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Proceedings of IEEE Symposium on Electromagnetic Compatibility最新文献

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Recent and potential changes to the US EMC regulatory requirements 美国EMC法规要求的最新和潜在变化
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385693
L. A. Wall
{"title":"Recent and potential changes to the US EMC regulatory requirements","authors":"L. A. Wall","doi":"10.1109/ISEMC.1994.385693","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385693","url":null,"abstract":"Over the past few years, the Federal Communications Commission (FCC) has made a number of substantial changes to its Rules for controlling unwanted radio frequency (RF) emissions from electronic apparatus to protect radio communications in the USA. The most notable change has been the adoption and use of the international standard CISPR Publication 22 for computers and similar information technology equipment. Because of the trend towards globalization of markets, the FCC is considering additional changes to its Rules, particularly in the area of conformity assessment. An update of the FCC Rules and some insights of staff thinking for proposed changes to the Rules are discussed.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127857558","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Anechoic chamber having multi-layer electromagnetic wave absorbers of sintered ferrite and ferrite composite membrane 由烧结铁氧体和铁氧体复合膜制成的多层电磁波吸收器消声室
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385624
Y. Naito, Tetsuya Mizumoto, Michiharu Tkahashi, Sumio Kunieda
{"title":"Anechoic chamber having multi-layer electromagnetic wave absorbers of sintered ferrite and ferrite composite membrane","authors":"Y. Naito, Tetsuya Mizumoto, Michiharu Tkahashi, Sumio Kunieda","doi":"10.1109/ISEMC.1994.385624","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385624","url":null,"abstract":"The structure of the multi-layer electromagnetic wave absorber composed of sintered ferrite and ferrite composite membrane is proposed to improve radiowave absorbing characteristics. The absorption characteristics of the multi-layer absorber can be largely extended compared with the single sintered ferrite layer. Moreover, it is shown that the site attenuation characteristics satisfy the FCC standard for 3 m and 10 m transmission distance (3 m method and 10 m method) in the anechoic chambers in which the novel absorbers are fitted. The wall thickness of the novel anechoic chamber can be made thinner of less than 90 mm. Consequently, the anechoic chamber for the 3 m method can reduce its installation area to about 60% of the conventional one.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128977032","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Shield degradation in the presence of external conductors 外部导体存在时屏蔽退化
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385648
B. L. Brench, C. Brench
{"title":"Shield degradation in the presence of external conductors","authors":"B. L. Brench, C. Brench","doi":"10.1109/ISEMC.1994.385648","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385648","url":null,"abstract":"When an external conductor is located in close proximity to apertures in an EMI shield the amount of energy coupled through these apertures can be greatly increased. Earlier work by the authors was limited to problems where the geometry was small compared to the wavelength of interest. Using the finite difference time domain (FDTD) technique a solution can be found for much larger geometries. A variety of geometries have been analyzed and the findings are presented in this paper.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"747 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117022455","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A study of radiated electromagnetic susceptibility test requirements and procedures 研究了辐射电磁敏感性试验的要求和程序
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385686
J. Berry, S.G. Hicks
{"title":"A study of radiated electromagnetic susceptibility test requirements and procedures","authors":"J. Berry, S.G. Hicks","doi":"10.1109/ISEMC.1994.385686","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385686","url":null,"abstract":"An investigation of test requirements described in several standards on radiated electromagnetic susceptibility (RES) was performed. Electric field strength variations were measured in two semianechoic chambers for several positions of the transmit antenna. A study was performed to determine the proper frequency step size for RES testing. A small receiving circuit was placed in the center of several metal structures typical of a personal computer. The frequency of an incident signal was varied and the receiving circuit's response was observed. The circuit's response was also measured when the positions of the structures were varied.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129229543","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
An improved method of characterizing shielding materials 一种表征屏蔽材料的改进方法
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385657
D.C. Smith, C. Herring, R. Haynes
{"title":"An improved method of characterizing shielding materials","authors":"D.C. Smith, C. Herring, R. Haynes","doi":"10.1109/ISEMC.1994.385657","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385657","url":null,"abstract":"Shielding materials have traditionally been measured using plane waves. For a significant number of applications, measurement using a perpendicular magnetic field is more appropriate. This paper reports on a method of characterizing shielding materials using a perpendicular magnetic field. Many properties of shielding materials can be easily determined by this method which is especially suited for coated or loaded plastics. Results for several commonly available shielding materials are presented and compared to plane wave, far field measurements.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116404416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Measurement techniques for coupling characterisation inside CMOS integrated circuits CMOS集成电路内部耦合特性的测量技术
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385655
