{"title":"一种表征屏蔽材料的改进方法","authors":"D.C. Smith, C. Herring, R. Haynes","doi":"10.1109/ISEMC.1994.385657","DOIUrl":null,"url":null,"abstract":"Shielding materials have traditionally been measured using plane waves. For a significant number of applications, measurement using a perpendicular magnetic field is more appropriate. This paper reports on a method of characterizing shielding materials using a perpendicular magnetic field. Many properties of shielding materials can be easily determined by this method which is especially suited for coated or loaded plastics. Results for several commonly available shielding materials are presented and compared to plane wave, far field measurements.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"64 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"An improved method of characterizing shielding materials\",\"authors\":\"D.C. Smith, C. Herring, R. Haynes\",\"doi\":\"10.1109/ISEMC.1994.385657\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Shielding materials have traditionally been measured using plane waves. For a significant number of applications, measurement using a perpendicular magnetic field is more appropriate. This paper reports on a method of characterizing shielding materials using a perpendicular magnetic field. Many properties of shielding materials can be easily determined by this method which is especially suited for coated or loaded plastics. Results for several commonly available shielding materials are presented and compared to plane wave, far field measurements.<<ETX>>\",\"PeriodicalId\":154914,\"journal\":{\"name\":\"Proceedings of IEEE Symposium on Electromagnetic Compatibility\",\"volume\":\"64 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-08-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of IEEE Symposium on Electromagnetic Compatibility\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEMC.1994.385657\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1994.385657","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An improved method of characterizing shielding materials
Shielding materials have traditionally been measured using plane waves. For a significant number of applications, measurement using a perpendicular magnetic field is more appropriate. This paper reports on a method of characterizing shielding materials using a perpendicular magnetic field. Many properties of shielding materials can be easily determined by this method which is especially suited for coated or loaded plastics. Results for several commonly available shielding materials are presented and compared to plane wave, far field measurements.<>
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