Dylan F. Williams, P. Hale, T. Clement, J. M. Morgan
{"title":"电光采样系统的失配校正","authors":"Dylan F. Williams, P. Hale, T. Clement, J. M. Morgan","doi":"10.1109/ARFTG.2000.327447","DOIUrl":null,"url":null,"abstract":"We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the electro-optic sampling system measures voltage waveforms. We demonstrate the technique by determining the power spectrum of a photoreceiver¿s optical impulse response.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"35 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":"{\"title\":\"Mismatch Corrections for Electro-Optic Sampling Systems\",\"authors\":\"Dylan F. Williams, P. Hale, T. Clement, J. M. Morgan\",\"doi\":\"10.1109/ARFTG.2000.327447\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the electro-optic sampling system measures voltage waveforms. We demonstrate the technique by determining the power spectrum of a photoreceiver¿s optical impulse response.\",\"PeriodicalId\":166771,\"journal\":{\"name\":\"56th ARFTG Conference Digest\",\"volume\":\"35 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"27\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"56th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2000.327447\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"56th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2000.327447","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Mismatch Corrections for Electro-Optic Sampling Systems
We develop and apply frequency-domain mismatch corrections to a temporal electro-optic sampling system. We use these corrections to characterize the magnitude and phase of electrical sources that are physically far removed from the point at which the electro-optic sampling system measures voltage waveforms. We demonstrate the technique by determining the power spectrum of a photoreceiver¿s optical impulse response.