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IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)最新文献

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Measuring in-band distortions of mixers 测量混频器的带内失真
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007150
A. Geens, W. Moer, Y. Rolain
{"title":"Measuring in-band distortions of mixers","authors":"A. Geens, W. Moer, Y. Rolain","doi":"10.1109/IMTC.2002.1007150","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007150","url":null,"abstract":"This paper proposes a method to measure the in-band deterministic and stochastic contributions of nonlinear distortions in mixers. The model of the mixer as a two or three port device is developed. Based on this model, the measurement technique which is a generalization of the methods developed for amplifiers is developed. While designing the measurements method, the difficulties that arise out of the fundamental differences between mixers (3-port devices) and amplifiers (2-port devices) are taken into account. Two techniques are presented, depending on the fact that the phase of the local oscillator is known or unknown.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129797354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Fault tolerant carrier frequency tracking for closed loop measurement systems 用于闭环测量系统的容错载波频率跟踪
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007186
N. Kero, H. Nachtnebel, H. Pommer, T. Sauter
{"title":"Fault tolerant carrier frequency tracking for closed loop measurement systems","authors":"N. Kero, H. Nachtnebel, H. Pommer, T. Sauter","doi":"10.1109/IMTC.2002.1007186","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007186","url":null,"abstract":"Carrier frequency based capacitance measurement is commonly used for measuring extremely small values of capacitive angle and distance sensors. If operated in a closed-loop system with a synchronous demodulator it offers significant advantages over conventional capacitance measurement methods. However, it is vulnerable to in-band disturbance signals. This drawback can only be overcome by selecting a different (undisturbed) carrier frequency. Fully integrated capacitive sensors without any means of external frequency reference are compulsory requirements for many industrial applications. These systems purely rely on an internal oscillator, which has to be digitally tunable to cope with temperature and process effects. We present a combined method for tuning the operating frequency to an external reference circuit (LC-filter) and at the same time detecting in-band noise signals.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129582816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
A NASICON CO/sub 2/ gas sensor with drift-detection electrode 带有漂移检测电极的NASICON CO/sub 2/气体传感器
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006853
Song Chen, H. Hadano, Y. Ishiguro, M. Nakayama, K. Watanabe
{"title":"A NASICON CO/sub 2/ gas sensor with drift-detection electrode","authors":"Song Chen, H. Hadano, Y. Ishiguro, M. Nakayama, K. Watanabe","doi":"10.1109/IMTC.2002.1006853","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006853","url":null,"abstract":"A Nasicon (sodium super ion conductor) CO/sub 2/ gas sensor with a new structure is developed for monitoring CO/sub 2/ level in the atmospheric air. In addition to the sensing and reference electrodes of a conventional Nasicon sensor, an auxiliary electrode, referred to as the base electrode, is provided with the new structure. Characterization has revealed that the output voltage at the base electrode is closely correlated with the drift at the sensing electrode and is available for the drift compensation.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129472325","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Management of measurement uncertainty for effective statistical process control 为有效的统计过程控制而进行的测量不确定度管理
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006915
D. Macii, P. Carbone, D. Petri
{"title":"Management of measurement uncertainty for effective statistical process control","authors":"D. Macii, P. Carbone, D. Petri","doi":"10.1109/IMTC.2002.1006915","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006915","url":null,"abstract":"In the context of quality assurance strategies, statistical process control techniques and conformance testing are necessary to perform a correct quality auditing of process outcomes. However, data collection is based on measurements and every measurement is intrinsically affected by uncertainty. Even if adopted instruments are in a condition of metrological confirmation, random and systematic measurement errors can not be completely eliminated. As a consequence, wrong measurement-based decisions can seriously decrease companies profits because of larger costs of repairing and shipping, as well as for the loss of reputation associated with customers dissatisfaction. This paper deals with the problem of the growth in false acceptance risk due to both random and systematic errors. In particular, it is shown that a systematic contribution, that often is the prevailing kind of uncertainty associated with the use of an electronic measuring equipment can seriously increase the worst-case risk to take wrong decisions when performing various statistical process control procedures. Nevertheless, such risks can be greatly decreased by selling suitably the Test Uncertainty Ratio associated with the measuring equipment.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128583065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Intrinsic sensitivity of CdZnTe semiconductors for digital radiographic imaging CdZnTe半导体数字射线成像的本征灵敏度
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006888
G. Giakos, R. Guntupalli, N. Shah, S. Vedantham, S. Suryanarayanan, S. Chowdhury, N. Patnekar, S. Sumrain, K. Mehta
{"title":"Intrinsic sensitivity of CdZnTe semiconductors for digital radiographic imaging","authors":"G. Giakos, R. Guntupalli, N. Shah, S. Vedantham, S. Suryanarayanan, S. Chowdhury, N. Patnekar, S. Sumrain, K. Mehta","doi":"10.1109/IMTC.2002.1006888","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006888","url":null,"abstract":"The intrinsic sensitivity of Cd/sub 1-x/Zn/sub x/Te semiconductor detectors have been theoretically modeled and experimentally measured, within the X-ray diagnostic energy range. The purpose of this study is to optimize the detector signal parameters of these solid state ionization devices for digital imaging applications. The experimental results of this study indicate that Cd/sub 1-x/Zn/sub x/Te detectors exhibit good intrinsic sensitivity.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131489392","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Simulation of novel phase-controlled flicker compensator and its response to the UIE/EEC flickermeter 新型相控闪变补偿器的仿真及其对UIE/EEC闪变计的响应
