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Simulation and optimization of Tri-Gates in a 22 nm hybrid Tri-Gate/planar process 22nm三栅极/平面混合工艺中三栅极的仿真与优化
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5757974
T. Baldauf, A. Wei, R. Illgen, S. Flachowsky, T. Herrmann, T. Feudel, J. Hontschel, M. Horstmann, W. Klix, R. Stenzel
{"title":"Simulation and optimization of Tri-Gates in a 22 nm hybrid Tri-Gate/planar process","authors":"T. Baldauf, A. Wei, R. Illgen, S. Flachowsky, T. Herrmann, T. Feudel, J. Hontschel, M. Horstmann, W. Klix, R. Stenzel","doi":"10.1109/ULIS.2011.5757974","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5757974","url":null,"abstract":"A Tri-Gate structure built into a planar 22 nm bulk process was investigated by 3-D device simulations (Sentaurus D-2010). The planar process flow sequence was extended with extra Tri-Gate patterning, but otherwise all implants were shared, as could be done in simultaneous processing of planar and Tri-Gate CMOS. A comparison of planar and Tri-Gate transistors with the same planar dopant profiles shows a substantial improvement of subthreshold slope, DIBL, and VT-rolloff for Tri-Gates. The electrical behavior of the Tri-Gate transistor has been studied for various Tri-Gate heights and widths. A large space of Tri-Gate dimensions outperformed planar in terms of electrostatics and ION-IOFF characteristics.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124422428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
2D Analytical calculation of the source/drain access resistance in DG-MOSFET structures DG-MOSFET结构源极/漏极通路电阻的二维解析计算
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5758006
T. Holtij, M. Schwarz, A. Kloes, B. Iñíguez
{"title":"2D Analytical calculation of the source/drain access resistance in DG-MOSFET structures","authors":"T. Holtij, M. Schwarz, A. Kloes, B. Iñíguez","doi":"10.1109/ULIS.2011.5758006","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5758006","url":null,"abstract":"Since DG-MOSFETs reached channel length down to 20nm, the parasitic source/drain resistances get more important and can't be neglected. To calculate these resistances in such devices a two-dimensional model in analytical closed-form has been derived by using the conformal mapping technique. Additionally, the model is able to predict the parasitic resistances for DG-MOSFETs with raised source drain (RSD) structures and/or wrapped contacts. The influence of source/drain geometries on access resistances is accurately described and a bias dependency is obtained by introducing two fitting parameters. The model is compared with the parasitic source/drain resistances determined from TCAD device simulations.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"138 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115266322","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Alloy scattering of substitutional carbon in silicon: A first principles approach 硅中取代碳的合金散射:第一性原理方法
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5757983
Martin Paul Vaughan, F. Murphy-Armando, S. Fahy
{"title":"Alloy scattering of substitutional carbon in silicon: A first principles approach","authors":"Martin Paul Vaughan, F. Murphy-Armando, S. Fahy","doi":"10.1109/ULIS.2011.5757983","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5757983","url":null,"abstract":"A method is developed to obtain the alloy scattering coefficients from first-principles band structure calculations. It is found that the scattering matrix can be decomposed into two additive components: a chemical part due to atomic substitution and a part due to ionic relaxation. The method is then applied to find the intra-and inter-valley electron scattering rates for substitutional carbon in silicon. Intravalley scattering is found to be the dominant process.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128351346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
From bulk toward FDSOI and silicon nanowire transistors: Challenges and opportunities 从体块到FDSOI和硅纳米线晶体管:挑战与机遇
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5757958
T. Hiramoto
{"title":"From bulk toward FDSOI and silicon nanowire transistors: Challenges and opportunities","authors":"T. Hiramoto","doi":"10.1109/ULIS.2011.5757958","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5757958","url":null,"abstract":"The silicon MOS transistors for VLSI have been scaled down for more than forty years in order to attain higher speed, lower power, higher integration, and lower cost. The gate length is now less than 30 nm. The silicon devices are certainly in the nanometer regime. Fig. 1 shows technology nodes and gate length according to ITRS [1]. It is predicted in the 2009 version of ITRS that the gate length will become less than 10 nm in 2021 in production. In the research level, a CMOS device with 3.8nm gate length has already been reported [2]. However, there are a lot of technical barriers to realize the 10nm-scale CMOS devices. It is now well recognized that simple scaling of bulk MOSFETs will fail in the nanometer regime. Every effort to extend the CMOS platform to future information technologies is being made. In this talk, transistor evolution for further CMOS extension is presented. Conventional planar bulk MOSFETs are compared with emerging fully-depleted SOI MOSFETs and nanowire MOSFETs in terms of short channel effects, carrier transport, and variability, and the advantages of new channel structures are discussed.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116654589","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Mobility extraction in sub 10nm nanowire nMOSFETs with gadolinium-silicate as gate dielectric 以硅酸钆为栅极介质的亚10nm纳米线nmosfet的迁移率提取
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5757996
Michael Schmidt, H. Gottlob, J. Bolten, T. Wahlbrink, Heinrich Kurz
{"title":"Mobility extraction in sub 10nm nanowire nMOSFETs with gadolinium-silicate as gate dielectric","authors":"Michael Schmidt, H. Gottlob, J. Bolten, T. Wahlbrink, Heinrich Kurz","doi":"10.1109/ULIS.2011.5757996","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5757996","url":null,"abstract":"Gadolinium-silicate (GdSiO) as high-k dielectric in sub 10nm gate first nanowire (NW) nMOSFETs is investigated. NW- and UTB- nMOSFETs with conventional SiO2/Poly-Si gate stacks have been fabricated and compared with GdSiO/TiN NW nMOSFETs. Specific nMOSFETs with multiple NWs in parallel have been used to extract the effective mobility by split-CV method and to eliminate the series resistance to correct the measured data.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116705680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Brownian dynamics simulation of ion channels embedded in silicon membranes for sensor applications 传感器用硅膜中离子通道的布朗动力学模拟
