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Proceedings of IEEE Symposium on Electromagnetic Compatibility最新文献

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The application of moment methods to the broadband analysis of radiating planar circuits 矩量法在平面辐射电路宽带分析中的应用
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385639
J. Mclean, H. Foltz
{"title":"The application of moment methods to the broadband analysis of radiating planar circuits","authors":"J. Mclean, H. Foltz","doi":"10.1109/ISEMC.1994.385639","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385639","url":null,"abstract":"The use of moment method techniques for broadband analysis of radiating planar circuits is considered. First, the various approaches to the application of moment method techniques to the analysis of planar transmission line structures are reviewed. Difficulties encountered in extending these techniques over large bandwidths are then discussed. Finally, a method for obtaining accurate broadband data via a combination of moment methods and quasi-static analysis is presented and applied to an example of a radiating planar circuit structure.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116797515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Modeling power bus decoupling on multilayer printed circuit boards 多层印刷电路板上电源总线去耦建模
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385605
J. Drewniak, T. Hubing, T. P. Vandoren, P. Baudendistal
{"title":"Modeling power bus decoupling on multilayer printed circuit boards","authors":"J. Drewniak, T. Hubing, T. P. Vandoren, P. Baudendistal","doi":"10.1109/ISEMC.1994.385605","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385605","url":null,"abstract":"Power bus decoupling designs on multilayer printed circuit boards must adequately account for the power bus interplane capacitance and its consequences for the design. Lumped element models for a power bus on a multilayer printed circuit board where an appreciable or entire portion of a layer is devoted to power and ground have been developed. The models are applicable below the distributed resonances of the board. Analytical, circuit simulation, and experimental studies have been conducted to test the models, investigate the effects of the distributed interplane capacitance of the power bus, and the effect of interconnect inductance associated with surface-mount decoupling capacitors.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116140064","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 25
Optimal cable screening braids determined by a computer-aided statistical planning method 用计算机辅助统计规划方法确定最优电缆屏蔽编织
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385689
M. Kirschvink, P. Vroomen
{"title":"Optimal cable screening braids determined by a computer-aided statistical planning method","authors":"M. Kirschvink, P. Vroomen","doi":"10.1109/ISEMC.1994.385689","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385689","url":null,"abstract":"The design of cable braids is still based on experience and experiments because a correct modelization of the transfer impedance is not showing correct results if all the construction parameters of a braid are taken into account. A computer-aided statistical planning method allows one to calculate a maximum of figures by making a minimum number of experiments. The method is presented, practical results of improvements on known cable constructions are shown, the measurement procedures based on the triaxial measurement method and the current injection method, are given with practical hints.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116571768","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
EMC in power electronic devices: radiated emissions from a silicon controlled rectifier 电力电子器件中的电磁兼容:可控硅整流器的辐射发射
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385641
A. Orlandi, R. Scheich
{"title":"EMC in power electronic devices: radiated emissions from a silicon controlled rectifier","authors":"A. Orlandi, R. Scheich","doi":"10.1109/ISEMC.1994.385641","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385641","url":null,"abstract":"During the last decade, great achievements in the field of power electronics have significantly contributed to its promotion in all areas of engineering. However, its evolution to an indispensable factor in today's industrial applications has also involved a certain number of problems which have not yet been studied thoroughly or completely solved. For instance, the electromagnetic interference emanating from power converters in particular frequency ranges. The aim or this paper is to identify the main sources of radiated noise emission from a silicon controlled rectifier (SCR) by means of the correlation between common mode currents and electromagnetic field measurements. Moreover, an equivalent radiation model is to be developed enabling emission level prediction in the design phase when compliance of the device with international standard regulations is to be verified. Direct measurements of common mode current spectra and the E-field emanating from a SCR bridge allow the correlation between them to be found, thus identifying the origin of the radiation. Both time domain waveforms and the corresponding spectra are monitored for several operation points at different locations on the set-up. Field measurements are also carried out for each operating point for vertical and horizontal polarization. The study has yielded a number of interesting results concerning the identification of the main common mode current propagation paths and their radiating effects.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129603911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Analysis of the measured field structure in a GTEM 1750 GTEM 1750实测场结构分析
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385667
D. Hansen, D. Ristau, T. Spaeth, W. Radasky, K.S. Smith, J. Gilbert
