A novel Preisach operator for modeling of hysteresis in VO/sub 2/ microbolometer

Abstract

Modelling of vanadium dioxide (VO/sub 2/) thin film microbolometer, based on the classical Preisach model, presents some discrepancies between simulation and experimentally obtained hysteresis data. This is due to the asymmetric feature of the resistance-temperature dependence in VO/sub 2/ films. To reduce these discrepancies, especially for temperatures below 35C, we propose in this paper a novel operator for the classical Preisach model. This new operator accounts for reversible and irreversible components, similar to the behavior of a VO/sub 2/ microcrystal. The model's parameters are obtained from experimentally measured characteristics, which are compared with simulated data from the model.