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IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)最新文献

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Photostimulator for electrophysiological examination of the human eyesight system - project based on Altera Max+Plus II system and Flex 10K20 device 用于人眼电生理检查的光刺激器——基于Altera Max+Plus II系统和Flex 10K20设备的项目
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007090
W. Mickiewicz
{"title":"Photostimulator for electrophysiological examination of the human eyesight system - project based on Altera Max+Plus II system and Flex 10K20 device","authors":"W. Mickiewicz","doi":"10.1109/IMTC.2002.1007090","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007090","url":null,"abstract":"In the paper the projects of two photostimulators for electrophysiological examination of human eyesight system are presented. First one produces various visual stimuli of pattern type (according to the appropriate standards): checkerboards, vertical and horizontal bars of different localization on the screen and of the adjustable light and time-space parameters. The generated images (pattern) can be displayed on the VGA monitor. Second one generates stimulus fields for multifocal electroretinography. Each field of the image blinks according to a appropriate m-sequence. The whole digital circuitry of the devices is placed into ALTERA FLEX20K10 PLD chip. The design process of presented devices was supported by Altera CAD system MAX+PLUS II. Running prototypes of the photostimulators was verified using UPI Education Board.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130929510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Nonlinear inverse filtering for measurement of thermal hysteresis 热滞后测量的非线性反滤波
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007166
L. D. de Almeida, G. S. Deep, A. Lima
{"title":"Nonlinear inverse filtering for measurement of thermal hysteresis","authors":"L. D. de Almeida, G. S. Deep, A. Lima","doi":"10.1109/IMTC.2002.1007166","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007166","url":null,"abstract":"A nonlinear inverse filter for distortion correction in the measurement of thermal hysteresis is proposed in this paper. The temperature measurement sensor is a thermistor, which has static nonlinearities and slow dynamic response. When the rate of change of temperature is high as compared with the speed of response of the thermistor there is a degradation in the measured temperature and the hysteresis curve thus obtained is a distorted version of the true characteristic. To compensate this effect, we employ a infinite impulse response IIR filter to remove the distortion. The filter coefficients are obtained from experimentally measured characteristics, and the filtered hysteresis data is compared with the quasi-static experimental hysteresis curve.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133328647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
A low-noise oversampling signal detection technique for CMOS image sensors CMOS图像传感器低噪声过采样信号检测技术
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006851
N. Kawai, S. Kawahito
{"title":"A low-noise oversampling signal detection technique for CMOS image sensors","authors":"N. Kawai, S. Kawahito","doi":"10.1109/IMTC.2002.1006851","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006851","url":null,"abstract":"In this paper, we propose a method of low-noise signal readout using frame oversampling and a CMOS image sensor with non-destructive high-speed readout mode. The technique enables the use of high-gain column amplifiers and the digital integration of signals without noise accumulation. The column amplifier is effective for reducing the noises due to the wideband amplifier and the quantization noises. Simulation results show that the noise can be reduced by a factor of 20 log/sub 10/ M [dB] where M is the oversampling ratio.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133446993","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
A laser-optical strain gauge and its application in material testing 激光光学应变仪及其在材料检测中的应用
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006932
Bernhard G. Zagar, S. C. Schneider
{"title":"A laser-optical strain gauge and its application in material testing","authors":"Bernhard G. Zagar, S. C. Schneider","doi":"10.1109/IMTC.2002.1006932","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006932","url":null,"abstract":"In this paper we report on the theory and applicability of a laser speckle shift strain measurement system as well as some practical results obtained with the discussed system from fibers, foils and standardized specimen. Some of the results presented can not be obtained with other than optical means, because of the fragility and the small physical dimensions of the specimen.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132159319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
New improvements in accurate measurement of synchronously sampled AC signals 同步采样交流信号精确测量的新改进
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007156
P. Petrović
{"title":"New improvements in accurate measurement of synchronously sampled AC signals","authors":"P. Petrović","doi":"10.1109/IMTC.2002.1007156","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007156","url":null,"abstract":"A digital algorithm design approach, based on the use of a dual-slope ADC, is described in this paper. The main advantage of this approach is the determination of all electric values in an electric utility signal by the same algorithm. The algorithm has a high accuracy and regular structure. Measurements of voltage and current are made in successive periods by a stroboscopic technique (synchronous undersampling). The assumed stationarity of the electric utility signal is validated by measurements with an experimental set-up, consisting of a fast high precision sigma-delta ADC. The necessary synchronization is achieved by software measurements of the frequency of the measured signal. Assuming stationarity of the observed system (electric utility), in the stated one-second interval, it is proved that precise digital processing can be achieved without using a sample-and-hold circuit. The suggested measuring system was simulated, practically realized, and tested. Obtained results confirmed completely the starting postulates. Processing precision of 0.01% was achieved.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115395205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Efficient hybrid optimization of fixed-point cascaded IIR filter coefficients 定点级联IIR滤波器系数的高效混合优化
