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2017 IEEE East-West Design & Test Symposium (EWDTS)最新文献

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“Cut-glue” Approximation based on evolutionary-genetic algorithm for essentially nonlinear parametric dependencies of mathematical models 基于进化-遗传算法的数学模型非线性参数依赖的“切胶”近似
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110040
R. Neydorf, V. Polyakh, D. Vucinic
{"title":"“Cut-glue” Approximation based on evolutionary-genetic algorithm for essentially nonlinear parametric dependencies of mathematical models","authors":"R. Neydorf, V. Polyakh, D. Vucinic","doi":"10.1109/EWDTS.2017.8110040","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110040","url":null,"abstract":"The paper presents the mathematical modeling of fragments by applying the polynomial regression to experimental data of arbitrary dimension. This approach aims to find out the minimal complexity polynomial structure defining the coefficients, which are optimized by the least squares criterion, enabling the error control when describing fragments. This mathematical formulation to approximate experimental data is essentially nonlinear as it uses piecewise approximation on small data fragments. The overall mathematical model requires maximum simplification when modeling each fragment, to ensure its small size and avoiding areas with high curvatures. The structural-parametric optimization for fragment models is implemented with a hybrid of classical regression analysis and a modified evolutionary-genetic algorithm, which varies and optimizes the polynomial structure describing the fragment. The specially developed software tool defines the optimal approximation for high-dimensional fragments, which usage in approximating fragments and the obtained results are demonstrated for real experimental data.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114201458","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Determination of electrical parameters of dried blood spot samples with different concentration of methotrexate 不同浓度甲氨蝶呤干燥血斑样品电参数的测定
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110149
Jelena Laketa, M. Radovanović, Tijana Kojić, G. Stojanović, S. Vukmirović, M. Mikov, Z. Stamenkovic
{"title":"Determination of electrical parameters of dried blood spot samples with different concentration of methotrexate","authors":"Jelena Laketa, M. Radovanović, Tijana Kojić, G. Stojanović, S. Vukmirović, M. Mikov, Z. Stamenkovic","doi":"10.1109/EWDTS.2017.8110149","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110149","url":null,"abstract":"The dried blood spot (DBS), a sample of filter paper bearing dried blood, has been applied in the field of clinical chemistry and pharmaceutical industry, for detection of different diseases and for drug development. This paper presents electrical characterization of DBS samples with different concentrations of a chemotherapy agent — drug methotrexate (MTX). Experimental characterization was conducted using a Hall-effect measurement system, profilometer, and impedance analyzer. Obtained results revealed that mobility decreases and resistivity increases with an increase of MTX concentration in DBS samples.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"440 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132415968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Self-checking synchronous FSM network design for path delay faults 路径延迟故障的自检同步FSM网络设计
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110129
S. Ostanin
{"title":"Self-checking synchronous FSM network design for path delay faults","authors":"S. Ostanin","doi":"10.1109/EWDTS.2017.8110129","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110129","url":null,"abstract":"Growth of nanometer electronic components increases requirements to testing of the logic circuits. In frame of conventional testing becomes not enough to detect stuck-at faults at circuits' gate poles it is necessary to test timing defects. One of a convenient and popular model of timing defects is path delay faults. A technique of designing a self-checking synchronous network of Finite State Machines (FSMs) for path delay faults is suggested. Checkers observe outputs only external FSMs, i.e. FSMs output lines of which are output lines of the network at whole. Single path delay faults from inputs to outputs of each FSM are contemplated. We use a multilevel or factorized logic synthesis for monotonous (unate) realization of FSM. On output lines of the corresponding FSMs synthesized by multilevel and factorized logic synthesis are provided an unidirectional manifestation of path delay faults. Monotonous realization of FSM is obtained from the State Transition Graph (STG) description of FSMs with using the (m, n)-code for states encoding and negligible enlarge the products of STG.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133374638","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Using adaptive polynomial models of time series for short-term prediction of the technical parameter 采用时间序列自适应多项式模型对技术参数进行短期预测
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110077
S. Klevtsov
{"title":"Using adaptive polynomial models of time series for short-term prediction of the technical parameter","authors":"S. Klevtsov","doi":"10.1109/EWDTS.2017.8110077","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110077","url":null,"abstract":"The possibilities of using time series for predicting changes in a technical parameter in real time are considered. Forecasting is carried out using simple adaptive models. The prediction procedure should be performed in the background in the microcontroller. Selected adaptive polynomial models of zero, first and second order, based on the method of multiple exponential smoothing. Models are modified to the features of the computation process in the microcontroller. As initial data, the values of the acceleration of the car were used. The forecast was carried out for one or more steps of information retrieval from the accelerometer. The data before the simulation was not pre-processed. Emissions were excluded from the data set. Simulation has shown that the adaptive zero order polynomial model is generally more preferable for one-step prediction. With an increase in the forecasting horizon, the best results are shown by a second-order model.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"130 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134099646","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Embedded device and methods for online monitoring of the parameters of the accumulators of power and transport systems 电力和运输系统蓄能器参数在线监测的嵌入式装置和方法
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110141
A. Sedov, D. Onyshko
