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2017 IEEE East-West Design & Test Symposium (EWDTS)最新文献

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Threshold synthesis of digital structures in current-mode logic 电流模式逻辑中数字结构的阈值合成
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110146
N. I. Chernov, N. Prokopenko, V. Yugai, N. Butyrlagin
{"title":"Threshold synthesis of digital structures in current-mode logic","authors":"N. I. Chernov, N. Prokopenko, V. Yugai, N. Butyrlagin","doi":"10.1109/EWDTS.2017.8110146","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110146","url":null,"abstract":"The article considers the fundamentals of logical synthesis of digital nodes of electronic computer on base of current realization of threshold logic. The examples of logical and circuit description of combinational and sequential logical elements and the results of their computer simulation are given. It is concluded that the proposed approach to the threshold synthesis of digital structures in current logic is promising.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"89 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133846816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Combinational circuit check by boolean complement method based on “1-out-of-5” code 基于“1-out- 5”码的布尔补码组合电路校验
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110076
V. Sapozhnikov, V. Sapozhnikov, D. Efanov, A. Blyudov, D. Pivovarov
{"title":"Combinational circuit check by boolean complement method based on “1-out-of-5” code","authors":"V. Sapozhnikov, V. Sapozhnikov, D. Efanov, A. Blyudov, D. Pivovarov","doi":"10.1109/EWDTS.2017.8110076","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110076","url":null,"abstract":"Authors offer the way of formation of self-checking concurrent error detection systems of combinational circuits based on Boolean complement method with “1-out-of-5”-code. This code's checker needs five code words for full test and has low technical realization complexity. This allows organization of concurrent error detection system with reduced structural redundancy compared with duplication method and with detection of all single stuck-at faults in diagnostic object. Theoretical results are approved by experiments with use of the set of circuits MCNC Benchmarks.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115444628","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Comparative analysis of single-photon synchronization algorithms in the quantum key distribution system 量子密钥分配系统中单光子同步算法的比较分析
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110047
Anton Plenkin, K. Rumyantsev, E. Rudinsky
{"title":"Comparative analysis of single-photon synchronization algorithms in the quantum key distribution system","authors":"Anton Plenkin, K. Rumyantsev, E. Rudinsky","doi":"10.1109/EWDTS.2017.8110047","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110047","url":null,"abstract":"The time and probability parameters of the two-stage synchronization algorithm for the autocompensation quantum key distribution (QKD) systems and the analogous algorithm, implying the division of the time frame into time windows, are investigated. A comparative analysis of the parameters of synchronization algorithms is carried out and recommendations for their application for short and long fiber-optic communication lines are presented. The work also shows the methods of calculating the mean synchronization time of the QKD stations according to the above algorithms.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116342467","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Easy to use evaluation of quality characteristics for a hierarchy of RTL compilers 易于使用的评价质量特征的层次结构的RTL编译器
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110072
L. Martirosyan
{"title":"Easy to use evaluation of quality characteristics for a hierarchy of RTL compilers","authors":"L. Martirosyan","doi":"10.1109/EWDTS.2017.8110072","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110072","url":null,"abstract":"For embedded memories' built-in self-test (BIST) and repair systems gate count and power consumption are among the most critical design constraints. This paper presents an automated method for memory BIST network quality characteristics estimation which is externally seen as “one push button” action. Besides performing area and power-aware memory BIST network design at early stages of SoC design independently from executing step by step the hierarchy of RTL compilers it also excludes a necessity of multiple switching between compiler environments within the hierarchy.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122183992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Parameter optimization of high-speed CMOS operational amplifiers based on dual-input stage 基于双输入级的高速CMOS运算放大器参数优化
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110144
N. Prokopenko, M. Gourary, S. Rusakov, S. Ulyanov, M. Zharov, E. M. Savchenko
{"title":"Parameter optimization of high-speed CMOS operational amplifiers based on dual-input stage","authors":"N. Prokopenko, M. Gourary, S. Rusakov, S. Ulyanov, M. Zharov, E. M. Savchenko","doi":"10.1109/EWDTS.2017.8110144","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110144","url":null,"abstract":"The parameter optimization features of CMOS operational amplifiers (OA) based on dual-input-stage under constraints on power consumption, unity gain frequency, phase margin, open loop gain and compensation capacitance are considered. It is shown that the maximum slew rate of the output voltage is proportional to the DC currents of dual-input-stage due to the usage of current mirror based push-pull parallel channels. The recommendations to design of high-speed CMOS OA with wide range of dynamic characteristics are given.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"27 22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116861382","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Estimation of time parameters of electronic document management 电子文档管理时间参数的估计
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110062
P. Bulavsky, V. Belozerov, G. Groshev, M. Vasilenko, Yu.O. Yefimenko, M. Gordon
