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IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)最新文献

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Design and implementation of a small-size wireless data acquisition system 一个小型无线数据采集系统的设计与实现
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006894
Ding Libo, Zhang-Hong He, Lin Haojie, Du Hongji
{"title":"Design and implementation of a small-size wireless data acquisition system","authors":"Ding Libo, Zhang-Hong He, Lin Haojie, Du Hongji","doi":"10.1109/IMTC.2002.1006894","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006894","url":null,"abstract":"A small-size wireless data acquisition system is developed for the application where the common cable-necessary data acquisition system is inapplicable. The paper describes the design Issues and implementation of the system, especially on how to improve reliability and reduce the system volume. Questions on the noise and interference restraint are also discussed. The application of the system in practical experiments has shown that it satisfies the signal acquisition from rapidly revolving object. Besides, the small volume makes it ideal for space-critical measurement applications.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126297457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
A novel Preisach operator for modeling of hysteresis in VO/sub 2/ microbolometer 一种新的VO/sub /微辐射热计滞回建模预算符
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006854
L. D. de Almeida, G. S. Deep, A. Lima
{"title":"A novel Preisach operator for modeling of hysteresis in VO/sub 2/ microbolometer","authors":"L. D. de Almeida, G. S. Deep, A. Lima","doi":"10.1109/IMTC.2002.1006854","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006854","url":null,"abstract":"Modelling of vanadium dioxide (VO/sub 2/) thin film microbolometer, based on the classical Preisach model, presents some discrepancies between simulation and experimentally obtained hysteresis data. This is due to the asymmetric feature of the resistance-temperature dependence in VO/sub 2/ films. To reduce these discrepancies, especially for temperatures below 35C, we propose in this paper a novel operator for the classical Preisach model. This new operator accounts for reversible and irreversible components, similar to the behavior of a VO/sub 2/ microcrystal. The model's parameters are obtained from experimentally measured characteristics, which are compared with simulated data from the model.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126426065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Crack detection on an escalator handrail 自动扶梯扶手的裂纹检测
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007091
V.A. Pliem, S. Scheibelhofer, G. Brasseur
{"title":"Crack detection on an escalator handrail","authors":"V.A. Pliem, S. Scheibelhofer, G. Brasseur","doi":"10.1109/IMTC.2002.1007091","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007091","url":null,"abstract":"In the course of an escalator inspection the service crew checks the surface of the handrails. This surface has to be smooth without any cracks to prevent injuries of passengers. The inspection is still carried out manually as no sensors are on the market to fulfil this safety critical task. A low target price, harsh environmental conditions, and a high reliability impede the use of standard off-the-shelf sensors for such a crack detection. The paper compares the potential of different types of sensors to reliably detect cracks on escalator handrails. The benefits and drawbacks of non-contacting sensing techniques like ultrasonic, inductive, capacitive, and optical are discussed. Finally, a new low-cost optoelectronic prototype device is presented together with some measurement results. This prototype sensor reliably detects cracks on escalator handrails.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125765566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
An image processing based method for stress classification in digital telecommunication networks 基于图像处理的数字通信网应力分类方法
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007084
P. Daponte, G. Mercurio, S. Rapuano, G. Truglia
{"title":"An image processing based method for stress classification in digital telecommunication networks","authors":"P. Daponte, G. Mercurio, S. Rapuano, G. Truglia","doi":"10.1109/IMTC.2002.1007084","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007084","url":null,"abstract":"The paper faces the problem of the automatic classification of the stresses affecting the quadrature amplitude modulation (QAM). This problem arises when a continuous monitoring system is needed for improving the quality of service (QoS) in communication networks based on such a modulation scheme. In particular, a method based on image processing is proposed. It automatically analyses the constellation diagram and selects the stress actually present through a template matching technique. The results of the first simulations, carried out on signals affected by different stresses and SNRs are presented and discussed. Some experimental results are also shown.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121863059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
194 369 569.4(5) MHz optical frequency standard based on /sup 13/C/sub 2/H/sub 2/ p(16) saturated line 基于/sup 13/C/sub 2/H/sub 2/ p(16)饱和线的194369569.4 (5)MHz光频率标准
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006817
C. Svelto, G. Galzerano, E. Bava, F. Ferrario, R. Ottoboni, A. Onae, M. Marano
{"title":"194 369 569.4(5) MHz optical frequency standard based on /sup 13/C/sub 2/H/sub 2/ p(16) saturated line","authors":"C. Svelto, G. Galzerano, E. Bava, F. Ferrario, R. Ottoboni, A. Onae, M. Marano","doi":"10.1109/IMTC.2002.1006817","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006817","url":null,"abstract":"A novel, compact, and reliable Er-Yb:glass laser operating at around 1.54 /spl mu/m wavelength was developed, with single-frequency and linearly-polarized output power in excess of 10 mW over a continuous tunability range of 17 nm. An external Fabry-Perot resonator containing a low-pressure acetylene cell was used to perform saturation spectroscopy of different absorptions in the (v/sub 1/+v/sub 3/) rotovibrational band. By using two nested control loops, the laser was frequency locked to the 1 MHz Doppler-free P(16) line of /sup 13/C/sub 2/H/sub 2/ at 1. 543 /spl mu/m wavelength. This particular transition of the acetylene molecule was very recently recommended by the CCL (Comite Consultatif de la Longueur) of the CIPM for the mise en pratique du metre. The frequency stability achieved, as evaluated from the loop error signal, way in the range of /spl plusmn/40 kHz peak-to-peak (/spl Delta/v/v/spl cong/2/spl times/10/sup -10/) and the correspondingly calculated Allan deviation is /spl sigma//sub y/(/spl tau/)<10/sup -11/for integration times /spl tau//spl ges/1 s and remains significantly low, 10/sup -11/</spl sigma//sub y/(/spl tau/)<3/spl times/10/sup -10/ for 10/sup -2/ s/spl les//spl tau//spl les/50s and /spl sigma//sub y/(/spl tau/)<10/sup -12/ for /spl tau/>70 s. This is the first Italian optical frequency standard in the 1.5 /spl mu/m band, namely at a frequency of 194 369 569.4(5) MHz and it is now ready for international intercomparisons.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127984389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Electromagnetic in-line measurement of viscosity 电磁粘度在线测量
