17th International Reliability Physics Symposium最新文献_第4页

Characteristics of a Surface Conductivity Moisture Monitor for Hermetic Integrated Circuit Packages 密封集成电路封装表面导电性水分监测仪的特性

17th International Reliability Physics Symposium Pub Date : 1979-04-01 DOI: 10.1109/IRPS.1979.362877

R. Lowry, L. A. Miller, A. Jonas, J. Bird

引用次数: 8

PMOS Dynamic RAM Reliability = A Case Study PMOS动态RAM可靠性=一个案例研究

17th International Reliability Physics Symposium Pub Date : 1979-04-01 DOI: 10.1109/IRPS.1979.362896

C. Green

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引用次数: 9

Analysis of Dynamic RAM's by Use of Alpha Irradiation 用α辐照法分析动态RAM

17th International Reliability Physics Symposium Pub Date : 1979-04-01 DOI: 10.1109/IRPS.1979.362867

G. Schindlbeck

引用次数: 4

Moisture-Induced Aluminum Corrosion and Stress on the Chip in Plastic-Encapsulated LSIs 湿致铝腐蚀及塑料封装lsi芯片上的应力

17th International Reliability Physics Symposium Pub Date : 1979-04-01 DOI: 10.1109/IRPS.1979.362879

H. Inayoshi, K. Nishi, S. Okikawa, Y. Wakashima

引用次数: 34

A Metallographic Test for Glass-To-Metal Seal Quality 玻璃-金属密封质量的金相检验

17th International Reliability Physics Symposium Pub Date : 1979-04-01 DOI: 10.1109/IRPS.1979.362870

J. Mccormick, L. Zakraysek

引用次数: 6

Accelerated Stress Testing of Terrestrial Solar Cells 地面太阳能电池加速应力测试

17th International Reliability Physics Symposium Pub Date : 1900-01-01 DOI: 10.1109/IRPS.1979.362874

J. Prince, J. Lathrop, F. W. Morgan, E. Royal, G. Witter

引用次数: 6