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006943
G. Vanuytsel, P. Boets, L. van Biesen, S. Temmerman
{"title":"Efficient hybrid optimization of fixed-point cascaded IIR filter coefficients","authors":"G. Vanuytsel, P. Boets, L. van Biesen, S. Temmerman","doi":"10.1109/IMTC.2002.1006943","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006943","url":null,"abstract":"In this paper we present a hybrid optimization scheme for the determination of fixed-point coefficients of IIR filters. Tests show that the developed algorithm is very time efficient and capable of achieving a high accuracy in both magnitude and phase response.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115514490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 29
Experience with high-output-resistance MJTC AC-DC transfer standards 具有高输出电阻MJTC交流-直流转换标准的经验
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1006820
P. Filipski, M. Boecker
{"title":"Experience with high-output-resistance MJTC AC-DC transfer standards","authors":"P. Filipski, M. Boecker","doi":"10.1109/IMTC.2002.1006820","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006820","url":null,"abstract":"Heater-thermopile isolation of planar, thin film, multijunction thermal converter decreases with frequency. This causes an interaction with the measurement circuit, resulting in increased error of measurement of its AC-DC transfer difference. The paper discusses the sources of this error and methods of its reduction, illustrated by results of experiments.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"272 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115597815","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Design and implementation of a wireless remote measurement system 无线远程测量系统的设计与实现
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007079
Ying-Wen Bai, Hong-Gi Wei
{"title":"Design and implementation of a wireless remote measurement system","authors":"Ying-Wen Bai, Hong-Gi Wei","doi":"10.1109/IMTC.2002.1007079","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007079","url":null,"abstract":"Due to the coming of the digital age as a result of the increasing convenience of the Internet and wireless data transmission networks, local area measurement systems are gradually being extended to wide area measurement systems. In this paper, we propose a design and implementation of a wireless remote measurement system, which is an integration of a client-server remote Windows-based signal generator, a digital storage oscilloscope, and a transmission channel of an Internet and wireless network. The experimental results show that the transmission rate of the remote measurement system can reach 1.2 K samples per second that can cause some dine delay in the whole system operation. However, due to the batching scanning mechanism in the waveform reconstruction, the overall bandwidth limitation of the measurement system is limited by the characteristics of the interface circuits. The primary results from the test circuit measured by a local oscilloscope and our experimental system agree with each other.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115760077","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Two-dimensional bifurcation diagrams with data acquisition 二维分岔图与数据采集
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007170
G. Olivar, R. Quivar, A. Mànuel, J. del Río
{"title":"Two-dimensional bifurcation diagrams with data acquisition","authors":"G. Olivar, R. Quivar, A. Mànuel, J. del Río","doi":"10.1109/IMTC.2002.1007170","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007170","url":null,"abstract":"It is well known that many non-linear phenomena such as bifurcations and chaotic behavior takes place in DC-DC converters mainly due to the switching action among all the different topologies of the circuit. Such behaviors have been described with detail experimentally and numerically, and also mathematical reasoning has been provided. Although the application of these works is centered in avoiding non-periodic behavior, they can also be applied to reducing the generated EMC and to the transmission of the information.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115771607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
A non-linearity self-calibration technique for delay-locked loop delay-lines 锁迟环延迟线的非线性自校正技术
IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) Pub Date : 2002-08-07 DOI: 10.1109/IMTC.2002.1007092
F. Baronti, L. Fanucci, D. Lunardini, R. Roncella, R. Saletti
{"title":"A non-linearity self-calibration technique for delay-locked loop delay-lines","authors":"F. Baronti, L. Fanucci, D. Lunardini, R. Roncella, R. Saletti","doi":"10.1109/IMTC.2002.1007092","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007092","url":null,"abstract":"An on-chip non-linearity self-calibration of a CMOS all-digital shunt capacitor delay-line is achieved by first measuring the non-linearity of each delay-cell by means of a statistical test and then correcting the individual cell delay mismatch according to the test results. An iterative calibration algorithm has been developed and a fully digital circuit efficiently implementing the calibration procedure has been designed. The same digital controller is used to sequentially calibrate each delay-cell, so that the occupied silicon area is minimized. Simulation results show the feasibility of the technique and a substantial reduction of the maximum non-linearity down to values close to 1%.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"67 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115778908","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
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