{"title":"Transistor temperature measurement for calibration of integrated temperature sensors","authors":"M. Pertijs, J. Huijsing","doi":"10.1109/IMTC.2002.1006936","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006936","url":null,"abstract":"A temperature measurement technique is presented for calibrating packaged integrated temperature sensors. An on-chip bipolar transistor is used to accurately determine the sensor's temperature during calibration. The transistor's base-emitter voltage is measured at three collector currents to find the absolute temperature while compensating for series resistances. The technique does not increase the pin count for a typical smart sensor, as the transistor can be accessed via the supply pins and an existing digital input pin. Measurements on substrate pnp's in a standard CMOS process show that the temperature can be determined with an accuracy of /spl plusmn/0.1/spl deg/C in the range of -50-130/spl deg/C.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124418639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Modelling of direction-dependent dynamic processes: a comparison of Wiener models and neural networks","authors":"A. H. Tan, K. Godfrey","doi":"10.1109/IMTC.2002.1006842","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006842","url":null,"abstract":"The modelling of direction-dependent processes using Wiener and neural network models is compared for several different processes and for three different types of input signal: a pseudorandom binary signal (prbs), an inverse-repeat pseudo-random binary signal (irprbs) and a multisine (sum of harmonics) signal. Experimental results on an electronic nose are presented to illustrate the applicability of the techniques discussed.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114797728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On the kernel selection for minimum-entropy estimation","authors":"J. Ismael de la Rosa, G. Fleury","doi":"10.1109/IMTC.2002.1007129","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007129","url":null,"abstract":"The purpose of this paper is to investigate the selection of an appropriate kernel to be used in a recent robust approach called minimum-entropy estimator (MEE). This MEE estimator is extended to measurement estimation and pdf approximation when /spl rho/(e) is unknown. The entropy criterion is constructed on the basis of a symmetrized kernel estimate /spl rho//spl circ/n,h (e) of /spl rho/(e). The MEE performance is generally better than the Maximum Likelihood (ML) estimator. The bandwidth selection procedure is a crucial task to assure consistency of kernel estimates. Moreover, recent proposed Hilbert kernels avoid the use of bandwidth, improving the consistency of the kernel estimate. A comparison between results obtained with normal, cosine and Hilbert kernels is presented.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115084186","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The design and self-calibration of inductive voltage dividers for an automated impedance scaling bridge","authors":"B. Waltrip, A. Koffman, S. Avramov-Zamurovic","doi":"10.1109/IMTC.2002.1007127","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007127","url":null,"abstract":"The design and construction of inductive voltage dividers (IVDs) for use in impedance bridge applications in the 50 Hz to 1 MHz frequency range is described. Two dividers are described; one designed to operate from 50 Hz to 2 kHz and the other designed to operate from 2 kHz to 1 MHz. Preliminary comparison results of the new IVDs over the 100 Hz to 50 kHz frequency range are given. A new bridge to self-calibrate the IVDs is also described. The bridge is based on the straddling method and has been designed to characterize IVDs over the 50 Hz to 100 kHz frequency range.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123611205","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Dynamical reliability and availability evaluation and validation of distributed control systems","authors":"P. Barger, J. Thiriet, M. Robert","doi":"10.1109/IMTC.2002.1006950","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006950","url":null,"abstract":"The evaluation of reliability and availability of control distributed systems is the main purpose of this paper. These control systems are composed of intelligent sensors and actuators (with calculation capabilities and communication interfaces), processing units, and a communication network, e.g. fieldbus or real-time network. The modeling of the system is ensured thanks to Petri Nets. Color Petri Nets allow the evaluation of both the dependability aspects and the performances with a control point of view. In order to get some results, it is possible to achieve a simulation or to make an analysis of the occurrence graph. The work presented is a model of a tank, in which the level of the liquid is controlled. An analogue sensor is used for the measurement of the level and is used for the control of the pump which fill the tank. The sensor is extended by some possibilities not to supply the controller with a measurement, as a result of a failure, and a degraded strategy can so be set. The evaluation of the reachability of this state after failure is achieved thanks to the occurrence graph tool. The global aim is to propose a methodology for the evaluation and comparison of distributed architectures.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"9 6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123669366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
