{"title":"Single-clock, single-latch, scan design","authors":"Amit M. Sheth, J. Savir","doi":"10.1109/IMTC.2002.1006912","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006912","url":null,"abstract":"This paper describes a new scan design that uses the same clock for both scan and functional mode. A test made signal distinguishes between normal and test operations. This new design enjoys savings in circuits, pins, test time, and also enjoys the benefits of a high-speed scan capability.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115132195","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Catelani, R. Nicoletti, M. Baggiani, R. Singuaroli
{"title":"A measurement system for the acquisition of degradation data in AlCu metallizations","authors":"M. Catelani, R. Nicoletti, M. Baggiani, R. Singuaroli","doi":"10.1109/IMTC.2002.1006895","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006895","url":null,"abstract":"A fully custom designed automatic measurement system has been realized in order to acquire degradation data on thin-film AlCu metal test patterns, performing 4-wire resistive measures. A thermal reliability test is performed and degradation data are presented.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116674551","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
S. Oda, Mitsuyoshi Anzai, S. Uematsu, Kenzo Watanabe
{"title":"A silicon micromachined flow sensor using thermopiles for heat transfer measurements","authors":"S. Oda, Mitsuyoshi Anzai, S. Uematsu, Kenzo Watanabe","doi":"10.1109/IMTC.2002.1007142","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007142","url":null,"abstract":"A silicon micromachined flow sensor composed of a platinum heater and four thermopiles centered at the heater is described. Two of the four thermopiles, placed up- and down-stream of the flow, measure the heat carried by the fluid, while the other two, arranged perpendicular to the flow direction, monitor the heat transferred from the heater to the fluid. This architecture allows the normalization of the output of the up- and down-stream thermopiles by the monitored output. Experimental results show that the normalization is quite useful for achieving a range as wide as 1:1000 and also for reducing the temperature and pressure dependence.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126719694","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Auto-evaluation of the uncertainty in virtual instruments","authors":"E. Ghiani, N. Locci, C. Muscas","doi":"10.1109/IMTC.2002.1006872","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006872","url":null,"abstract":"A numerical approach based on a Monte Carlo probabilistic method is used as an advantageous alternative to the traditional analytical methods for the evaluation of the uncertainty in measurements achieved by digitally processing sampled input data. The correctness of the approach is shown in the case of both single-channel and multi-channel systems. Some practical concerns about the reliability of the proposed methodology are discussed and suitably designed virtual instruments are presented that are able to present the measurement result along with its uncertainty.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114918290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A real time remote control architecture using mobile communication","authors":"Chin-E. Lin, Chih-Ching Li, A. Hou, Chih-Chen Wu","doi":"10.1109/IMTC.2002.1007072","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007072","url":null,"abstract":"This paper presents a new development of mobile communication in application to remote data transmission and control. A concept of G/sup 3/ is proposed, including GPS, GSM, and GIS. In this paper, a GSM real time control system for data uplink and downlink remote terminals is considered. The proposed system can be implemented on a PC-based or a /spl mu/ P-based to integrate into G/sup 3/ configuration. This paper presents the system design and implementation with practical data verification. From experiment results, the proposed GSM real time control system has a bottleneck of 580 ms delay in highly reliable and accurate uplink and downlink communications.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122915370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An automatic digital modulation classifier for measurement on telecommunication networks","authors":"D. Grimaldi, S. Rapuano, G. Truglia","doi":"10.1109/IMTC.2002.1007083","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007083","url":null,"abstract":"The paper presents a method for the automatic classification of digital modulations, without any knowledge of the signal parameters. This method can recognize classical single-carrier modulations such as M-PSK (M-ary phase shift keying), M-FSK (M-ary frequency shift keying), M-ASK (M-ary amplitude shift keying) and M-QAM (M-ary quadrature amplitude modulation) and OFDM modulations such as DMT (discrete multitone) used for ADSL (asymmetric digital subscriber line) and VDSL (very high speed DSL) standards and for PLC (powerline carrier) transmissions. After identification of the modulation type the method automatically estimates some parameters characterizing the modulation. In order to evaluate the method performance, several simulations have been carried out with different values of signal to noise ratio (SNR) for each identifiable modulation.