J. Fourniols, E. Sicard, C. Garres
{"title":"Measurement techniques for coupling characterisation inside CMOS integrated circuits","authors":"J. Fourniols, E. Sicard, C. Garres","doi":"10.1109/ISEMC.1994.385655","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385655","url":null,"abstract":"In this paper, techniques for crosstalk coupling modelling, simulation and measurement are proposed. A coupling model including capacitance and substrate effects is used for SPICE simulations for a given pair of inverters with varying size ratios and substrate resistivities. A technique is proposed for the measurement of the crosstalk noise based on RS latch sensors. An experimental implementation of the sensors in a 1.0 /spl mu/m CMOS technology is presented and the crosstalk measurements are compared to the simulation predictions. The results show high crosstalk noise close from the commutation point of the logic. Forecasts concerning submicron technologies are presented together with new sensor implementations.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114295193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Equivalent circuit models of via interactions in electronics packaging 电子封装中通孔相互作用的等效电路模型
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385628
Yuzhe Chen, Zhonghua Wu, Yaowu Liu, J. Fang
{"title":"Equivalent circuit models of via interactions in electronics packaging","authors":"Yuzhe Chen, Zhonghua Wu, Yaowu Liu, J. Fang","doi":"10.1109/ISEMC.1994.385628","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385628","url":null,"abstract":"This paper presents the SPICE-type of equivalent circuit models for via interactions between conducting planes. These equivalent circuit models are derived from the radial transmission line theory. Transient simulation results from SPICE with our models are in excellent agreement with those from the inverse Fourier transformation of frequency domain solutions. These models can be used in various applications, such as the simulation of Delta-I noise in electronics packaging.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126476086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Time-domain analysis of field-excited transmission line systems by using model-based parameter estimation 基于模型参数估计的励磁输电系统时域分析
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385650
M. D'amore, M. S. Sarto
{"title":"Time-domain analysis of field-excited transmission line systems by using model-based parameter estimation","authors":"M. D'amore, M. S. Sarto","doi":"10.1109/ISEMC.1994.385650","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385650","url":null,"abstract":"The time-domain analysis of field-excited lossy transmission line (TL) networks with nonlinear loads is based on the nodal approach in the time-domain. The computation of the nodal admittance or impedance matrix coefficients of the linear part of the network is required in the frequency-domain, in order to obtain the corresponding transient functions by the inverse discrete Fourier transform (DFT). The model-based parameter estimation (MBPE) technique is applied to improve the efficiency of the method in case of large-dimension configurations. The developed procedure allows to represent transcendent functions over very wide bandwidths by using only the coefficients of their rational approximating functions. Good accuracy and considerable reduction of the computation-time are achieved. The EMP-induced effects on three signal mesh-type networks, having increasing geometrical complexity, with nonlinear loads, are calculated in order to assess the efficiency of the proposed method.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133885090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
New insights on absorptive ferrite tiles temperature behaviour of reflectivity 吸收性铁氧体瓦温度反射率的新认识
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385625
F. Mayer
{"title":"New insights on absorptive ferrite tiles temperature behaviour of reflectivity","authors":"F. Mayer","doi":"10.1109/ISEMC.1994.385625","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385625","url":null,"abstract":"Ferrite tiles are used as absorbers for the 30 MHz-1000 MHz EMC frequency range: the important influence of temperature variations, related to low Curie temperatures and variations of low frequency permeability are considered. Related specifications for commercial tiles are proposed.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130260465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Upset thresholds of various systems as measured by the R/sup 2/SPG technique 用R/sup /SPG技术测量各种系统的扰动阈值
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385649
L. Hoeft, W.H. Cordova, R. Karaskiewicz, G. McArthur, B. Spalding, J. Hofstra, M. Jump, C.S. Jones, R.I. Needy
{"title":"Upset thresholds of various systems as measured by the R/sup 2/SPG technique","authors":"L. Hoeft, W.H. Cordova, R. Karaskiewicz, G. McArthur, B. Spalding, J. Hofstra, M. Jump, C.S. Jones, R.I. Needy","doi":"10.1109/ISEMC.1994.385649","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385649","url":null,"abstract":"The upset thresholds of five systems were determined using the Repetitive Random Square-wave Pulse Generator (R/sup 2/SPG) technique. These systems included an AT class personal computer, a large digitally controlled communication system, a data display sub-system for a communication system, two radars and a point defense system. If the upset threshold was within the limits of the test program and the capabilities of the R/sup 2/SPG, significant upsets generally required 3 to 10 Amperes, even in unhardened systems. \"Snow\" on visual displays occurred at smaller currents. As expected, some of the more modern systems had lower thresholds and more frequent upsets than older systems with less digital circuitry. However, some digital systems were found to be immune to upset of damage up to very high levels. None of the systems were damaged by the test. This tentatively confirms the statement that \"upset occurs before damage.\".<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129687985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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