","authors":"Dylan F. Williams, P. Hale, T. Clement, J. M. Morgan","doi":"10.1109/ARFTG.2000.327447","DOIUrl":"https://doi.org/10.1109/ARFTG.2000.327447","url":null,"abstract":"We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the electro-optic sampling system measures voltage waveforms. We demonstrate the technique by determining the power spectrum of a photoreceiver¿s optical impulse response.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133031372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
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