{"title":"Embedded device and methods for online monitoring of the parameters of the accumulators of power and transport systems","authors":"A. Sedov, D. Onyshko","doi":"10.1109/EWDTS.2017.8110141","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110141","url":null,"abstract":"Modern systems of traditional and alternative energy, transport systems include powerful uninterruptible power supplies (UPS), implemented on batteries of charged electrochemical current sources — accumulators. These modules ensure the functioning of the systems in case of accidents or technological failures in the operation of main power supplies. The ability to provide the given energy modes by these modules is largely determined by the state and electrical parameters of the individual accumulators. In this paper, methods and embedded tools for operational monitoring of the main parameters of accumulators without disconnecting them from the main working circuits are considered. Current charge, activation resistances and capacitances, internal resistance and others are understood under controlled parameters. It is proposed the using of improved models and methods of active electric impulse action based on small perturbing potentiostatic tests and regularizing mathematical processing with reduction of measurements for the identification ofparameters.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"222 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129870033","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Efficient three-dimensional ray tracing and electromagnetic field intensity estimation algorithm for WLAN 高效的无线局域网三维射线追踪和电磁场强度估计算法
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110105
A. I. Panychev, A. A. Vaganova
{"title":"Efficient three-dimensional ray tracing and electromagnetic field intensity estimation algorithm for WLAN","authors":"A. I. Panychev, A. A. Vaganova","doi":"10.1109/EWDTS.2017.8110105","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110105","url":null,"abstract":"The algorithm of three-dimensional ray tracing based on the principles of geometric optics, mirror image and geometric theory of diffraction is proposed. The algorithm is intended for analysis of electromagnetic waves propagation indoors. The distribution of WLAN signal intensity indoors is simulated using the proposed ways of calculation of the coverage area with account of direct, reflected and diffraction rays. It is shown that the use of the proposed algorithm is appropriate for the totality of the accuracy of obtained results and the required costs of computational resources.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130315194","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Moral cyber-social computing for state and university 国家和大学的道德网络社会计算
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110032
Abdullayev Vugar Hacimahmud, O. Mishchenko, V. Hahanov, Tetiana Soklakova
{"title":"Moral cyber-social computing for state and university","authors":"Abdullayev Vugar Hacimahmud, O. Mishchenko, V. Hahanov, Tetiana Soklakova","doi":"10.1109/EWDTS.2017.8110032","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110032","url":null,"abstract":"An innovative cyber culture and computing of social governance of citizens is proposed, aimed at the moral metric cloud service of social groups through the leverage of digital monitoring and expert evaluation of social processes and phenomena. Cyber culture is defined as the development level of social, technological, moral and material relations between society, the physical world and cyberspace that creates the quality of internet services for accurate digital monitoring and cloud metric management of processes and phenomena in all spheres of human activity including education, science, production and transport, to improve the quality of people life and preserve the ecosystem of the planet. A new system of cyber-physical relations in society are proposed, which will be the basis for creating innovative legislation with the functions of digital monitoring and cloud-based cyber-governance. An analytical model of relations in state structures that simulates socioeconomic, political and other collisions as a response to regulatory influences is described. Prospective directions of the cyber-statehood creation, invariant in relation to a citizen residence are considered. A set of measures for destroying corrupt relations in society is offered at the expense of radical reduction of state property as a source of corruption in management, maintenance, science and education.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124810829","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Power noise optimization with decoupling capacitors 去耦电容的功率噪声优化
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110121
Karo H. Safaryan
{"title":"Power noise optimization with decoupling capacitors","authors":"Karo H. Safaryan","doi":"10.1109/EWDTS.2017.8110121","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110121","url":null,"abstract":"Nowadays Integrated Circuits (IC)s frequencies causes switching noises. To minimize the mentioned issue in IC designs were used decoupling capacitor (decap) cells to filter out noise in power network. In this paper, have been discussed two approaches of using decap cells in Universal Serial Bus Test Chip (USB TC). Firstly, designed USB TC with decoupling capacitor cells which place over the chip by fixed spaces and secondly instead of this using decoupling capacitors as a filler cells in white spaces. By using this approach, noise on the USB TC chip power rails reduced 45% in worst case scenario.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124898550","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Integration the non-equilibrium position encoding into the compression technology of the transformed images 将非平衡位置编码融入变换后图像的压缩技术中
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110030
V. Barannik, Yuriy Ryabukha, Vitaliy Tverdokhlib, A. Dodukh, O. Suprun, Denys Tarasenko
{"title":"Integration the non-equilibrium position encoding into the compression technology of the transformed images","authors":"V. Barannik, Yuriy Ryabukha, Vitaliy Tverdokhlib, A. Dodukh, O. Suprun, Denys Tarasenko","doi":"10.1109/EWDTS.2017.8110030","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110030","url":null,"abstract":"The principles of integration of non-equilibrium-positional coding into the technology of compression of transformed images are considered as an alternative to probability-statistical methods of coding, which can provide high compression ratios without loss of information quality. The ways of eliminating contradictions between the need to reduce code redundancy and the requirement to determine the boundaries of codewords bearing information about the value of the code quantity are proposed.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116549076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 27
Finding the shortest transfer sequence of sequential circuit based on simplified ROBDDs 基于简化robdd的顺序电路最短传输序列的求解
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110135
V. Andreeva, S. Chernyshov
{"title":"Finding the shortest transfer sequence of sequential circuit based on simplified ROBDDs","authors":"V. Andreeva, S. Chernyshov","doi":"10.1109/EWDTS.2017.8110135","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110135","url":null,"abstract":"A method of finding the shortest transfer sequence for the given set of internal states with using operations on ROBDDs is considered. Simplified ROBDDs for transition functions compositions are applied. The ROBDDs are built by using Shannon decomposition first for state and then for input variables. In the simplified ROBDD its path originated by state variables has the only prolongation among input variables. An algorithm of cutting the number of these prolongations for the ROBDD is proposed. The algorithm is based on using the decomposition tree and oriented to cut calculations on finding the shortest transfer sequence.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114852686","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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