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007095
A. Hans
{"title":"Electromagnetic in-line measurement of viscosity","authors":"A. Hans","doi":"10.1109/IMTC.2002.1007095","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007095","url":null,"abstract":"Continuous viscosity measurement assists in product quality procurement and maximizes the efficiency of plant operation. However, state-of-the-art commercial instruments have severe drawbacks such as using by-pass loops or being invasive. Based on a conventional electromagnetic flowmeter, a noninvasive process viscometer has been developed Through slight modifications of a commercial flowmeter two measured quantities related to the velocity profile can be determined Emerging from a two-parametric rheological model as a theoretical background, the complete velocity profile can be approximated An additional differential pressure sensor provides a third rheological parameter so that the viscosity can be obtained The key features of the inline process viscometer are no moving parts, ease of cleaning, no dead zones and no additional pressure loss. A prototype of the proposed viscometer has been constructed and extensively tested with various fluids. The results underline the good performance of the measuring principle.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134354380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Estimation of depth on thick edges from sharp and blurred images 从锐利和模糊图像中估计粗边缘的深度
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006861
C. Simon, F. Bicking, Thierry Simon
{"title":"Estimation of depth on thick edges from sharp and blurred images","authors":"C. Simon, F. Bicking, Thierry Simon","doi":"10.1109/IMTC.2002.1006861","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006861","url":null,"abstract":"This article deals with the generalization of a local depth estimation method using sharp edges and blurred edges. This Depth from Defocus method is explained and the theoretical relations are defined. Improvements concerning the generalization and the noise sensitivity on the depth estimation are developed and application conditions are exposed. Some results on synthetic images are presented to illustrate the method efficiency.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"76 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131747572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Sensor network and information interoperability integrating IEEE 1451 with MIMOSA and OSA-CBM 集成IEEE 1451与MIMOSA和OSA-CBM的传感器网络和信息互操作性
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007145
K. Lee, R. Gao, R. Schneeman
{"title":"Sensor network and information interoperability integrating IEEE 1451 with MIMOSA and OSA-CBM","authors":"K. Lee, R. Gao, R. Schneeman","doi":"10.1109/IMTC.2002.1007145","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007145","url":null,"abstract":"The IEEE 1451 smart transducer interface for sensors and actuators standard was developed to facilitate sensor to network interoperability. It has defined a set of common communication interfaces for connecting transducers (sensors or actuators) to control networks and instruments in a network-independent environment. Concurrently, the Machinery Information Management Open Systems Alliance (MIMOSA) has established an open architecture and a set of protocols for exchanging complex sensor information between condition-based maintenance (CBM) systems. Likewise, the open system architecture for condition based maintenance (OSA-CBM) program has developed an open architecture and standard for distributed CBM software components. Ideally, if there is a way to interface these standards, sensor information can be easily accessed by condition-based maintenance application software. This paper examines the IEEE 1451 standard and the MIMOSA/OSA-CBM specifications to find entry points that can provide a connection between these standards.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131147005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 23
Design of predictive IIR filters via balanced model truncation 基于平衡模型截断的预测IIR滤波器设计
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007190
M. Rezki, I. Kale
{"title":"Design of predictive IIR filters via balanced model truncation","authors":"M. Rezki, I. Kale","doi":"10.1109/IMTC.2002.1007190","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007190","url":null,"abstract":"Recently the design of polynomial predictors has had great attention from many filter designers. The results produced have indeed found many applications in industry. These new filters consist primarily of finite impulse response (FIR) systems. Other flavours of infinite impulse response (IIR) have also been developed. In this paper we look at the potential offered by the balanced model truncation (BMT) in designing a new IIR favour of polynomial predictors.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131160603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references 对称和非对称驱动微结构的拉入及其在直流电压参考中的应用
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006937
L. Rocha, E. Cretu, R. Wolffenbuttel
{"title":"The pull-in of symmetrically and asymmetrically driven microstructures and the use in DC voltage references","authors":"L. Rocha, E. Cretu, R. Wolffenbuttel","doi":"10.1109/IMTC.2002.1006937","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006937","url":null,"abstract":"Micromechanical structures have been designed, fabricated in silicon and tested for use as on-chip voltage reference Applications are in electrical metrology and in integrated silicon Microsystems. Microbeams of 100 /spl mu/m length, 3 /spl mu/m width and 11 /spl mu/m thickness are electrostatically actuated with a very reproducible pull-in voltage. The structure can be either symmetrically or asymmetrically actuated, resulting in different pull-in voltages, as well as different operational specifications e.g. hysteresis and reproducibility. A two dimensional energy-based analytical model for the static pull-in is derived for both actuation types and compared with measurements. Devices have been designed and fabricated in an epi-poly process. Measurements show a pull-in voltage in the 9.1-9.5 V range for the asymmetric case and 10.5-11 V range for the symmetric case, both in agreement with modeling.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131177322","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
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