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2017 IEEE East-West Design & Test Symposium (EWDTS)最新文献

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Towards digital circuit approximation by exploiting fault simulation 利用故障仿真实现数字电路逼近
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-29 DOI: 10.1109/EWDTS.2017.8110108
Marcello Traiola, A. Virazel, P. Girard, M. Barbareschi, A. Bosio
{"title":"Towards digital circuit approximation by exploiting fault simulation","authors":"Marcello Traiola, A. Virazel, P. Girard, M. Barbareschi, A. Bosio","doi":"10.1109/EWDTS.2017.8110108","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110108","url":null,"abstract":"In the recent years, Approximate Computing (AxC) has emerged as a new paradigm for energy efficient design of Integrated Circuits (ICs). AxC is based on the intuitive observation that, while performing exact computation requires a high amount of resources, allowing a selective approximation or an occasional relaxation of the specifications can provide significant gains in area, performances and energy efficiency. This work focuses on a case study about functional approximation of digital circuits. The functional approximation aims at modifying the circuit structure so that the original function F will be replaced by G whose implementation leads to area/energy reduction at the cost of reduced accuracy (i.e., some errors can be observed at the outputs of G). In this paper, we investigate an approach for the functional approximation exploiting fault simulation. Preliminary results show the potentiality of this approach in terms of area reduction.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131235283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Stochastic approach to reducing calibration errors of MEMS orientation sensors 减小MEMS方向传感器标定误差的随机方法
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110051
Kseniya I. Goryanina, A. Lukyanov
{"title":"Stochastic approach to reducing calibration errors of MEMS orientation sensors","authors":"Kseniya I. Goryanina, A. Lukyanov","doi":"10.1109/EWDTS.2017.8110051","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110051","url":null,"abstract":"The authenticity of the readings of accelerometers and magnetometers is of great importance when using sensors in orientation systems. At the same time, simple calibration methods do not always provide the accuracy required for operation. The article considers a method based on the calculation of correction coefficients using the method of least squares. The stochastic approach allows calibrating orientation MEMS sensors without precise reference to the coordinates. The error of the calibrated readings in this case is less than 1%. The results of the studies showed that the calibration method under consideration is stable and reliable.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121059863","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
SPICE models of nonlinear capacitors for simulation of ferroelectric circuits 用于铁电电路仿真的非线性电容器SPICE模型
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110102
M. Gourary, S. Rusakov, S. Ulyanov, M. Zharov, A. Rassadin
{"title":"SPICE models of nonlinear capacitors for simulation of ferroelectric circuits","authors":"M. Gourary, S. Rusakov, S. Ulyanov, M. Zharov, A. Rassadin","doi":"10.1109/EWDTS.2017.8110102","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110102","url":null,"abstract":"The paper presents SPICE models of nonlinear capacitors for analysis of ferroelectric circuits. The capacitors can be defined by either charge-voltage or voltage-charge closed form expressions. Additionally the model for series connection of any number of nonlinear capacitors is proposed. The model takes into account trapped charges of internal connections. Numerical experiments for ferroelectric circuits confirmed the correctness of the proposed approach.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127194108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Operation of local positioning system for automatic ship berthing 船舶自动靠泊局部定位系统的运行
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110118
I. S. Ablyakimov, I. Shirokov
{"title":"Operation of local positioning system for automatic ship berthing","authors":"I. S. Ablyakimov, I. Shirokov","doi":"10.1109/EWDTS.2017.8110118","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110118","url":null,"abstract":"The article deals with principles and methods of development of local navigation system based on the homodyne signal transforming. Such approach let us distance determination with the help of simplest system design. The block diagrams of system elements are given and the principles of its functioning are described. The use of the proposed block diagram gives the possibility of creating of effective local navigation system that can be used for automatic ship berthing.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"2105 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129926020","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Reconfiguring of structure as self diagnosis tool of on-board computers 作为车载计算机自诊断工具的结构重构
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110106
V. Guzik, A. Samoylenko, A. I. Panychev, S. Panychev
{"title":"Reconfiguring of structure as self diagnosis tool of on-board computers","authors":"V. Guzik, A. Samoylenko, A. I. Panychev, S. Panychev","doi":"10.1109/EWDTS.2017.8110106","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110106","url":null,"abstract":"A majority-dynamic method of reconfiguring the on-board computer system in the time slot required for the control and diagnostics system performance is described. The described method provides fault tolerance of multiprocessor supercomputer rack in accordance with the concept of the integration of on-board equipment IMA. Using the control automat with implemented algorithm of self-diagnostic makes it possible to minimize informational redundancy of diagnostic system.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"29 10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126914966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Simulating fluid flow in “Shrinky Dink” microfluidic chips — Potential for combination with low-cost DIY microPIV 在“Shrinky Dink”微流控芯片中模拟流体流动-与低成本DIY microPIV结合的潜力
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110052
Andrija Jovic, Ž. Janićijević, M. Janković, Novica Z. Janković, Marko Barjaktarovic, E. S. Cantrak, I. Gadjanski