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006825
Chau‐Shing Wang, M. Devaney
{"title":"Simulation of novel phase-controlled flicker compensator and its response to the UIE/EEC flickermeter","authors":"Chau‐Shing Wang, M. Devaney","doi":"10.1109/IMTC.2002.1006825","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006825","url":null,"abstract":"This paper presents the simulation of a novel dynamic phase controller for flicker mitigation by compensating the rms voltage every half-cycle of line voltage. It is based on a light dimmer using a TRIAC or a pair of SCRs (Sillcon Controlled Rectifiers) which regulate the voltage by phase control. Power quality issues and lamp characteristics affected by this phase-controlled voltage are investigated. A UIE/IEC flickermeter is introduced and simulated to verify the proposed method of flicker mitigation. The flickermeter response demonstrates the performance and limitations of this dynamic phase controller.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130093393","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Distributed instruments for control and diagnosis applied to a water distribution system 分布式配水系统控制与诊断仪器的应用
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006904
Didier Georges, Eric Benoit, A. Chovin, Damien Koenig, Benoit Marx, G. Mauris
{"title":"Distributed instruments for control and diagnosis applied to a water distribution system","authors":"Didier Georges, Eric Benoit, A. Chovin, Damien Koenig, Benoit Marx, G. Mauris","doi":"10.1109/IMTC.2002.1006904","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006904","url":null,"abstract":"This paper presents the design of intelligent instruments which are distributed on a CANopen fieldbus in order not only to synthesise and implement robust control algorithms but also to perform fault diagnosis on distributed industrial processes. Firstly, we shall shortly present the methodology and the context of the project, secondly the process is described and thirdly the main objectives of the work are exposed.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"379 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126960682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
New aspects of the arrangement and geometry of bluff bodies in ultrasonic vortex flow meters 超声涡旋流量计钝体布置和几何的新方面
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007209
V. Hans
{"title":"New aspects of the arrangement and geometry of bluff bodies in ultrasonic vortex flow meters","authors":"V. Hans","doi":"10.1109/IMTC.2002.1007209","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007209","url":null,"abstract":"Conventional vortex flow meters mostly are working with pressure sensors for the detection of vortex frequency behind bluff bodies. Big sizes of bluff bodies are necessary to generate large structures to be detected by pressure sensors with their poor sensitivity. Ultrasound is very sensitive on turbulences in the flow. Therefore the size of bluff bodies can be reduced drastically resulting in neglectable pressure losses behind the bluff body. Experiments have shown that opposite to bluff body arrangements used up to now a triangular shape e.g. should be turned around 180/spl deg/ with the lip facing to the inflow. Various shapes of bluff bodies have been tested. Best results could be obtained with threaded control rods. The sensitivity and accuracy of ultrasound measurements could be increased by the factor 12 in comparison to conventional flow meters using pressure sensors.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"232 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116388461","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A fourth-order single-bit switched-capacitor sigma-delta modulator for distributed sensor applications 用于分布式传感器应用的四阶单比特开关电容σ - δ调制器
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006848
S. Brigati, F. Francesconi, P. Malcovati, F. Maloberti
{"title":"A fourth-order single-bit switched-capacitor sigma-delta modulator for distributed sensor applications","authors":"S. Brigati, F. Francesconi, P. Malcovati, F. Maloberti","doi":"10.1109/IMTC.2002.1006848","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006848","url":null,"abstract":"In this paper we present a switched-capacitor sigma-delta modulator for high resolution applications. In particular this sigma-delta modulator is well suited for distributed sensor networks. The circuit, implemented in a double-poly, double-metal 0.6 /spl mu/m CMOS technology, is based on a 4th-order single-loop architecture with a sampling frequency of 256 kHz. The chip consumes 50 mW from a single 5 V supply and achieves a signal-to-noise ratio of 104.9 dB over a bandwidth of 400 Hz, corresponding to a resolution of 17.1 bits.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126632366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Very low noise, high accuracy, programmable voltage reference 极低噪音，高精度，可编程电压基准
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006916
C. Pace, C. Ciofi, F. Crupi, A. Giacobbe
{"title":"Very low noise, high accuracy, programmable voltage reference","authors":"C. Pace, C. Ciofi, F. Crupi, A. Giacobbe","doi":"10.1109/IMTC.2002.1006916","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006916","url":null,"abstract":"The design and testing of a very low noise, high accuracy, programmable voltage reference is presented in this paper. This piece of instrumentation, which can be controlled by a personal computer via the built-in RS232 interface, is intended as an alternative to batteries in the realization of automated low frequency noise measurement systems. The supply voltage ranges from 0 to 5 V with a resolution and long-term stability better than /spl plusmn/250 /spl mu/V. The power spectral density of the output voltage fluctuations is less than 10/sup -16/ V/sup 2//Hz at 100 mHz and remains below 10/sup -17/ V/sup 2//Hz above 1 Hz.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126254939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
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