{"title":"GaAs上CPW和微带SOLT标准的负载模型","authors":"P. Kirby, L. Dunleavy, T. Weller","doi":"10.1109/ARFTG.2000.327432","DOIUrl":null,"url":null,"abstract":"We present an analysis of the types of models typically available within modern network analyzers for Short-Open-Load-Through (SOLT) calibrations. We find that the models for the reflect standards effectively handle their task. We also show that in some cases for well-behaved loads the analyzer models adequately handle the job, while in other cases fall short. This analysis was carried out for both microstrip and coplanar waveguide transmission line structures realized on GaAs substrates. We also explore how more complicated load models might be used to provide improved fits to measured data of on-wafer loads.","PeriodicalId":166771,"journal":{"name":"56th ARFTG Conference Digest","volume":"3 2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2000-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"8","resultStr":"{\"title\":\"Load Models for CPW and Microstrip SOLT Standards on GaAs\",\"authors\":\"P. Kirby, L. Dunleavy, T. Weller\",\"doi\":\"10.1109/ARFTG.2000.327432\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We present an analysis of the types of models typically available within modern network analyzers for Short-Open-Load-Through (SOLT) calibrations. We find that the models for the reflect standards effectively handle their task. We also show that in some cases for well-behaved loads the analyzer models adequately handle the job, while in other cases fall short. This analysis was carried out for both microstrip and coplanar waveguide transmission line structures realized on GaAs substrates. We also explore how more complicated load models might be used to provide improved fits to measured data of on-wafer loads.\",\"PeriodicalId\":166771,\"journal\":{\"name\":\"56th ARFTG Conference Digest\",\"volume\":\"3 2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2000-11-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"8\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"56th ARFTG Conference Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ARFTG.2000.327432\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"56th ARFTG Conference Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG.2000.327432","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Load Models for CPW and Microstrip SOLT Standards on GaAs
We present an analysis of the types of models typically available within modern network analyzers for Short-Open-Load-Through (SOLT) calibrations. We find that the models for the reflect standards effectively handle their task. We also show that in some cases for well-behaved loads the analyzer models adequately handle the job, while in other cases fall short. This analysis was carried out for both microstrip and coplanar waveguide transmission line structures realized on GaAs substrates. We also explore how more complicated load models might be used to provide improved fits to measured data of on-wafer loads.