{"title":"Simulating fluid flow in “Shrinky Dink” microfluidic chips — Potential for combination with low-cost DIY microPIV","authors":"Andrija Jovic, Ž. Janićijević, M. Janković, Novica Z. Janković, Marko Barjaktarovic, E. S. Cantrak, I. Gadjanski","doi":"10.1109/EWDTS.2017.8110052","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110052","url":null,"abstract":"This paper describes the first steps towards a union of low-cost “Shrinky Dink” (SD) microfluidic chip fabrication with low-cost do-it-yourself (DIY) micro-PIV. The SD microfluidic chip fabrication technique enables rapid development of complex designs using inexpensive materials and reagents, while abrogating the need for a cleanroom. DIY microPIV system provides a low-cost means of accurate flow profile analysis in microchannels, comparable to high-cost, standard microPIV setups. Initially, a simple microfluidic design of a T-junction was created and several chips with the same design were fabricated by the SD technique. We used COMSOL Multiphysics Creeping Flow interface to simulate the flow profiles in the obtained channel geometry. The next step will be to experimentally verify these simulations using our DIY microPIV system, in order to confirm the potential of combined use of these two cost-effective systems, to rapidly produce and analyze microfluidic designs, thereby enabling greater accessibility to these methods in labs with limited resources. It is envisioned that the systems described here can be effectively employed for a wide array of applications in biophysics, fluid mechanics, and bioengineering.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124245065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Radio frequency identification system of Internet of Things based on CMOS integrated circuits 基于CMOS集成电路的物联网射频识别系统
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110155
D. Akhmetov, A. Korotkov, D. Morozov, M. Pilipko, I. Rumyancev
{"title":"Radio frequency identification system of Internet of Things based on CMOS integrated circuits","authors":"D. Akhmetov, A. Korotkov, D. Morozov, M. Pilipko, I. Rumyancev","doi":"10.1109/EWDTS.2017.8110155","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110155","url":null,"abstract":"RFID-tags are conventionally provided for various things. A RFID system for Internet of Nano Things based on a UMC 180nm CMOS integrated circuit was proposed. The system is intended for identification of tags realized on a surface-acoustic-wave delay lines and designed as a transceiver front-end with operating frequency range of 2.40–2.48 GHz. A polling signal is a stepped frequency chirp, and the read range makes up 3 m.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123346284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Modeling of thermal field of substrate of integrated circuits by similarity method 基于相似法的集成电路衬底热场建模
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110103
A. G. Harutyunyan
{"title":"Modeling of thermal field of substrate of integrated circuits by similarity method","authors":"A. G. Harutyunyan","doi":"10.1109/EWDTS.2017.8110103","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110103","url":null,"abstract":"A method of modeling of thermal field of substrate of semiconductor integrated circuits (IC), based on similarities of thermal and electric processes is proposed. Based on the proposed method, corresponding electrical circuit of IC heat exchanger, which consists of current source and resistance, is built. The commercial software modeling tool HSpice has been used for model implementation. The effectiveness of the proposed method is shown on the test case.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126266723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of exhaustive search, branch and bound, parallel computing and Monte-Carlo methods for the synthesis of quasi-optimal network-on-chip topologies 穷尽搜索、分支定界、并行计算和蒙特卡罗方法在拟最优片上网络拓扑综合中的应用
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110092
A. Romanov, I. Romanova, A. Ivannikov
{"title":"Application of exhaustive search, branch and bound, parallel computing and Monte-Carlo methods for the synthesis of quasi-optimal network-on-chip topologies","authors":"A. Romanov, I. Romanova, A. Ivannikov","doi":"10.1109/EWDTS.2017.8110092","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110092","url":null,"abstract":"On the basis of an integrated network-on-chip (NoC) topologies optimality criterion, as well as applying the adjacency matrix to describe NoC topologies, exhaustive search method and its modification by using branch and bound and Monte-Carlo methods are extended to the synthesis of NoC quasi-optimal topologies. Designed ScaNoC suboptimal topology synthesis algorithm is implemented on a high-level programming language which makes it possible to generate quasi-optimal topological solutions in accordance with the requirements to reduce hardware costs and the average distance between nodes. Proposed quasioptimal topologies synthesis algorithm improvement by using the method of parallel computing allows speeding up the process of synthesis to 2117 times and getting topologies with the number of nodes up to 18.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"131 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130788583","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Diagnostics and monitoring of railway automation and remote control power supply devices 铁路自动化和远程控制供电设备的诊断和监测
2017 IEEE East-West Design & Test Symposium (EWDTS) Pub Date : 2017-09-01 DOI: 10.1109/EWDTS.2017.8110143
A. Poroshin, A. Nikitin, V. Shatokhin, A. Kotenko
{"title":"Diagnostics and monitoring of railway automation and remote control power supply devices","authors":"A. Poroshin, A. Nikitin, V. Shatokhin, A. Kotenko","doi":"10.1109/EWDTS.2017.8110143","DOIUrl":"https://doi.org/10.1109/EWDTS.2017.8110143","url":null,"abstract":"This article is devoted to the research of diagnostics and monitoring of power supply devices of railway automation and remote control. The analysis of failure statistics of power supply devices in recent years has been carried out and the most vulnerable elements of power supply systems have been identified on its basis. Objects are described, the state of which must be diagnosed in the input devices, in switchgears, as well as the diagnostic parameters of the battery and the backup power station; the principles of determining their technical condition are presented. The authors for the first time proposed technical solutions for increasing the survivability of power supply devices in case of poor-quality external power supply. The article also presents possible solutions for the implementation of diagnostics of monitored facilities, which save time spent by personnel on maintenance to reduce operational costs, improve the reliability of the power supply of automation and remote control, which will improve the safety, uninterrupted operation and efficiency of the transportation process.","PeriodicalId":141333,"journal":{"name":"2017 IEEE East-West Design & Test Symposium (EWDTS)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2017-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133454674","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
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