{"title":"Analysis of the measured field structure in a GTEM 1750","authors":"D. Hansen, D. Ristau, T. Spaeth, W. Radasky, K.S. Smith, J. Gilbert","doi":"10.1109/ISEMC.1994.385667","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385667","url":null,"abstract":"An experimental field mapping (x, y, z components) of a GTEM 1750 has been performed in important parts and locations of this asymmetrical waveguide. The measurement results of deviations from the perfect TEM wave reveal some non TEM components as a function of exciting frequency and measurement location. A review of the present state of theoretical and experimental research with respect to immunity is given. An attempt is made to simulate a generic GTEM 500 section by using a 3-D finite difference time domain code. A comparison with measured data is presented, including the analysis of fundamental problems in the presently used standardized field sensor instrumentation.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124605053","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Modeling leakage through finite apertures with TLM 用TLM模型模拟有限孔径泄漏
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385681
C. Kraft
{"title":"Modeling leakage through finite apertures with TLM","authors":"C. Kraft","doi":"10.1109/ISEMC.1994.385681","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385681","url":null,"abstract":"It is well known that the shielding effectiveness of a metal barrier is totally determined by any apertures cut in it. What is not completely clear from previous experimental and theoretical work is the relationship between the size of holes, their number, their shape, and the total shielding effectiveness as a function of frequency. The author derives empirical formulas for shielding effectiveness based on simulations of plane waves impinging on metal barriers with slots. He uses the 3-dimensional transmission line matrix method (TLM) along with absolute power flux transfer through the slot to compare various slot combinations. He also compares patterns and far field behavior using the method of equivalent magnetic currents.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123394038","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 45
Beltrami-Maxwell postulates for time-varying electromagnetism in materials 贝尔特拉米-麦克斯韦假定材料中的时变电磁学
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385636
A. Lakhtakia
{"title":"Beltrami-Maxwell postulates for time-varying electromagnetism in materials","authors":"A. Lakhtakia","doi":"10.1109/ISEMC.1994.385636","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385636","url":null,"abstract":"The Beltrami-Maxwell postulates are discussed as an autonomous system. Their conjugate invariance and applicability to linear materials are explored. Finally, they are retrofitted into the Maxwell postulates for time-varying electromagnetic fields.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123402657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Mutual recognition agreements for product sales into the European Union 产品销售到欧盟的相互承认协议
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385618
D. Green
{"title":"Mutual recognition agreements for product sales into the European Union","authors":"D. Green","doi":"10.1109/ISEMC.1994.385618","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385618","url":null,"abstract":"The paper covers the need for manufacturers to be aware of the certification and testing requirements of the European Union. It raises the issue of the need for acceptable quality management systems, both in house with manufacturers and with test laboratories, in order that the European Union may have confidence in the results that are being achieved and therefore accept the standards that are required to achieve mutual recognition agreements between the European Union and the US. Issues associated with the standards of testing, certification of test laboratories and the establishment of competent and notified bodies are also raised.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121688317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Total cable EM environmental protection using an internally protected universal ground adapter (IPUGA) 内置保护通用接地适配器(IPUGA)总电缆电磁环保
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385643
D. Dixon
{"title":"Total cable EM environmental protection using an internally protected universal ground adapter (IPUGA)","authors":"D. Dixon","doi":"10.1109/ISEMC.1994.385643","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385643","url":null,"abstract":"Today's \"noisy\" commercial electromagnetic environment (EME) sometimes approaches the higher level and potentially hostile environments traditionally encountered by some military equipment. The need to operate either commercial or military electronic equipment's in the vicinity of these high level environments provides an incentive to develop an internally protected universal ground adapter that will provide electromagnetic interference (EMI) protection for both cable shields, shield conduits and all of its internal conductors.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127621961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
CISPR conducted emissions measurements on telecommunications leads: an improved test proposal CISPR对电信引线进行了排放测量:改进的测试建议
Proceedings of IEEE Symposium on Electromagnetic Compatibility Pub Date : 1994-08-22 DOI: 10.1109/ISEMC.1994.385652
D.C. Smith
{"title":"CISPR conducted emissions measurements on telecommunications leads: an improved test proposal","authors":"D.C. Smith","doi":"10.1109/ISEMC.1994.385652","DOIUrl":"https://doi.org/10.1109/ISEMC.1994.385652","url":null,"abstract":"Proposed CISPR conducted emissions limits address interference to radio services below 30 MHz. With respect to data transmission, these requirements only address unshielded twisted pair (UTP) cable. This paper proposes a test method for shielded twisted pair (STP) cable with supporting data as well as a modified method for UTP cable.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126344463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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