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5757953
C. Berti, S. Furini, E. Sangiorgi, C. Fiegna
{"title":"Brownian dynamics simulation of ion channels embedded in silicon membranes for sensor applications","authors":"C. Berti, S. Furini, E. Sangiorgi, C. Fiegna","doi":"10.1109/ULIS.2011.5757953","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5757953","url":null,"abstract":"In this work we present a three-dimensional numerical simulation technique for the study of ion permeation through ion channels embedded in silicon membranes, that can be exploited for sensor applications. The results of this work clarify how the charges embedded in the protein forming the ion channel can influence ionic conductance through silicon membrane slabs, controlling the channel conductance and selectivity with respect to ionic species.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"157 16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126928834","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Self-heating and substrate effects in ultra-thin body ultra-thin BOX devices 超薄体超薄BOX器件中的自热和衬底效应
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5758009
S. Makovejev, V. Kilchytska, M. Arshad, D. Flandre, F. Andrieu, O. Faynot, S. Olsen, J. Raskin
{"title":"Self-heating and substrate effects in ultra-thin body ultra-thin BOX devices","authors":"S. Makovejev, V. Kilchytska, M. Arshad, D. Flandre, F. Andrieu, O. Faynot, S. Olsen, J. Raskin","doi":"10.1109/ULIS.2011.5758009","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5758009","url":null,"abstract":"Self-heating and substrate effects are discussed and qualitatively compared in the ultra-thin body ultra-thin BOX (UTB2) devices without a ground plane. Ultra-thin body is aggravating thermal properties of the devices due to the interface effects. Ultra-thin BOX (10 nm) improves heat dissipation from the channel to the bulk silicon substrate but also results in strongly pronounced substrate effects. It is observed that output conductance degradation in the UTB2 devices due to the substrate effects can be as strong as degradation due to the self-heating.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133365428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Giant mobility enhancement in highly strained, direct gap Ge 巨迁移率增强在高应变、直隙格
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5757987
F. Murphy-Armando, S. Fahy
{"title":"Giant mobility enhancement in highly strained, direct gap Ge","authors":"F. Murphy-Armando, S. Fahy","doi":"10.1109/ULIS.2011.5757987","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5757987","url":null,"abstract":"First-principles electronic structure methods are used to predict the rate of n-type carrier scattering due to phonons in highly-strained Ge. We show that strains achievable in nanoscale structures, where Ge becomes a direct band-gap semiconductor, cause the phonon-limited mobility to be enhanced by hundreds of times that of unstrained Ge, and over a thousand times that of Si.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129859420","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
The impact of junction angle on tunnel FETs 结角对隧道场效应管的影响
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5757957
Frank K. H. Kao, A. Verhulst, W. Vandenberghe, G. Groeseneken, K. De Meyer
{"title":"The impact of junction angle on tunnel FETs","authors":"Frank K. H. Kao, A. Verhulst, W. Vandenberghe, G. Groeseneken, K. De Meyer","doi":"10.1109/ULIS.2011.5757957","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5757957","url":null,"abstract":"We derive an analytical model based on circular tunnel paths along the electric field to describe the behavior of a tunnel FET with a junction angle at the source. The model is compared with simulation results and qualitative agreement is observed. We further demonstrate that a small junction angle prevents TFET performance degradation resulting from a high-k spacer. Finally we optimize the junction angle with an encroaching source structure, studying the dependence on oxide thickness and semiconductor material.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"234 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123304663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Specific features of fluorination of silicon surface region by RIE in r.f. CF4 plasma — novel method of improving electrical properties of thin PECVD silicon dioxide films r - f - CF4等离子体中硅表面的RIE氟化特性——改善PECVD二氧化硅薄膜电性能的新方法
Ulis 2011 Ultimate Integration on Silicon Pub Date : 2011-03-14 DOI: 10.1109/ULIS.2011.5757960
M. Kalisz, R. Mroczyński, R. B. Beck
{"title":"Specific features of fluorination of silicon surface region by RIE in r.f. CF4 plasma — novel method of improving electrical properties of thin PECVD silicon dioxide films","authors":"M. Kalisz, R. Mroczyński, R. B. Beck","doi":"10.1109/ULIS.2011.5757960","DOIUrl":"https://doi.org/10.1109/ULIS.2011.5757960","url":null,"abstract":"In this study, the comparison of methods of improving electro-physical properties of silicon dioxide (SiO2) by means of silicon substrates fluorination in CF4 in PECVD and RIE reactors, prior to oxide deposition, has been performed. The results proved that, in general, fluorination in RIE is superior to the fluorination in PECVD reactor. The observed effects have been referred to the obtained changes in the electrical properties, resulting from both fluorination methods. As a result of this study, it has been proved, that properties change is fluorine concentration dependent.","PeriodicalId":146779,"journal":{"name":"Ulis 2011 Ultimate Integration on Silicon","volume":"109 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-03-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130675743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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