{"title":"Estimation of time parameters of electronic document management","authors":"P. Bulavsky, V. Belozerov, G. Groshev, M. Vasilenko, Yu.O. Yefimenko, M. Gordon","doi":"10.1109/EWDTS.2017.8110062","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110062","url":null,"abstract":"Processes of technical documentation processing, opportunities and advantages of their implementation with the help of automated technologies of electronic document management depend to a large extent on the quality of the technical documentation involved in them and the time for performing elementary operations of document management. In the paper, it is proposed to use dynamic probabilistic loaded graphs to estimate the time parameters of electronic document management of technical documentation. The use of the apparatus of dynamic probabilistic loaded graphs makes it possible to model processes taking into account the probabilistic-temporal characteristics of operations and the impact on them of the quality of technical documentation. To evaluate the quality of technical documents, characteristics are proposed that determine their ability to meet established or perceived needs. The presentation of electronic document management of technical documentation by a dynamic probabilistic technological process allows to more accurately determine the duration of the implementation of elementary operations and transitions at a given hierarchical level of representation taking into account their probabilistic characteristics. The total duration of the process of electronic document management of technical documentation includes a set of elementary operations for this level of representation performed at different stages and loads of arcs of a dynamic probabilistic loaded graph in accordance with the structural scheme of the interaction of processes and the probability of performing conditional transitions at a given time. This approach allows one to more accurately determine the duration of electronic document management of technical documentation.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124597671","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Achieving full functional coverage for the forwarding unit of pipelined processors 实现流水线处理器转发单元的全功能覆盖
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110063
Vineesh V S, N. Hage, B. Karthik, Virendra Singh
{"title":"Achieving full functional coverage for the forwarding unit of pipelined processors","authors":"Vineesh V S, N. Hage, B. Karthik, Virendra Singh","doi":"10.1109/EWDTS.2017.8110063","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110063","url":null,"abstract":"Generic instruction based testing methods do not always give good fault coverage for the complex units like Forwarding unit. Hence it becomes important to carefully craft the test which are best for different parts of these units. In this paper we have identified two different test generation methods for different sections of the forwarding unit, namely muxes and comparators which offers better coverage independently: template based test instruction generation and test instruction generation from constrained test vectors. A wrapper designed using the functional constraints of the forwarding unit, is used for test generation. Both methods combined delivers fault coverage of 97.33%. A detailed analysis of the non-detected faults revealed the fact that they cannot be tested using the instruction set of the processor (MIPS 5-stage pipelined processor). This proves that the proposed method achieved 100% functional coverage for stuck-at faults in the forwarding unit.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124652310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluation of resistance of ECC designs protected by different randomization countermeasures against horizontal DPA attacks 评价不同随机化对策保护的ECC设计对水平DPA攻击的抵抗能力
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110037
I. Kabin, Z. Dyka, D. Kreiser, P. Langendörfer
{"title":"Evaluation of resistance of ECC designs protected by different randomization countermeasures against horizontal DPA attacks","authors":"I. Kabin, Z. Dyka, D. Kreiser, P. Langendörfer","doi":"10.1109/EWDTS.2017.8110037","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110037","url":null,"abstract":"In this paper we investigate how different randomization approaches influence the success of horizontal DPA attacks. We use our own ECC design to run the experiments. We applied the following randomization techniques: EC point blinding, key randomization and a combination of both. Our experiments demonstrate the fact that these well-known randomizations of processed data are not effective against horizontal DPA attacks. In addition we investigated randomized calculation sequences of partial multiplications, i.e. a kind of intermediate data randomization, as potential countermeasures. We simulated power traces of elliptic curve point multiplication kP for all applied countermeasures and performed our low-cost horizontal DPA attack. We applied a difference of means test to reveal the scalar k. Our experiments show that the randomization of the processing sequence of the partial multiplications improves the resistance of the design against horizontal attacks significantly but is not sufficient as the only means against DPA attacks.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127210330","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Automatic locomotive signalization system modification with weight-based sum codes 基于加权和码的机车自动信号系统改造
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110099
D. Nikitin, A. Nikitin, A. Manakov, P.B. Popov, A. Kotenko
{"title":"Automatic locomotive signalization system modification with weight-based sum codes","authors":"D. Nikitin, A. Nikitin, A. Manakov, P.B. Popov, A. Kotenko","doi":"10.1109/EWDTS.2017.8110099","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110099","url":null,"abstract":"The features of weight-based sum codes for error detection in channel are discussed in this article. These features are acceptable for modification remote railway controlling systems such as locomotive signalization. In this article proposed the investigation for different coding modification algorithms, made an analysis of noise-immune properties when the modified Bauer code was replaced to modulo weight-code. Article includes deep analysis of all possible false transitions for code combinations in the data transmission channel are performed. The obtained methods for modifying the software modules of data encryption and decryption allowed to expand the system's accuracy by 4 times from 256 commands to 1024, meeting all the security requirements for data transmission.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130887239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Grapheme-to-phoneme conversion based on high-order Markov chain for spoken term detection by text query 基于高阶马尔可夫链的字素-音素转换文本查询语音词检测
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110058
D. Prozorov, A. Tatarinova
{"title":"Grapheme-to-phoneme conversion based on high-order Markov chain for spoken term detection by text query","authors":"D. Prozorov, A. Tatarinova","doi":"10.1109/EWDTS.2017.8110058","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110058","url":null,"abstract":"Spoken term detection (STD) is a fundamental part of some speech processing applications. One of STD methods uses a phoneme representation of words from a spoken content and a text query. The paper presents a new grapheme-to-phoneme conversion method based on high-order Markov chain. The method is applied to retrieve of spoken documents in Russian language. The aim of this research is evaluation effectiveness of STD method based on the proposed grapheme-to-phoneme conversion.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130443410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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