An improved method of characterizing shielding materials

Abstract

Shielding materials have traditionally been measured using plane waves. For a significant number of applications, measurement using a perpendicular magnetic field is more appropriate. This paper reports on a method of characterizing shielding materials using a perpendicular magnetic field. Many properties of shielding materials can be easily determined by this method which is especially suited for coated or loaded plastics. Results for several commonly available shielding materials are presented and compared to plane wave, far field measurements.<>