Microwave Electric-Field Mapping Using Optical-Fiber-Mounted Electro-Optic Probes

K. Yang, J. Whitaker, L. Katehi
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Abstract

A microwave electric-field mapping system based on electro-optic sampling has been developed using micromachined gallium arsenide crystals mounted on gradient-index lenses and single-mode optical fibers. Three orthogonal polarization components of the electric field are distinguished, and two-dimensional field images are obtained by scanning the fiber-based probes in a plane above the device under test. Because the probes are simple dielectrics and require no metal or electrodes to extract the electric field amplitude and phase, they are uniquely useful in the imaging of the aperture-plane region of antennas and arrays, where they provide complete information on radiated, guided, and evanescent waves. Due to the high level of versatility afforded by the optical-fiber coupling, this diagnostic testing can be extended not only to open, guided-wave structures, but also to shielded microwave circuits and packages.
利用光纤光电探针进行微波电场测绘
利用安装在梯度折射率透镜和单模光纤上的微机械砷化镓晶体,研制了一种基于电光采样的微波电场测绘系统。区分了电场的三个正交偏振分量,并通过在被测器件上方的平面上扫描光纤探针获得了二维场图像。由于探针是简单的电介质,不需要金属或电极来提取电场振幅和相位,因此它们在天线和阵列的孔平面区域成像中非常有用,在那里它们提供了辐射、引导和倏逝波的完整信息。由于光纤耦合提供了高水平的通用性,这种诊断测试不仅可以扩展到开放的导波结构,还可以扩展到屏蔽微波电路和封装。
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