F. Ferrero, G. Grillo, M.A. Perez, J. Antón, J. Campo
{"title":"Design of a low cost mastitis detector in cows by measuring electrical conductivity of milk","authors":"F. Ferrero, G. Grillo, M.A. Perez, J. Antón, J. Campo","doi":"10.1109/IMTC.2002.1006870","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006870","url":null,"abstract":"Mastitis in cows is an inflammation of the mammary gland usually caused by bacterial infection of udder tissues. This disease causes considerable damage to the cattlemen whilst reducing the quantity and the quality of the produced milk. An early detection and corrective action can lead to early cure. Although the universal method to measure mastitis levels is by determining the somatic cell counts per milliliter of milk, the electrical conductivity of milk is a rapid test for checking the acceptability of milk to monitor the effects of udder infection. This work presents the design of a low cost mastitis detector in cows using ac conductivity measurements.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"57 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116992916","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"ADPCM environment with a neural network predictor engine","authors":"V. Groza, R. Abielmona, E. Petriu","doi":"10.1109/IMTC.2002.1006900","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1006900","url":null,"abstract":"Presented in this paper is an innovative technique to improve analog-to-digital converters (ADCs). The methodology utilizes a built-in neural network engine to first learn, and then predict, the quantization step size. This produces a completely adaptable ADC, consisting of ADPCM samples fed back with the output of the neural network, which is capable of generating a better quantized output. The algorithmic solution, simulation methodology and results are also presented in this writing.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123977820","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Morawski, A. Miekina, M. Wisneiwski, A. Barwicz
{"title":"Neural-network-based calibration of a mini-spectrophotometer","authors":"R. Morawski, A. Miekina, M. Wisneiwski, A. Barwicz","doi":"10.1109/IMTC.2002.1007106","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007106","url":null,"abstract":"A new method for calibration of mini-spectrophotometers is proposed. The method is designed to overcome two important drawbacks of existing methods, viz. their inability to deal with the problems implied by insufficiency of the number of output data and the effects of light polarization. It is based on the use of a tunable laser for acquisition of calibration data, and an RBF (radial basis function) neural network for modeling the polarization effects. The results of a preliminary study of this method, based on semi-synthetic data, are given.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125836195","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Puippe, A. Michalski, A. Kalicki, M. Grzybowski
{"title":"An intelligent measurement system for surface area measurement","authors":"J. Puippe, A. Michalski, A. Kalicki, M. Grzybowski","doi":"10.1109/IMTC.2002.1007155","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007155","url":null,"abstract":"Knowledge of the precise surface area of an electrically conducting body is needed in electroplating processes for determining important parameters such as current density. The main principals of a surface area measurement method are presented in this paper. A theoretical basis of the diffusion-limited current method (DIM) for measurement of the surface area of an electrically conducting body is explained. An intelligent measurement system for measuring surface area based on DIM is described, including realization of the hardware and software. Results of experiments concerning accuracy, limitations and implementation area of the measurement system are given.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132872663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Automated instrumentation for monitoring nerve action potentials in experimental biology applications","authors":"A. Hatzopoulos, T. Laopoulos, G. Theophilidis","doi":"10.1109/IMTC.2002.1007118","DOIUrl":"https://doi.org/10.1109/IMTC.2002.1007118","url":null,"abstract":"An automated instrumentation setup for multiple kinds of measurements in the field of experimental biology is presented in this work. The system is developed according to the requirements of the procedures followed in the research on compound action potentials of nerves in the field of neurophysiology. A data acquisition and control system based on a PC with an analogue/digital interface card is used for the generation of the appropriate stimulation signals and for the recording of the nerve response. A microcontroller based triggering module, interconnected with the PC, is also used for proper timing and triggering. The presentation includes a technical description of the hardware and software developed, and also illustrative results of the application.","PeriodicalId":141111,"journal":{"name":"IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276)","volume":"38 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2002-08-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132970607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}