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114518229","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Efficient identification of third order Volterra models using interpolation techniques","authors":"J. Nemeth, J. Schoukens","doi":"10.1109/IMTC.2002.1007113","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007113","url":null,"abstract":"The paper presents an efficient method for the identification of third-order Volterra models in the frequency domain. The main difficulty of such modeling is that it requires an excessive amount of measurements. When an arbitrary, band-limited periodic signal with N harmonics is applied as excitation to a plant, its third-order kernel is to be determined at N/sup 3/ frequency points. This leads to an estimation problem with O {N/sup 3/} linear unknown vs. O {N} equations. In order to get as many linear equations as unknowns, the experiment must be repeated O {N/sup 2/} times, each time with different exciting Fourier amplitudes. The new approach presented in the paper reduces model complexity. The quadratic and cubic kernel surfaces are approximated by smooth functions, the parameters of which become the new linear unknowns. Since the number of parameters does not grow with N, the size of the experiments can be brought down. As the modified model is a projection, the solution can, of course, be only approximate. The underlying assumptions that allow this approximation are explained and experimental case studies illustrate the workability of the ideas. A signal filtering technique is also described as an additional resort when identifying characteristics with narrow resonance peaks. This latter problem arises e.g. during the identification of a nonlinear resonator device.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128233525","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A digital fluxgate magnetic sensor interface using sigma-delta modulation for weak magnetic field measurement","authors":"S. Kawahito, A. Cerman, Y. Tadokoro","doi":"10.1109/IMTC.2002.1006849","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006849","url":null,"abstract":"This paper presents a weak magnetic field measurement system using micro-fluxgate sensors and a sensor signal processing technique using the sigma-delta modulation in the negative feedback loop. The feedback of low-pass filtered bitstream output of a sigma-delta modulator to the magnetic field improves system linearity, hysteresis and stability. The third-order noise shaping can be obtained in the digital output bit-stream by the use of an integrator in the loop. Earth's magnetic field is successfully measured. The non-linearity error is less then 0.4 % in the range of /spl plusmn/ 100 /spl mu/T.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129658257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
G. Araújo, J. Barreiros, R.N.C. Alves, R. Freire, S. Catunda
{"title":"Instrumentations for microalternator voltage and speed digital automatic control","authors":"G. Araújo, J. Barreiros, R.N.C. Alves, R. Freire, S. Catunda","doi":"10.1109/IMTC.2002.1007086","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007086","url":null,"abstract":"The development of circuits necessary to implement speed and voltage digital regulators in a scaled-down synchronous generator of a research and teaching laboratory is presented in this work. The realization of the synchronous generator output voltage sensor and the shaft speed sensor of the dc machine (which represents the prime mover of the scaled-down power system model) are presented. The bridge rectifiers, which are the actuators in the two regulation loops, together with the thyristor firing circuits, are also shown. Some aspects related to the project and implementation of discrete PI controller of the synchronous generator output voltage and of the dc machine speed are also presented; such controller are implemented by software in C++. Results of operation tests of the implemented circuits, as well as performance of the regulators, with the synchronous generator feeding a local load, are commented.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123470034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Correlated microwave-ultrasonic multi-sensor for reliable measurements of velocity and range","authors":"H. Ruser, V. Mágori, H.-R. Trankler","doi":"10.1109/IMTC.2002.1006810","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006810","url":null,"abstract":"The potential of the combination of ultrasound and microwaves to improve existing sensors in terms of sensitivity and reliability is demonstrated. While noise and disturbances affect both waves differently, signal returns form target reflectors will be coherent. With data fusion performed on the signal level, the applicability is significantly improved compared with multisensors based on complementary sensor outputs. A compact low-cost sensor for the robust measurement of presence, velocity and distance of objects, using 24 GHz microwaves and 40 kHz ultrasound, has been designed. Key issues for a smart sensor design, inherently exploited by the multisensor approach, are the adaptation to the environment, self calibration and function monitoring. The design and operating parameters of the multisensor system are discussed and evidence for the satisfactory performance is given.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114316463","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}